{"id":"https://openalex.org/W2611574572","doi":"https://doi.org/10.23919/date.2017.7927119","title":"Tunnel FET based refresh-free-DRAM","display_name":"Tunnel FET based refresh-free-DRAM","publication_year":2017,"publication_date":"2017-03-01","ids":{"openalex":"https://openalex.org/W2611574572","doi":"https://doi.org/10.23919/date.2017.7927119","mag":"2611574572"},"language":"en","primary_location":{"id":"doi:10.23919/date.2017.7927119","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date.2017.7927119","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Design, Automation &amp; Test in Europe Conference &amp; Exhibition (DATE), 2017","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101474025","display_name":"Navneet Gupta","orcid":"https://orcid.org/0000-0002-1367-9863"},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I122941322","display_name":"Institut Sup\u00e9rieur d'\u00c9lectronique de Paris","ror":"https://ror.org/00yw34h52","country_code":"FR","type":"education","lineage":["https://openalex.org/I122941322"]},{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]},{"id":"https://openalex.org/I3020098449","display_name":"CEA Grenoble","ror":"https://ror.org/02mg6n827","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I3020098449"]},{"id":"https://openalex.org/I4210150049","display_name":"Laboratoire d'\u00c9lectronique des Technologies de l'Information","ror":"https://ror.org/04mf0wv34","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I4210117989","https://openalex.org/I4210150049"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Navneet Gupta","raw_affiliation_strings":["LETI, Commissariat \u00e0 l'Energie Atomique et aux Energies Alternatives (CEA-LETI), France","MINARC Laboratory, Institut Superieur d'Electronique de Paris (ISEP), France","CEA-LETI - Commissariat \u00e0 l'\u00e9nergie atomique et aux \u00e9nergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (MINATEC 17, rue des Martyrs, 38054, Grenoble Cedex 9 - France)","ISEP - Institut Sup\u00e9rieur d'Electronique de Paris (28 Rue Notre Dame des Champs 75006 Paris - France)","MINARC (France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LETI, Commissariat \u00e0 l'Energie Atomique et aux Energies Alternatives (CEA-LETI), France","institution_ids":["https://openalex.org/I2738703131","https://openalex.org/I4210150049"]},{"raw_affiliation_string":"MINARC Laboratory, Institut Superieur d'Electronique de Paris (ISEP), France","institution_ids":["https://openalex.org/I122941322"]},{"raw_affiliation_string":"CEA-LETI - Commissariat \u00e0 l'\u00e9nergie atomique et aux \u00e9nergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (MINATEC 17, rue des Martyrs, 38054, Grenoble Cedex 9 - France)","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I2738703131","https://openalex.org/I3020098449","https://openalex.org/I4210150049"]},{"raw_affiliation_string":"ISEP - Institut Sup\u00e9rieur d'Electronique de Paris (28 Rue Notre Dame des Champs 75006 Paris - France)","institution_ids":["https://openalex.org/I122941322"]},{"raw_affiliation_string":"MINARC (France)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089240668","display_name":"Adam Makosiej","orcid":null},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]},{"id":"https://openalex.org/I3020098449","display_name":"CEA Grenoble","ror":"https://ror.org/02mg6n827","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I3020098449"]},{"id":"https://openalex.org/I4210150049","display_name":"Laboratoire d'\u00c9lectronique des Technologies de l'Information","ror":"https://ror.org/04mf0wv34","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I4210117989","https://openalex.org/I4210150049"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Adam Makosiej","raw_affiliation_strings":["LETI, Commissariat \u00e0 l'Energie Atomique et aux Energies Alternatives (CEA-LETI), France","CEA-LETI - Commissariat \u00e0 l'\u00e9nergie atomique et aux \u00e9nergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (MINATEC 17, rue des Martyrs, 38054, Grenoble Cedex 9 - France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LETI, Commissariat \u00e0 l'Energie Atomique et aux Energies Alternatives (CEA-LETI), France","institution_ids":["https://openalex.org/I2738703131","https://openalex.org/I4210150049"]},{"raw_affiliation_string":"CEA-LETI - Commissariat \u00e0 l'\u00e9nergie atomique et aux \u00e9nergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (MINATEC 17, rue des Martyrs, 38054, Grenoble Cedex 9 - France)","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I2738703131","https://openalex.org/I3020098449","https://openalex.org/I4210150049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053190499","display_name":"Andrei Vladimirescu","orcid":null},"institutions":[{"id":"https://openalex.org/I122941322","display_name":"Institut Sup\u00e9rieur d'\u00c9lectronique de Paris","ror":"https://ror.org/00yw34h52","country_code":"FR","type":"education","lineage":["https://openalex.org/I122941322"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Andrei Vladimirescu","raw_affiliation_strings":["MINARC Laboratory, Institut Superieur d'Electronique de Paris (ISEP), France","ISEP - Institut Sup\u00e9rieur d'Electronique de Paris (28 Rue Notre Dame des Champs 75006 Paris - France)","MINARC (France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MINARC Laboratory, Institut Superieur d'Electronique de Paris (ISEP), France","institution_ids":["https://openalex.org/I122941322"]},{"raw_affiliation_string":"ISEP - Institut Sup\u00e9rieur d'Electronique de Paris (28 Rue Notre Dame des Champs 75006 Paris - France)","institution_ids":["https://openalex.org/I122941322"]},{"raw_affiliation_string":"MINARC (France)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021923749","display_name":"Amara Amara","orcid":"https://orcid.org/0000-0002-9511-0899"},"institutions":[{"id":"https://openalex.org/I122941322","display_name":"Institut Sup\u00e9rieur d'\u00c9lectronique de Paris","ror":"https://ror.org/00yw34h52","country_code":"FR","type":"education","lineage":["https://openalex.org/I122941322"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Amara Amara","raw_affiliation_strings":["MINARC Laboratory, Institut Superieur d'Electronique de Paris (ISEP), France","MINARC (France)","ISEP - Institut Sup\u00e9rieur d'Electronique de Paris (28 Rue Notre Dame des Champs 75006 Paris - France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MINARC Laboratory, Institut Superieur d'Electronique de Paris (ISEP), France","institution_ids":["https://openalex.org/I122941322"]},{"raw_affiliation_string":"MINARC (France)","institution_ids":[]},{"raw_affiliation_string":"ISEP - Institut Sup\u00e9rieur d'Electronique de Paris (28 Rue Notre Dame des Champs 75006 Paris - France)","institution_ids":["https://openalex.org/I122941322"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113772129","display_name":"Costin Anghel","orcid":null},"institutions":[{"id":"https://openalex.org/I122941322","display_name":"Institut Sup\u00e9rieur d'\u00c9lectronique de Paris","ror":"https://ror.org/00yw34h52","country_code":"FR","type":"education","lineage":["https://openalex.org/I122941322"]},{"id":"https://openalex.org/I4210136953","display_name":"Laboratoire d\u2019\u00c9lectronique, Informatique et Image","ror":"https://ror.org/04gnd7c94","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I190752583","https://openalex.org/I190861549","https://openalex.org/I4210118524","https://openalex.org/I4210134562","https://openalex.org/I4210136953","https://openalex.org/I4210159245"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Costin Anghel","raw_affiliation_strings":["MINARC Laboratory, Institut Superieur d'Electronique de Paris (ISEP), France","LISITE - Laboratoire d'Informatique, Signal et Image, Electronique et T\u00e9l\u00e9communication (France)","MINARC (France)","ISEP - Institut Sup\u00e9rieur d'Electronique de Paris (28 Rue Notre Dame des Champs 75006 Paris - France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MINARC Laboratory, Institut Superieur d'Electronique de Paris (ISEP), France","institution_ids":["https://openalex.org/I122941322"]},{"raw_affiliation_string":"LISITE - Laboratoire d'Informatique, Signal et Image, Electronique et T\u00e9l\u00e9communication (France)","institution_ids":["https://openalex.org/I4210136953"]},{"raw_affiliation_string":"MINARC (France)","institution_ids":[]},{"raw_affiliation_string":"ISEP - Institut Sup\u00e9rieur d'Electronique de Paris (28 Rue Notre Dame des Champs 75006 Paris - France)","institution_ids":["https://openalex.org/I122941322"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"914","last_page":"917"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dram","display_name":"Dram","score":0.9014771580696106},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.757082998752594},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6971184015274048},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.6015222072601318},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5612192749977112},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.5587725639343262},{"id":"https://openalex.org/keywords/throughput","display_name":"Throughput","score":0.46857142448425293},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.46739229559898376},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4634281396865845},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.43377089500427246},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25110915303230286},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.11672386527061462},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.0937400758266449}],"concepts":[{"id":"https://openalex.org/C7366592","wikidata":"https://www.wikidata.org/wiki/Q1255620","display_name":"Dram","level":2,"score":0.9014771580696106},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.757082998752594},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6971184015274048},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.6015222072601318},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5612192749977112},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.5587725639343262},{"id":"https://openalex.org/C157764524","wikidata":"https://www.wikidata.org/wiki/Q1383412","display_name":"Throughput","level":3,"score":0.46857142448425293},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.46739229559898376},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4634281396865845},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.43377089500427246},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25110915303230286},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.11672386527061462},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0937400758266449},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/date.2017.7927119","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date.2017.7927119","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Design, Automation &amp; Test in Europe Conference &amp; Exhibition (DATE), 2017","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7400000095367432,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1532250329","https://openalex.org/W1876422086","https://openalex.org/W1964061332","https://openalex.org/W1991353080","https://openalex.org/W1991991600","https://openalex.org/W2014357578","https://openalex.org/W2033887426","https://openalex.org/W2035385641","https://openalex.org/W2056309203","https://openalex.org/W2057874658","https://openalex.org/W2090637806","https://openalex.org/W2111242202","https://openalex.org/W2132688693","https://openalex.org/W2140378133","https://openalex.org/W2153830758","https://openalex.org/W2165935495","https://openalex.org/W2507163228","https://openalex.org/W6631718703","https://openalex.org/W6676730230","https://openalex.org/W6679915245"],"related_works":["https://openalex.org/W3120961607","https://openalex.org/W4401568740","https://openalex.org/W3148568549","https://openalex.org/W2098207691","https://openalex.org/W1648516568","https://openalex.org/W361036515","https://openalex.org/W2161286015","https://openalex.org/W2269474412","https://openalex.org/W4211178602","https://openalex.org/W2140607147"],"abstract_inverted_index":{"A":[0],"refresh":[1,104],"free":[2],"and":[3,9,51,63,69,84],"scalable":[4,86],"ultimate":[5],"DRAM":[6],"(uDRAM)":[7],"bitcell":[8,18],"architecture":[10],"is":[11,19,27,42,79,85,94],"proposed":[12],"for":[13,39],"embedded":[14],"application.":[15],"uDRAM":[16,55],"1T1C":[17],"designed":[20],"using":[21,44],"access":[22],"Tunnel":[23],"FETs.":[24],"Proposed":[25],"design":[26],"able":[28],"to":[29,67,96,100],"store":[30],"the":[31,37],"data":[32],"statically":[33],"during":[34],"retention":[35],"eliminating":[36],"need":[38],"refresh.":[40],"This":[41],"achieved":[43,80],"negative":[45],"differential":[46],"resistance":[47],"property":[48],"of":[49,58,74],"TFETs":[50],"storage":[52,59],"capacitor":[53,60],"leakage.":[54],"allows":[56],"scaling":[57],"by":[61,103],"87%":[62],"80%":[64],"in":[65,81,98],"comparison":[66,99],"DDR":[68],"eDRAMs,":[70],"respectively.":[71],"Bitcell":[72],"area":[73],"0.0275\u03bcm":[75],"<sup":[76],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[77],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[78],"28nm":[82],"FDSOI-CMOS":[83],"further":[87],"with":[88],"technology":[89],"shrink.":[90],"Estimated":[91],"throughput":[92],"gain":[93],"3.8%":[95],"18%":[97],"CMOS":[101],"DRAMs":[102],"removal.":[105]},"counts_by_year":[{"year":2020,"cited_by_count":1}],"updated_date":"2026-07-27T08:26:11.824852","created_date":"2025-10-10T00:00:00"}