{"id":"https://openalex.org/W2886897531","doi":"https://doi.org/10.23919/acc.2018.8430882","title":"Control-observer technique for surface imaging with an experimental platform of Scanning-Tunneling-Microscope type","display_name":"Control-observer technique for surface imaging with an experimental platform of Scanning-Tunneling-Microscope type","publication_year":2018,"publication_date":"2018-06-01","ids":{"openalex":"https://openalex.org/W2886897531","doi":"https://doi.org/10.23919/acc.2018.8430882","mag":"2886897531"},"language":"en","primary_location":{"id":"doi:10.23919/acc.2018.8430882","is_oa":false,"landing_page_url":"https://doi.org/10.23919/acc.2018.8430882","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 Annual American Control Conference (ACC)","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5042374081","display_name":"Andrei Popescu","orcid":"https://orcid.org/0000-0002-0906-5527"},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I4210124956","display_name":"Grenoble Images Parole Signal Automatique","ror":"https://ror.org/02wrme198","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4210124956","https://openalex.org/I899635006","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Andrei Popescu","raw_affiliation_strings":["Univ. Grenoble Alpes, TIMA, Grenoble, France","TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet 38031 GRENOBLE Cedex 1 - France)","GIPSA-SYSCO - GIPSA - Syst\u00e8mes non lin\u00e9aires et complexit\u00e9 (GIPSA-lab, 11 rue des Math\u00e9matiques, Grenoble Campus BP46, F-38402 SAINT MARTIN D'HERES CEDEX - France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. Grenoble Alpes, TIMA, Grenoble, France","institution_ids":["https://openalex.org/I899635006"]},{"raw_affiliation_string":"TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet 38031 GRENOBLE Cedex 1 - France)","institution_ids":["https://openalex.org/I4210087012"]},{"raw_affiliation_string":"GIPSA-SYSCO - GIPSA - Syst\u00e8mes non lin\u00e9aires et complexit\u00e9 (GIPSA-lab, 11 rue des Math\u00e9matiques, Grenoble Campus BP46, F-38402 SAINT MARTIN D'HERES CEDEX - France)","institution_ids":["https://openalex.org/I4210124956"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065181808","display_name":"Gildas Besan\u00e7on","orcid":"https://orcid.org/0000-0001-5701-6255"},"institutions":[{"id":"https://openalex.org/I4210124956","display_name":"Grenoble Images Parole Signal Automatique","ror":"https://ror.org/02wrme198","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4210124956","https://openalex.org/I899635006","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Gildas Besancon","raw_affiliation_strings":["Univ. Grenoble Alpes, GIPSA-lab, Grenoble, France","GIPSA-SYSCO - GIPSA - Syst\u00e8mes non lin\u00e9aires et complexit\u00e9 (GIPSA-lab, 11 rue des Math\u00e9matiques, Grenoble Campus BP46, F-38402 SAINT MARTIN D'HERES CEDEX - France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. Grenoble Alpes, GIPSA-lab, Grenoble, France","institution_ids":["https://openalex.org/I4210124956","https://openalex.org/I899635006"]},{"raw_affiliation_string":"GIPSA-SYSCO - GIPSA - Syst\u00e8mes non lin\u00e9aires et complexit\u00e9 (GIPSA-lab, 11 rue des Math\u00e9matiques, Grenoble Campus BP46, F-38402 SAINT MARTIN D'HERES CEDEX - France)","institution_ids":["https://openalex.org/I4210124956"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067744188","display_name":"Alina Voda","orcid":"https://orcid.org/0000-0001-8138-5499"},"institutions":[{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]},{"id":"https://openalex.org/I4210124956","display_name":"Grenoble Images Parole Signal Automatique","ror":"https://ror.org/02wrme198","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4210124956","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Alina Voda","raw_affiliation_strings":["Univ. Grenoble Alpes, GIPSA-lab, Grenoble, France","GIPSA-SLR - GIPSA - Syst\u00e8mes lin\u00e9aires et robustesse (GIPSA-lab, 11 rue des Math\u00e9matiques, Grenoble Campus BP46, F-38402 SAINT MARTIN D'HERES CEDEX - France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. Grenoble Alpes, GIPSA-lab, Grenoble, France","institution_ids":["https://openalex.org/I4210124956","https://openalex.org/I899635006"]},{"raw_affiliation_string":"GIPSA-SLR - GIPSA - Syst\u00e8mes lin\u00e9aires et robustesse (GIPSA-lab, 11 rue des Math\u00e9matiques, Grenoble Campus BP46, F-38402 SAINT MARTIN D'HERES CEDEX - France)","institution_ids":["https://openalex.org/I4210124956"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102827884","display_name":"Skandar Basrour","orcid":"https://orcid.org/0000-0003-1164-7996"},"institutions":[{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]},{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Skandar Basrour","raw_affiliation_strings":["Univ. Grenoble Alpes, TIMA, Grenoble, France","TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet 38031 GRENOBLE Cedex 1 - France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. Grenoble Alpes, TIMA, Grenoble, France","institution_ids":["https://openalex.org/I899635006"]},{"raw_affiliation_string":"TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet 38031 GRENOBLE Cedex 1 - France)","institution_ids":["https://openalex.org/I4210087012"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5042374081"],"corresponding_institution_ids":["https://openalex.org/I4210087012","https://openalex.org/I4210124956","https://openalex.org/I899635006"],"apc_list":null,"apc_paid":null,"fwci":0.9535,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.76346555,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"5113","last_page":"5118"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11525","display_name":"Piezoelectric Actuators and Control","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scanning-tunneling-microscope","display_name":"Scanning tunneling microscope","score":0.8863509297370911},{"id":"https://openalex.org/keywords/observer","display_name":"Observer (physics)","score":0.6537067890167236},{"id":"https://openalex.org/keywords/microscope","display_name":"Microscope","score":0.5997946858406067},{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.5003113746643066},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.49649888277053833},{"id":"https://openalex.org/keywords/surface-reconstruction","display_name":"Surface reconstruction","score":0.49240219593048096},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.48234933614730835},{"id":"https://openalex.org/keywords/scanning-probe-microscopy","display_name":"Scanning probe microscopy","score":0.46889132261276245},{"id":"https://openalex.org/keywords/electrochemical-scanning-tunneling-microscope","display_name":"Electrochemical scanning tunneling microscope","score":0.4572030007839203},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41339874267578125},{"id":"https://openalex.org/keywords/scanning-tunneling-spectroscopy","display_name":"Scanning tunneling spectroscopy","score":0.39512985944747925},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.3798273801803589},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.35911521315574646},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3404286503791809},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1963099241256714},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11399286985397339}],"concepts":[{"id":"https://openalex.org/C6518042","wikidata":"https://www.wikidata.org/wiki/Q175646","display_name":"Scanning tunneling microscope","level":2,"score":0.8863509297370911},{"id":"https://openalex.org/C2780704645","wikidata":"https://www.wikidata.org/wiki/Q9251458","display_name":"Observer (physics)","level":2,"score":0.6537067890167236},{"id":"https://openalex.org/C67649825","wikidata":"https://www.wikidata.org/wiki/Q196538","display_name":"Microscope","level":2,"score":0.5997946858406067},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.5003113746643066},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.49649888277053833},{"id":"https://openalex.org/C20885615","wikidata":"https://www.wikidata.org/wiki/Q825595","display_name":"Surface reconstruction","level":3,"score":0.49240219593048096},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.48234933614730835},{"id":"https://openalex.org/C36628996","wikidata":"https://www.wikidata.org/wiki/Q907287","display_name":"Scanning probe microscopy","level":2,"score":0.46889132261276245},{"id":"https://openalex.org/C5408304","wikidata":"https://www.wikidata.org/wiki/Q5357978","display_name":"Electrochemical scanning tunneling microscope","level":4,"score":0.4572030007839203},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41339874267578125},{"id":"https://openalex.org/C194577767","wikidata":"https://www.wikidata.org/wiki/Q1651687","display_name":"Scanning tunneling spectroscopy","level":3,"score":0.39512985944747925},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.3798273801803589},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.35911521315574646},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3404286503791809},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1963099241256714},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11399286985397339},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.23919/acc.2018.8430882","is_oa":false,"landing_page_url":"https://doi.org/10.23919/acc.2018.8430882","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 Annual American Control Conference (ACC)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-01833278v1","is_oa":false,"landing_page_url":"https://hal.science/hal-01833278","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"https://acc2018.a2c2.org/","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Sustainable cities and communities","score":0.6299999952316284,"id":"https://metadata.un.org/sdg/11"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W190836346","https://openalex.org/W210465376","https://openalex.org/W608630856","https://openalex.org/W1994123418","https://openalex.org/W2012532969","https://openalex.org/W2020328222","https://openalex.org/W2054191813","https://openalex.org/W2055759100","https://openalex.org/W2112118472","https://openalex.org/W2162271101","https://openalex.org/W2174750140","https://openalex.org/W2330970335","https://openalex.org/W2768337749","https://openalex.org/W2784235958","https://openalex.org/W3150248096","https://openalex.org/W4252530655","https://openalex.org/W6651659341","https://openalex.org/W6653516166","https://openalex.org/W6747656882"],"related_works":["https://openalex.org/W2736483163","https://openalex.org/W2078095192","https://openalex.org/W2071339353","https://openalex.org/W2007997200","https://openalex.org/W2976399150","https://openalex.org/W2004379973","https://openalex.org/W2021726762","https://openalex.org/W2079253054","https://openalex.org/W435361125","https://openalex.org/W2023274000"],"abstract_inverted_index":{"This":[0],"paper":[1],"proposes":[2],"a":[3,31,49,54,77,83],"control":[4,65],"strategy":[5],"based":[6],"on":[7],"synthesis":[8],"of":[9,41,72],"robust":[10],"design":[11],"techniques":[12],"with":[13,69,79],"state":[14],"observer":[15],"tools,":[16],"handling":[17],"nonlinearities":[18],"in":[19,26,45],"the":[20,27,39,59],"driving":[21],"piezoactuators,":[22],"as":[23,25],"well":[24],"tunneling":[28],"current":[29],"for":[30],"home-made":[32],"Scanning-Tunneling-Microscope-like":[33],"device":[34],"(STM),":[35],"allowing":[36],"to":[37],"estimate":[38],"surface":[40,74],"nano":[42],"samples.":[43],"As":[44],"standard":[46],"STM":[47],"operation,":[48],"tip":[50],"is":[51,62,67],"driven":[52],"at":[53],"fixed":[55],"(subnanometric)":[56],"distance":[57],"above":[58],"sample":[60],"which":[61],"scanned.":[63],"The":[64],"approach":[66],"illustrated":[68],"an":[70],"example":[71],"experimental":[73],"reconstruction,":[75],"and":[76],"comparison":[78],"results":[80],"provided":[81],"by":[82],"commercial":[84],"STM.":[85]},"counts_by_year":[{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1}],"updated_date":"2026-05-07T13:39:58.223016","created_date":"2025-10-10T00:00:00"}