{"id":"https://openalex.org/W3180957993","doi":"https://doi.org/10.2352/issn.2470-1173.2021.18.3dia-065","title":"3D digital image correlation system for monitoring of changes induced by RH fluctuations on parchment","display_name":"3D digital image correlation system for monitoring of changes induced by RH fluctuations on parchment","publication_year":2021,"publication_date":"2021-01-18","ids":{"openalex":"https://openalex.org/W3180957993","doi":"https://doi.org/10.2352/issn.2470-1173.2021.18.3dia-065","mag":"3180957993"},"language":"en","primary_location":{"id":"doi:10.2352/issn.2470-1173.2021.18.3dia-065","is_oa":false,"landing_page_url":"https://doi.org/10.2352/issn.2470-1173.2021.18.3dia-065","pdf_url":null,"source":{"id":"https://openalex.org/S4210227276","display_name":"Electronic Imaging","issn_l":"2470-1173","issn":["2470-1173"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronic Imaging","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://doi.org/10.2352/ISSN.2470-1173.2021.18.3DIA-065","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068021648","display_name":"\u0391\u03b8\u03b1\u03bd\u03b1\u03c3\u03af\u03b1 \u03a0\u03b1\u03c0\u03b1\u03bd\u03b9\u03ba\u03bf\u03bb\u03ac\u03bf\u03c5","orcid":"https://orcid.org/0000-0002-7377-2760"},"institutions":[{"id":"https://openalex.org/I108403487","display_name":"Warsaw University of Technology","ror":"https://ror.org/00y0xnp53","country_code":"PL","type":"education","lineage":["https://openalex.org/I108403487"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Athanasia Papanikolaou","raw_affiliation_strings":["Faculty of Mechatronics, Warsaw University of Technology, Warsaw, Poland;"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Mechatronics, Warsaw University of Technology, Warsaw, Poland;","institution_ids":["https://openalex.org/I108403487"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040774617","display_name":"Dorota Dzik-Kruszelnicka","orcid":"https://orcid.org/0000-0002-8709-2651"},"institutions":[{"id":"https://openalex.org/I4210128221","display_name":"Academy of Fine Arts in Warsaw","ror":"https://ror.org/036d1w285","country_code":"PL","type":"education","lineage":["https://openalex.org/I4210128221"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Dorota Dzik-Kruszelnicka","raw_affiliation_strings":["Faculty of Conservation and Restoration of Works of Art, Academy of Fine Arts in Warsaw, Poland;"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Conservation and Restoration of Works of Art, Academy of Fine Arts in Warsaw, Poland;","institution_ids":["https://openalex.org/I4210128221"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086204573","display_name":"Sunita Saha","orcid":"https://orcid.org/0000-0001-7259-8994"},"institutions":[{"id":"https://openalex.org/I108403487","display_name":"Warsaw University of Technology","ror":"https://ror.org/00y0xnp53","country_code":"PL","type":"education","lineage":["https://openalex.org/I108403487"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Sunita Saha","raw_affiliation_strings":["Faculty of Mechatronics, Warsaw University of Technology, Warsaw, Poland;"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Mechatronics, Warsaw University of Technology, Warsaw, Poland;","institution_ids":["https://openalex.org/I108403487"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079110571","display_name":"Ma\u0142gorzata Kujawi\u0144ska","orcid":"https://orcid.org/0000-0001-6521-6951"},"institutions":[{"id":"https://openalex.org/I108403487","display_name":"Warsaw University of Technology","ror":"https://ror.org/00y0xnp53","country_code":"PL","type":"education","lineage":["https://openalex.org/I108403487"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Malgorzata Kujawinska","raw_affiliation_strings":["Faculty of Mechatronics, Warsaw University of Technology, Warsaw, Poland;"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Mechatronics, Warsaw University of Technology, Warsaw, Poland;","institution_ids":["https://openalex.org/I108403487"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":5.7046,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.95259301,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"33","issue":"18","first_page":"65","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11212","display_name":"Cultural Heritage Materials Analysis","score":0.9900000095367432,"subfield":{"id":"https://openalex.org/subfields/1204","display_name":"Archeology"},"field":{"id":"https://openalex.org/fields/12","display_name":"Arts and Humanities"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11212","display_name":"Cultural Heritage Materials Analysis","score":0.9900000095367432,"subfield":{"id":"https://openalex.org/subfields/1204","display_name":"Archeology"},"field":{"id":"https://openalex.org/fields/12","display_name":"Arts and Humanities"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9869999885559082,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9811999797821045,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parchment","display_name":"Parchment","score":0.9757214188575745},{"id":"https://openalex.org/keywords/digital-image-correlation","display_name":"Digital image correlation","score":0.6069630980491638},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.4335099458694458},{"id":"https://openalex.org/keywords/correlation","display_name":"Correlation","score":0.4303285479545593},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3555980920791626},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.33260565996170044},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.21437034010887146},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.20935776829719543},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.194026380777359},{"id":"https://openalex.org/keywords/philosophy","display_name":"Philosophy","score":0.12057960033416748},{"id":"https://openalex.org/keywords/theology","display_name":"Theology","score":0.08576130867004395},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.06993645429611206}],"concepts":[{"id":"https://openalex.org/C2780845164","wikidata":"https://www.wikidata.org/wiki/Q226697","display_name":"Parchment","level":2,"score":0.9757214188575745},{"id":"https://openalex.org/C115635565","wikidata":"https://www.wikidata.org/wiki/Q860900","display_name":"Digital