{"id":"https://openalex.org/W3179298981","doi":"https://doi.org/10.2352/issn.2470-1173.2021.7.iss-092","title":"A Proposal of Analog Correlated Multiple Sampling with High Density Capacitors for Low Noise CMOS Image Sensors","display_name":"A Proposal of Analog Correlated Multiple Sampling with High Density Capacitors for Low Noise CMOS Image Sensors","publication_year":2021,"publication_date":"2021-01-18","ids":{"openalex":"https://openalex.org/W3179298981","doi":"https://doi.org/10.2352/issn.2470-1173.2021.7.iss-092","mag":"3179298981"},"language":"en","primary_location":{"id":"doi:10.2352/issn.2470-1173.2021.7.iss-092","is_oa":false,"landing_page_url":"https://doi.org/10.2352/issn.2470-1173.2021.7.iss-092","pdf_url":null,"source":{"id":"https://openalex.org/S4210227276","display_name":"Electronic Imaging","issn_l":"2470-1173","issn":["2470-1173"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronic Imaging","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007359289","display_name":"Shunta Kamoshita","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Shunta Kamoshita","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102433663","display_name":"Manabu Suzuki","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Manabu Suzuki","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059412772","display_name":"Rihito Kuroda","orcid":"https://orcid.org/0000-0001-7812-3084"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Rihito Kuroda","raw_affiliation_strings":["ENG - Management Science and Technology"],"affiliations":[{"raw_affiliation_string":"ENG - Management Science and Technology","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110456758","display_name":"Shigetoshi Sugawa","orcid":null},"institutions":[{"id":"https://openalex.org/I137844521","display_name":"Hatch (Canada)","ror":"https://ror.org/017fcpb94","country_code":"CA","type":"company","lineage":["https://openalex.org/I137844521"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Shigetoshi Sugawa","raw_affiliation_strings":["New Industry Creation Hatchery Center (NICHe)"],"affiliations":[{"raw_affiliation_string":"New Industry Creation Hatchery Center (NICHe)","institution_ids":["https://openalex.org/I137844521"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5007359289"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1003,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.41795962,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":"33","issue":"7","first_page":"92","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6738805174827576},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.643446147441864},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.5654433369636536},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5417317748069763},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.5040966272354126},{"id":"https://openalex.org/keywords/correlated-double-sampling","display_name":"Correlated double sampling","score":0.4224315881729126},{"id":"https://openalex.org/keywords/image-noise","display_name":"Image noise","score":0.4124619960784912},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.407195508480072},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.39006146788597107},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38314372301101685},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.33904242515563965},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.24914118647575378},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2127470076084137},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.07814228534698486}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6738805174827576},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.643446147441864},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.5654433369636536},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5417317748069763},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.5040966272354126},{"id":"https://openalex.org/C118277053","wikidata":"https://www.wikidata.org/wiki/Q5172837","display_name":"Correlated double sampling","level":4,"score":0.4224315881729126},{"id":"https://openalex.org/C35772409","wikidata":"https://www.wikidata.org/wiki/Q1323086","display_name":"Image noise","level":3,"score":0.4124619960784912},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.407195508480072},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.39006146788597107},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38314372301101685},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.33904242515563965},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.24914118647575378},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2127470076084137},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.07814228534698486},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.2352/issn.2470-1173.2021.7.iss-092","is_oa":false,"landing_page_url":"https://doi.org/10.2352/issn.2470-1173.2021.7.iss-092","pdf_url":null,"source":{"id":"https://openalex.org/S4210227276","display_name":"Electronic Imaging","issn_l":"2470-1173","issn":["2470-1173"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronic Imaging","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8899999856948853}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2022123780","https://openalex.org/W2349576212","https://openalex.org/W4384282188","https://openalex.org/W2069998638","https://openalex.org/W1981776476","https://openalex.org/W2352535872","https://openalex.org/W2382967348","https://openalex.org/W2107073676","https://openalex.org/W4255753471","https://openalex.org/W2542675020"],"abstract_inverted_index":{"In":[0],"this":[1],"paper":[2],"we":[3],"propose":[4],"a":[5],"low":[6,23],"power":[7],"consumption":[8],"high":[9,18,37,85],"speed":[10],"analog":[11,32,91],"correlated":[12,110],"multiple":[13],"sampling":[14,61,68],"(CMS)":[15],"technique":[16],"with":[17,30,65,99,108],"density":[19,38],"switched":[20],"capacitors":[21,40],"for":[22],"noise":[24,48,56,115],"CMOS":[25],"image":[26],"sensors.":[27],"A":[28],"CIS":[29],"256":[31],"memories":[33],"per":[34],"pixel":[35],"using":[36],"trench":[39],"was":[41],"employed":[42],"in":[43,114],"order":[44],"to":[45,72,83,88],"verify":[46],"the":[47,84,89,100],"reduction":[49],"effect":[50],"dependent":[51],"on":[52],"operation":[53],"timings.":[54],"The":[55,94],"characteristics":[57],"were":[58],"measured":[59],"at":[60],"numbers":[62],"of":[63,70],"M=1~64":[64],"various":[66],"CMS":[67,92,107],"period":[69],"10ns":[71],"1\u00b5s":[73],"and":[74,79],"time":[75],"interval":[76],"between":[77],"reset":[78],"signal":[80],"samplings,":[81],"thanks":[82],"flexibility":[86],"owing":[87],"proposed":[90],"technique.":[93],"measurement":[95],"results":[96],"agree":[97],"well":[98],"theoretical":[101],"calculation":[102],"results,":[103],"showing":[104],"that":[105],"conducting":[106],"highly":[109],"signals":[111],"is":[112],"effective":[113],"reduction.":[116]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}