{"id":"https://openalex.org/W2976663743","doi":"https://doi.org/10.2352/issn.2470-1173.2019.7.iriacv-453","title":"Automated optical inspection for abnormal-shaped packages","display_name":"Automated optical inspection for abnormal-shaped packages","publication_year":2019,"publication_date":"2019-01-09","ids":{"openalex":"https://openalex.org/W2976663743","doi":"https://doi.org/10.2352/issn.2470-1173.2019.7.iriacv-453","mag":"2976663743"},"language":"en","primary_location":{"id":"doi:10.2352/issn.2470-1173.2019.7.iriacv-453","is_oa":false,"landing_page_url":"https://doi.org/10.2352/issn.2470-1173.2019.7.iriacv-453","pdf_url":null,"source":{"id":"https://openalex.org/S4210227276","display_name":"Electronic Imaging","issn_l":"2470-1173","issn":["2470-1173"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronic Imaging","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101061939","display_name":"Wei-Yu Lin","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Wei-Yu Lin","raw_affiliation_strings":["NATIONAL YANG MING CHIAO TUNG UNIVERSITY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NATIONAL YANG MING CHIAO TUNG UNIVERSITY","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033379223","display_name":"Chen-Tao Hsu","orcid":"https://orcid.org/0009-0002-8502-0360"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Chen-Tao Hsu","raw_affiliation_strings":["NATIONAL YANG MING CHIAO TUNG UNIVERSITY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NATIONAL YANG MING CHIAO TUNG UNIVERSITY","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101061940","display_name":"Chi-Chun Chang","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Chi-Chun Chang","raw_affiliation_strings":["NATIONAL YANG MING CHIAO TUNG UNIVERSITY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NATIONAL YANG MING CHIAO TUNG UNIVERSITY","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069670059","display_name":"Jen\u2010Hui Chuang","orcid":"https://orcid.org/0000-0002-4934-4811"},"institutions":[{"id":"https://openalex.org/I4210155092","display_name":"Czech Academy of Sciences, Institute of Computer Science","ror":"https://ror.org/0496n6574","country_code":"CZ","type":"facility","lineage":["https://openalex.org/I202391551","https://openalex.org/I4210155092"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"Jen-Hui Chuang","raw_affiliation_strings":["Institute of Computer Science and Engineering"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Computer Science and Engineering","institution_ids":["https://openalex.org/I4210155092"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15160094,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"31","issue":"7","first_page":"453","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11595","display_name":"Textile materials and evaluations","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11666","display_name":"Color Science and Applications","score":0.9491000175476074,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/yarn","display_name":"Yarn","score":0.7769473791122437},{"id":"https://openalex.org/keywords/textile-industry","display_name":"Textile industry","score":0.6614407896995544},{"id":"https://openalex.org/keywords/textile","display_name":"Textile","score":0.6124753355979919},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5654210448265076},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5306524038314819},{"id":"https://openalex.org/keywords/engineering-drawing","display_name":"Engineering drawing","score":0.4782808721065521},{"id":"https://openalex.org/keywords/automated-x-ray-inspection","display_name":"Automated X-ray inspection","score":0.4521423280239105},{"id":"https://openalex.org/keywords/automated-optical-inspection","display_name":"Automated optical inspection","score":0.4515981078147888},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4209524393081665},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.4121248126029968},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.31264927983283997},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.2061738669872284},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.17304295301437378},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.08089116215705872}],"concepts":[{"id":"https://openalex.org/C2778787235","wikidata":"https://www.wikidata.org/wiki/Q49007","display_name":"Yarn","level":2,"score":0.7769473791122437},{"id":"https://openalex.org/C518936366","wikidata":"https://www.wikidata.org/wiki/Q607081","display_name":"Textile industry","level":2,"score":0.6614407896995544},{"id":"https://openalex.org/C164767435","wikidata":"https://www.wikidata.org/wiki/Q28823","display_name":"Textile","level":2,"score":0.6124753355979919},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5654210448265076},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5306524038314819},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.4782808721065521},{"id":"https://openalex.org/C146920229","wikidata":"https://www.wikidata.org/wiki/Q2278114","display_name":"Automated X-ray inspection","level":4,"score":0.4521423280239105},{"id":"https://openalex.org/C164830781","wikidata":"https://www.wikidata.org/wiki/Q787330","display_name":"Automated optical inspection","level":2,"score":0.4515981078147888},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4209524393081665},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.4121248126029968},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.31264927983283997},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.2061738669872284},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.17304295301437378},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.08089116215705872},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C95457728","wikidata":"https://www.wikidata.org/wiki/Q309","display_name":"History","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.2352/issn.2470-1173.2019.7.iriacv-453","is_oa":false,"landing_page_url":"https://doi.org/10.2352/issn.2470-1173.2019.7.iriacv-453","pdf_url":null,"source":{"id":"https://openalex.org/S4210227276","display_name":"Electronic Imaging","issn_l":"2470-1173","issn":["2470-1173"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronic Imaging","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2389969076","https://openalex.org/W2113302376","https://openalex.org/W2044042350","https://openalex.org/W2150537673","https://openalex.org/W1560398276","https://openalex.org/W1979172994","https://openalex.org/W1979253374","https://openalex.org/W2350299981","https://openalex.org/W2032045337","https://openalex.org/W2391991527"],"abstract_inverted_index":{"In":[0,54],"this":[1,34,55],"paper,":[2],"we":[3,57],"develop":[4,58],"an":[5],"automated":[6],"optical":[7],"inspection":[8,78],"method":[9],"to":[10,33,63,72],"detect":[11],"yarn":[12],"packages’":[13],"defect.":[14],"Although":[15],"textile":[16,46],"industry":[17,35],"is":[18],"regarded":[19],"as":[20],"traditional":[21],"industry,":[22],"many":[23],"new":[24],"technologies,":[25],"e.g.,":[26],"computer":[27],"vision":[28],"detection":[29,61],"algorithms,":[30],"are":[31,41],"applied":[32],"I":[36],"recent":[37],"years.":[38],"Yarn":[39],"packages":[40],"the":[42,74,82],"semi-finished":[43],"good":[44],"of":[45,76],"industry.":[47],"Various":[48],"factors":[49],"may":[50],"cause":[51],"abnormal-shaped":[52],"packages.":[53,66],"study,":[56],"three":[59],"defect":[60],"algorithms":[62,68],"extract":[64],"abnormal-shape":[65],"These":[67],"can":[69],"help":[70],"manufacturer":[71],"avoid":[73],"disadvantages":[75],"human":[77],"effectively":[79],"and":[80],"improve":[81],"productive":[83],"quality.":[84]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}