{"id":"https://openalex.org/W4286306111","doi":"https://doi.org/10.23919/ascc56756.2022.9828338","title":"Data Augmentation Method based on Feature Extraction for Improving Classification Performance of CNN","display_name":"Data Augmentation Method based on Feature Extraction for Improving Classification Performance of CNN","publication_year":2022,"publication_date":"2022-05-04","ids":{"openalex":"https://openalex.org/W4286306111","doi":"https://doi.org/10.23919/ascc56756.2022.9828338"},"language":"en","primary_location":{"id":"doi:10.23919/ascc56756.2022.9828338","is_oa":false,"landing_page_url":"https://doi.org/10.23919/ascc56756.2022.9828338","pdf_url":null,"source":{"id":"https://openalex.org/S4363607827","display_name":"2022 13th Asian Control Conference (ASCC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 13th Asian Control Conference (ASCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101943189","display_name":"Eun Kyeong Kim","orcid":"https://orcid.org/0000-0002-2782-7775"},"institutions":[{"id":"https://openalex.org/I4921948","display_name":"Pusan National University","ror":"https://ror.org/01an57a31","country_code":"KR","type":"education","lineage":["https://openalex.org/I4921948"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Eun Kyeong Kim","raw_affiliation_strings":["Pusan National University,Department of Electrical and Electronics Engineering,Busan,Republic of Korea","Department of Electrical and Electronics Engineering, Pusan National University, Busan, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Pusan National University,Department of Electrical and Electronics Engineering,Busan,Republic of Korea","institution_ids":["https://openalex.org/I4921948"]},{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, Pusan National University, Busan, Republic of Korea","institution_ids":["https://openalex.org/I4921948"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100650112","display_name":"Jin Yong Kim","orcid":"https://orcid.org/0000-0002-0235-9872"},"institutions":[{"id":"https://openalex.org/I4921948","display_name":"Pusan National University","ror":"https://ror.org/01an57a31","country_code":"KR","type":"education","lineage":["https://openalex.org/I4921948"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jin Yong Kim","raw_affiliation_strings":["Pusan National University,Department of Electrical and Electronics Engineering,Busan,Republic of Korea","Department of Electrical and Electronics Engineering, Pusan National University, Busan, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Pusan National University,Department of Electrical and Electronics Engineering,Busan,Republic of Korea","institution_ids":["https://openalex.org/I4921948"]},{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, Pusan National University, Busan, Republic of Korea","institution_ids":["https://openalex.org/I4921948"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004154176","display_name":"Baekcheon Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I4921948","display_name":"Pusan National University","ror":"https://ror.org/01an57a31","country_code":"KR","type":"education","lineage":["https://openalex.org/I4921948"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Baekcheon Kim","raw_affiliation_strings":["Pusan National University,Department of Electrical and Electronics Engineering,Busan,Republic of Korea","Department of Electrical and Electronics Engineering, Pusan National University, Busan, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Pusan National University,Department of Electrical and Electronics Engineering,Busan,Republic of Korea","institution_ids":["https://openalex.org/I4921948"]},{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, Pusan National University, Busan, Republic of Korea","institution_ids":["https://openalex.org/I4921948"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5047492763","display_name":"Sungshin Kim","orcid":"https://orcid.org/0000-0003-4932-5458"},"institutions":[{"id":"https://openalex.org/I4921948","display_name":"Pusan National University","ror":"https://ror.org/01an57a31","country_code":"KR","type":"education","lineage":["https://openalex.org/I4921948"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sungshin Kim","raw_affiliation_strings":["Pusan National University,Department of Electrical and Electronics Engineering,Busan,Republic of Korea","Department of Electrical and Electronics Engineering, Pusan National University, Busan, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Pusan National University,Department of Electrical and Electronics Engineering,Busan,Republic of Korea","institution_ids":["https://openalex.org/I4921948"]},{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, Pusan National University, Busan, Republic of Korea","institution_ids":["https://openalex.org/I4921948"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5101943189"],"corresponding_institution_ids":["https://openalex.org/I4921948"],"apc_list":null,"apc_paid":null,"fwci":0.6929,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.57863809,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1126","last_page":"1130"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9912999868392944,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9912999868392944,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9909999966621399,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13243","display_name":"Innovation