{"id":"https://openalex.org/W3045878177","doi":"https://doi.org/10.23919/acc45564.2020.9147423","title":"Individual Cell Fault Detection for Parallel-Connected Battery Cells Based on the Statistical Model and Analysis","display_name":"Individual Cell Fault Detection for Parallel-Connected Battery Cells Based on the Statistical Model and Analysis","publication_year":2020,"publication_date":"2020-07-01","ids":{"openalex":"https://openalex.org/W3045878177","doi":"https://doi.org/10.23919/acc45564.2020.9147423","mag":"3045878177"},"language":"en","primary_location":{"id":"doi:10.23919/acc45564.2020.9147423","is_oa":false,"landing_page_url":"https://doi.org/10.23919/acc45564.2020.9147423","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 American Control Conference (ACC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015231589","display_name":"Ziyou Song","orcid":"https://orcid.org/0000-0003-3164-5234"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan\u2013Ann Arbor","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Ziyou Song","raw_affiliation_strings":["Department of Naval Architecture and Marine Engineering, University of Michigan, Ann Arbor, MI, USA"],"affiliations":[{"raw_affiliation_string":"Department of Naval Architecture and Marine Engineering, University of Michigan, Ann Arbor, MI, USA","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064969875","display_name":"Fanny Pinto Delgado","orcid":"https://orcid.org/0000-0003-3844-358X"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan\u2013Ann Arbor","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fanny Pinto Delgado","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI, USA","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100721397","display_name":"Jun Hou","orcid":"https://orcid.org/0000-0001-7116-2945"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan\u2013Ann Arbor","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jun Hou","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI, USA","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044162609","display_name":"Heath Hofmann","orcid":"https://orcid.org/0000-0003-0915-2919"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan\u2013Ann Arbor","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Heath Hofmann","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI, USA","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009899010","display_name":"Jing Sun","orcid":"https://orcid.org/0000-0002-1223-8986"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan\u2013Ann Arbor","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jing Sun","raw_affiliation_strings":["Department of Naval Architecture and Marine Engineering, University of Michigan, Ann Arbor, MI, USA"],"affiliations":[{"raw_affiliation_string":"Department of Naval Architecture and Marine Engineering, University of Michigan, Ann Arbor, MI, USA","institution_ids":["https://openalex.org/I27837315"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5015231589"],"corresponding_institution_ids":["https://openalex.org/I27837315"],"apc_list":null,"apc_paid":null,"fwci":0.6108,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.69694005,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1155","last_page":"1160"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10018","display_name":"Advancements in Battery Materials","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10281","display_name":"Advanced Battery Materials and Technologies","score":0.9815000295639038,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/battery","display_name":"Battery (electricity)","score":0.8066010475158691},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6278210878372192},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5780413746833801},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5590544939041138},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.5454493165016174},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.540161669254303},{"id":"https://openalex.org/keywords/thermal-runaway","display_name":"Thermal runaway","score":0.5225257873535156},{"id":"https://openalex.org/keywords/interval","display_name":"Interval (graph theory)","score":0.512932300567627},{"id":"https://openalex.org/keywords/string","display_name":"String (physics)","score":0.48009875416755676},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.47113364934921265},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.45663172006607056},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.44495242834091187},{"id":"https://openalex.org/keywords/standard-deviation","display_name":"Standard deviation","score":0.4246859848499298},{"id":"https://openalex.org/keywords/probability-distribution","display_name":"Probability distribution","score":0.41147711873054504},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.3635138273239136},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3558708429336548},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24457845091819763},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2019326388835907},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.18470922112464905},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.17036062479019165},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1523536741733551}],"concepts":[{"id":"https://openalex.org/C555008776","wikidata":"https://www.wikidata.org/wiki/Q267298","display_name":"Battery (electricity)","level":3,"score":0.8066010475158691},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6278210878372192},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5780413746833801},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5590544939041138},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.5454493165016174},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.540161669254303},{"id":"https://openalex.org/C72688512","wikidata":"https://www.wikidata.org/wiki/Q908282","display_name":"Thermal runaway","level":4,"score":0.5225257873535156},{"id":"https://openalex.org/C2778067643","wikidata":"https://www.wikidata.org/wiki/Q166507","display_name":"Interval (graph theory)","level":2,"score":0.512932300567627},{"id":"https://openalex.org/C157486923","wikidata":"https://www.wikidata.org/wiki/Q1376436","display_name":"String (physics)","level":2,"score":0.48009875416755676},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.47113364934921265},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.45663172006607056},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.44495242834091187},{"id":"https://openalex.org/C22679943","wikidata":"https://www.wikidata.org/wiki/Q159375","display_name":"Standard deviation","level":2,"score":0.4246859848499298},{"id":"https://openalex.org/C149441793","wikidata":"https://www.wikidata.org/wiki/Q200726","display_name":"Probability distribution","level":2,"score":0.41147711873054504},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.3635138273239136},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3558708429336548},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24457845091819763},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2019326388835907},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.18470922112464905},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.17036062479019165},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1523536741733551},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C37914503","wikidata":"https://www.wikidata.org/wiki/Q156495","display_name":"Mathematical physics","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/acc45564.2020.9147423","is_oa":false,"landing_page_url":"https://doi.org/10.23919/acc45564.2020.9147423","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 American Control Conference (ACC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.41999998688697815,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1208026423","https://openalex.org/W2037479256","https://openalex.org/W2042799003","https://openalex.org/W2166080624","https://openalex.org/W2269200853","https://openalex.org/W2402138818","https://openalex.org/W2552104536","https://openalex.org/W2568828645","https://openalex.org/W2618037459","https://openalex.org/W2737992136","https://openalex.org/W2793542117","https://openalex.org/W2805771039","https://openalex.org/W2808011319","https://openalex.org/W2883938629","https://openalex.org/W2891525819","https://openalex.org/W2891965167","https://openalex.org/W2893044924","https://openalex.org/W2901332649","https://openalex.org/W2910545060","https://openalex.org/W2949938252","https://openalex.org/W2995252411"],"related_works":["https://openalex.org/W4386252821","https://openalex.org/W3157272574","https://openalex.org/W2921503841","https://openalex.org/W3199420763","https://openalex.org/W4304956821","https://openalex.org/W3204761379","https://openalex.org/W4311700797","https://openalex.org/W4284894981","https://openalex.org/W3166392222","https://openalex.org/W4386883790"],"abstract_inverted_index":{"Fault":[0],"diagnosis":[1,125,151],"is":[2,74,90,97,112,127,164,170],"extremely":[3],"important":[4],"to":[5,53,172],"the":[6,63,67,86,94,102,116,130,148,167,173],"safe":[7],"operation":[8],"of":[9,46,66,85,109,118,177],"Lithium-ion":[10],"batteries.":[11],"To":[12,58],"avoid":[13],"severe":[14],"safety":[15],"issues":[16],"(e.g.,":[17],"thermal":[18],"runaway),":[19],"initial":[20],"faults":[21],"should":[22],"be":[23],"timely":[24],"detected":[25],"and":[26,40,76,99,120,129,157],"resolved.":[27],"In":[28,161],"this":[29,59],"paper,":[30],"we":[31],"consider":[32],"parallel-connected":[33],"battery":[34,81,87,110,179],"cells":[35],"with":[36],"only":[37],"one":[38,41],"voltage":[39],"current":[42,48],"sensor.":[43],"The":[44,83,105],"lack":[45],"independent":[47],"sensors":[49],"makes":[50],"it":[51,163],"difficult":[52],"detect":[54],"individual":[55,178],"cell":[56],"degradation.":[57],"end,":[60],"based":[61],"on":[62],"high-frequency":[64],"response":[65],"battery,":[68],"a":[69,79],"simplified":[70],"fault":[71,124,150],"detection-oriented":[72],"model":[73],"derived":[75],"validated":[77],"by":[78,93],"physics-informed":[80],"model.":[82],"resistance":[84,107],"string,":[88],"which":[89],"significantly":[91],"influenced":[92],"faulty":[95],"cell,":[96],"estimated":[98],"used":[100],"as":[101],"health":[103],"indicator.":[104],"statistical":[106,140],"distribution":[108,117],"strings":[111],"first":[113],"analyzed":[114],"considering":[115],"fresh":[119],"aged":[121],"cells.":[122,180],"A":[123],"algorithm":[126,152,169],"proposed":[128,149,168],"thresholds":[131],"(i.e.,":[132],"2":[133],"standard":[134],"deviation":[135],"interval)":[136],"are":[137],"obtained":[138],"through":[139],"analysis.":[141],"Monte":[142],"Carlo":[143],"simulation":[144],"results":[145],"show":[146],"that":[147,166],"can":[153],"balance":[154],"false":[155],"alarms":[156],"missed":[158],"detections":[159],"well.":[160],"addition,":[162],"verified":[165],"robust":[171],"uniform":[174],"parameter":[175],"changes":[176]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":1}],"updated_date":"2026-04-07T14:57:38.498316","created_date":"2025-10-10T00:00:00"}