{"id":"https://openalex.org/W2612517079","doi":"https://doi.org/10.23919/date.2017.7927029","title":"FPGA-based failure mode testing and analysis for MLC NAND flash memory","display_name":"FPGA-based failure mode testing and analysis for MLC NAND flash memory","publication_year":2017,"publication_date":"2017-03-01","ids":{"openalex":"https://openalex.org/W2612517079","doi":"https://doi.org/10.23919/date.2017.7927029","mag":"2612517079"},"language":"en","primary_location":{"id":"doi:10.23919/date.2017.7927029","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date.2017.7927029","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100437761","display_name":"Meng Zhang","orcid":"https://orcid.org/0000-0002-6992-3722"},"institutions":[{"id":"https://openalex.org/I4210138186","display_name":"Wuhan National Laboratory for Optoelectronics","ror":"https://ror.org/03c9ncn37","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210138186"]},{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Meng Zhang","raw_affiliation_strings":["Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I4210138186","https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062125860","display_name":"Fei Wu","orcid":"https://orcid.org/0000-0001-9746-4714"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]},{"id":"https://openalex.org/I4210138186","display_name":"Wuhan National Laboratory for Optoelectronics","ror":"https://ror.org/03c9ncn37","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210138186"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fei Wu","raw_affiliation_strings":["Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I4210138186","https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036072216","display_name":"He Huang","orcid":"https://orcid.org/0000-0001-5581-1423"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]},{"id":"https://openalex.org/I4210138186","display_name":"Wuhan National Laboratory for Optoelectronics","ror":"https://ror.org/03c9ncn37","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210138186"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"He Huang","raw_affiliation_strings":["Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I4210138186","https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100568770","display_name":"Qian Xia","orcid":null},"institutions":[{"id":"https://openalex.org/I4210138186","display_name":"Wuhan National Laboratory for Optoelectronics","ror":"https://ror.org/03c9ncn37","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210138186"]},{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qian Xia","raw_affiliation_strings":["Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I4210138186","https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005773038","display_name":"Jian Zhou","orcid":"https://orcid.org/0000-0001-5295-4680"},"institutions":[{"id":"https://openalex.org/I4210138186","display_name":"Wuhan National Laboratory for Optoelectronics","ror":"https://ror.org/03c9ncn37","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210138186"]},{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jian Zhou","raw_affiliation_strings":["Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I4210138186","https://openalex.org/I47720641"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100329127","display_name":"Changsheng Xie","orcid":"https://orcid.org/0000-0003-1271-0571"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]},{"id":"https://openalex.org/I4210138186","display_name":"Wuhan National Laboratory for Optoelectronics","ror":"https://ror.org/03c9ncn37","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210138186"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Changsheng Xie","raw_affiliation_strings":["Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I4210138186","https://openalex.org/I47720641"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5100437761"],"corresponding_institution_ids":["https://openalex.org/I4210138186","https://openalex.org/I47720641"],"apc_list":null,"apc_paid":null,"fwci":1.2432,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.81926921,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"434","last_page":"439"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12162","display_name":"Cellular Automata and Applications","score":0.9836999773979187,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9779999852180481,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7676180601119995},{"id":"https://openalex.org/keywords/flash","display_name":"Flash (photography)","score":0.7300292253494263},{"id":"https://openalex.org/keywords/flash-memory","display_name":"Flash memory","score":0.674929678440094},{"id":"https://openalex.org/keywords/flash-file-system","display_name":"Flash file system","score":0.6082028150558472},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6058769226074219},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.5940147638320923},{"id":"https://openalex.org/keywords/interference","display_name":"Interference (communication)","score":0.5313072204589844},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5017199516296387},{"id":"https://openalex.org/keywords/nand-gate","display_name":"NAND gate","score":0.4875573515892029},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.4517570734024048},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4160207509994507},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.38715845346450806},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.38127401471138},{"id":"https://openalex.org/keywords/computer-memory","display_name":"Computer