in Digital Healthcare Systems","score":0.9241999983787537,"subfield":{"id":"https://openalex.org/subfields/3605","display_name":"Health Information Management"},"field":{"id":"https://openalex.org/fields/36","display_name":"Health Professions"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7816407084465027},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7643768787384033},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.7030925750732422},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5926410555839539},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.5842811465263367},{"id":"https://openalex.org/keywords/similarity","display_name":"Similarity (geometry)","score":0.5149300694465637},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.4966445565223694},{"id":"https://openalex.org/keywords/object","display_name":"Object (grammar)","score":0.43414169549942017},{"id":"https://openalex.org/keywords/cognitive-neuroscience-of-visual-object-recognition","display_name":"Cognitive neuroscience of visual object recognition","score":0.4311680197715759},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.4149456322193146},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3576884865760803},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.27143174409866333},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09377315640449524}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7816407084465027},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7643768787384033},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.7030925750732422},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5926410555839539},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.5842811465263367},{"id":"https://openalex.org/C103278499","wikidata":"https://www.wikidata.org/wiki/Q254465","display_name":"Similarity (geometry)","level":3,"score":0.5149300694465637},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.4966445565223694},{"id":"https://openalex.org/C2781238097","wikidata":"https://www.wikidata.org/wiki/Q175026","display_name":"Object (grammar)","level":2,"score":0.43414169549942017},{"id":"https://openalex.org/C64876066","wikidata":"https://www.wikidata.org/wiki/Q5141226","display_name":"Cognitive neuroscience of visual object recognition","level":3,"score":0.4311680197715759},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.4149456322193146},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3576884865760803},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.27143174409866333},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09377315640449524},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/ascc56756.2022.9828338","is_oa":false,"landing_page_url":"https://doi.org/10.23919/ascc56756.2022.9828338","pdf_url":null,"source":{"id":"https://openalex.org/S4363607827","display_name":"2022 13th Asian Control Conference (ASCC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 13th Asian Control Conference (ASCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1686810756","https://openalex.org/W2183341477","https://openalex.org/W2194775991","https://openalex.org/W2911336395","https://openalex.org/W2915627018","https://openalex.org/W3173220350","https://openalex.org/W6637373629"],"related_works":["https://openalex.org/W4375867731","https://openalex.org/W2611989081","https://openalex.org/W4230611425","https://openalex.org/W2731899572","https://openalex.org/W4294635752","https://openalex.org/W4304166257","https://openalex.org/W4383066092","https://openalex.org/W2375480909","https://openalex.org/W3215138031","https://openalex.org/W2353314428"],"abstract_inverted_index":{"Deep":[0],"learning":[1,27,52],"is":[2,13,32,42],"widely":[3],"used":[4],"in":[5,57,67],"various":[6],"fields":[7,60],"including":[8],"the":[9,25,36,50,55,58,74,83,100,109],"manufacturing":[10,59],"field.":[11],"It":[12],"applied":[14],"to":[15,34,44,86],"classify":[16],"objects,":[17],"inspect":[18],"parts":[19],"and":[20,64,82,91,112],"so":[21],"on.":[22],"To":[23],"apply":[24],"deep":[26,51],"for":[28,48],"object":[29,89],"classification,":[30],"it":[31,41],"necessary":[33],"collect":[35,45],"sufficient":[37,46],"training":[38,49],"images.":[39],"However,":[40],"difficult":[43],"images":[47,106],"network":[53],"because":[54],"objects":[56],"are":[61],"uncommon,":[62],"similar,":[63],"not":[65],"contained":[66],"providing":[68],"dataset.":[69],"Therefore,":[70],"this":[71],"paper":[72],"proposes":[73],"data":[75,93],"augmentation":[76],"method":[77,102],"based":[78],"on":[79],"feature":[80],"pre-extraction":[81],"color":[84],"perturbation":[85],"robust":[87,114],"against":[88,115],"similarity":[90],"over-come":[92],"deficiency.":[94],"The":[95],"experimental":[96],"results":[97],"showed":[98],"that":[99],"proposed":[101],"could":[103],"generate":[104],"new":[105],"effectively,":[107],"improve":[108],"classification":[110],"accuracy,":[111],"was":[113],"distinguishing":[116],"similar":[117],"objects.":[118]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