memory","score":0.2717732787132263},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.23258373141288757},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.20810601115226746},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.132548987865448},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11306852102279663},{"id":"https://openalex.org/keywords/semiconductor-memory","display_name":"Semiconductor memory","score":0.1092647910118103},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.09636646509170532}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7676180601119995},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.7300292253494263},{"id":"https://openalex.org/C2776531357","wikidata":"https://www.wikidata.org/wiki/Q174077","display_name":"Flash memory","level":2,"score":0.674929678440094},{"id":"https://openalex.org/C27670709","wikidata":"https://www.wikidata.org/wiki/Q5457555","display_name":"Flash file system","level":4,"score":0.6082028150558472},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6058769226074219},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.5940147638320923},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.5313072204589844},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5017199516296387},{"id":"https://openalex.org/C124296912","wikidata":"https://www.wikidata.org/wiki/Q575178","display_name":"NAND gate","level":3,"score":0.4875573515892029},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.4517570734024048},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4160207509994507},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.38715845346450806},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.38127401471138},{"id":"https://openalex.org/C92855701","wikidata":"https://www.wikidata.org/wiki/Q5830907","display_name":"Computer memory","level":3,"score":0.2717732787132263},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.23258373141288757},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.20810601115226746},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.132548987865448},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11306852102279663},{"id":"https://openalex.org/C98986596","wikidata":"https://www.wikidata.org/wiki/Q1143031","display_name":"Semiconductor memory","level":2,"score":0.1092647910118103},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.09636646509170532},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/date.2017.7927029","is_oa":false,"landing_page_url":"https://doi.org/10.23919/date.2017.7927029","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5600000023841858,"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1544971428","https://openalex.org/W1553622981","https://openalex.org/W1559393685","https://openalex.org/W1964085324","https://openalex.org/W1967782606","https://openalex.org/W2010390358","https://openalex.org/W2017657360","https://openalex.org/W2022636838","https://openalex.org/W2043287599","https://openalex.org/W2064435670","https://openalex.org/W2070425502","https://openalex.org/W2123619722","https://openalex.org/W2129821171","https://openalex.org/W2135188155","https://openalex.org/W2144091039","https://openalex.org/W2155370145","https://openalex.org/W2535010479","https://openalex.org/W3200692229","https://openalex.org/W6633130854","https://openalex.org/W6679248497","https://openalex.org/W6801632841"],"related_works":["https://openalex.org/W164278522","https://openalex.org/W2606330551","https://openalex.org/W2101851311","https://openalex.org/W2391055460","https://openalex.org/W2085734125","https://openalex.org/W2082238054","https://openalex.org/W1937038249","https://openalex.org/W2351735955","https://openalex.org/W2368755666","https://openalex.org/W1994627759"],"abstract_inverted_index":{"With":[0],"the":[1,123,129],"improvement":[2],"of":[3,51,54,122],"flash":[4,11,55,71,85,107,147],"memory":[5],"storage":[6],"density,":[7],"data":[8,102,136,143],"reliability":[9,26],"and":[10,19,27,38,66,128,134,161,182],"lifetime":[12],"are":[13],"decreased.":[14],"Error":[15],"correction":[16],"codes":[17],"(ECC)":[18],"error":[20,183],"management":[21,39,184],"schemes":[22,100],"can":[23,103,113,149],"boost":[24],"both":[25],"lifetime.":[28],"However,":[29],"in":[30,109],"order":[31],"to":[32,45,68,115,171,177],"develop":[33],"effective":[34,179],"fault":[35,180],"tolerance":[36,181],"algorithms":[37],"solutions,":[40],"it":[41,168],"is":[42,169],"very":[43],"necessary":[44],"have":[46],"a":[47],"more":[48],"profound":[49],"understanding":[50],"failure":[52,72,78,159,175],"modes":[53,79,160,176],"memory.":[56],"To":[57],"enable":[58],"such":[59,87],"understanding,":[60],"we":[61],"design":[62],"an":[63],"experimental":[64],"platform":[65],"scheme":[67],"clearly":[69],"investigate":[70],"modes.":[73],"This":[74],"paper":[75],"examines":[76],"various":[77],"occurring":[80],"at":[81],"2x-nm":[82],"MLC":[83],"NAND":[84],"technologies,":[86],"as":[88],"page":[89,98],"allocation":[90,99],"scheme-based":[91],"program":[92,117],"interference":[93,118,139,153],"(PASBPI)":[94],"errors":[95,121,140],"(i.e.,":[96,141],"different":[97,110,116,135,142],"mean":[101],"be":[104],"programmed":[105,145],"into":[106,146],"pages":[108,148],"ways,":[111],"which":[112],"lead":[114],"errors),":[119],"write":[120],"least":[124],"significant":[125,131],"bit":[126,132],"(LSB)":[127],"most":[130],"(MSB)":[133],"pattern-based":[137],"read":[138,152],"values":[144],"cause":[150],"differential":[151],"errors).":[154],"We":[155,166],"analyze":[156],"these":[157,173],"observed":[158],"explain":[162],"why":[163],"they":[164],"exist.":[165],"hope":[167],"helpful":[170],"understand":[172],"discovered":[174],"propose":[178],"algorithms.":[185]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}