image correlation","level":2,"score":0.6069630980491638},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.4335099458694458},{"id":"https://openalex.org/C117220453","wikidata":"https://www.wikidata.org/wiki/Q5172842","display_name":"Correlation","level":2,"score":0.4303285479545593},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3555980920791626},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.33260565996170044},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.21437034010887146},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.20935776829719543},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.194026380777359},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.12057960033416748},{"id":"https://openalex.org/C27206212","wikidata":"https://www.wikidata.org/wiki/Q34178","display_name":"Theology","level":1,"score":0.08576130867004395},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.06993645429611206}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.2352/issn.2470-1173.2021.18.3dia-065","is_oa":false,"landing_page_url":"https://doi.org/10.2352/issn.2470-1173.2021.18.3dia-065","pdf_url":null,"source":{"id":"https://openalex.org/S4210227276","display_name":"Electronic Imaging","issn_l":"2470-1173","issn":["2470-1173"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronic Imaging","raw_type":"journal-article"},{"id":"pmh:oai:zenodo.org:4501433","is_oa":true,"landing_page_url":"https://doi.org/10.2352/ISSN.2470-1173.2021.18.3DIA-065","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"EI 2021, IS&T International Symposium on Electronic Imaging 2021. 3D Imaging and Applications, Virtual, 18.-28. January 2021","raw_type":"info:eu-repo/semantics/conferencePaper"}],"best_oa_location":{"id":"pmh:oai:zenodo.org:4501433","is_oa":true,"landing_page_url":"https://doi.org/10.2352/ISSN.2470-1173.2021.18.3DIA-065","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"EI 2021, IS&T International Symposium on Electronic Imaging 2021. 3D Imaging and Applications, Virtual, 18.-28. January 2021","raw_type":"info:eu-repo/semantics/conferencePaper"},"sustainable_development_goals":[{"display_name":"Sustainable cities and communities","score":0.8399999737739563,"id":"https://metadata.un.org/sdg/11"}],"awards":[{"id":"https://openalex.org/G247124224","display_name":"Cultural Heritage Analysis for New GEnerations","funder_award_id":"813789","funder_id":"https://openalex.org/F4320320300","funder_display_name":"European Commission"},{"id":"https://openalex.org/G434337789","display_name":null,"funder_award_id":"HORIZON2020","funder_id":"https://openalex.org/F4320320300","funder_display_name":"European Commission"}],"funders":[{"id":"https://openalex.org/F4320320300","display_name":"European Commission","ror":"https://ror.org/00k4n6c32"},{"id":"https://openalex.org/F4320322637","display_name":"Politechnika Warszawska","ror":"https://ror.org/00y0xnp53"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W821684417","https://openalex.org/W1502539743","https://openalex.org/W1580750110","https://openalex.org/W1976247079","https://openalex.org/W1993026531","https://openalex.org/W2034414456","https://openalex.org/W2061672827","https://openalex.org/W2136826718","https://openalex.org/W2195025960","https://openalex.org/W4234688273","https://openalex.org/W4242905629"],"related_works":["https://openalex.org/W2059647898","https://openalex.org/W2561762491","https://openalex.org/W4385764848","https://openalex.org/W2287263033","https://openalex.org/W4231003474","https://openalex.org/W2066900119","https://openalex.org/W1973934866","https://openalex.org/W2231060021","https://openalex.org/W4252338231","https://openalex.org/W2033870876"],"abstract_inverted_index":{"One":[0],"of":[1,6,32,62,74,100,105,119,133],"the":[2,59,75,91,120],"most":[3],"common":[4],"sources":[5],"damage":[7],"in":[8,102,155],"Cultural":[9],"Heritage":[10],"Objects":[11],"(CHO)":[12],"such":[13],"as":[14],"parchment,":[15],"oil":[16],"paintings":[17],"and":[18,29,48,124,151],"historical":[19,141],"textiles":[20],"is":[21,51,81],"relative":[22],"humidity":[23],"(RH)":[24],"changes":[25,147],"which":[26,39],"cause":[27],"inplane":[28,150],"out-of-plane":[30,152],"displacements":[31,43,101,153],"their":[33,109,114],"surfaces.":[34],"The":[35,117,136],"best":[36],"suited":[37],"method":[38,97],"enables":[40],"full-field,":[41],"non-contact":[42],"measurement":[44],"with":[45],"high":[46],"resolution":[47],"sufficient":[49],"range,":[50],"3D":[52,95],"Digital":[53],"Image":[54],"Correlation":[55],"(3D":[56],"DIC).":[57],"However,":[58],"standard":[60],"version":[61],"DIC":[63,96],"requires":[64],"applying":[65],"random,":[66],"good":[67],"contrast":[68],"speckle":[69],"pattern":[70],"at":[71],"a":[72],"surface":[73,110],"object":[76],"under":[77],"investigation.":[78],"Such":[79],"requirement":[80],"not":[82],"acceptable":[83],"for":[84,98],"CHOs.":[85],"In":[86],"this":[87],"paper,":[88],"we":[89],"analyze":[90],"possibility":[92],"to":[93,129,144],"apply":[94],"monitoring":[99,132],"selected":[103],"groups":[104],"CHOs":[106],"without":[107],"modifying":[108],"i.e.":[111],"based":[112],"on":[113],"natural":[115],"texture.":[116],"selection":[118],"data":[121],"capturing":[122],"conditions":[123],"analysis":[125],"parameters":[126],"can":[127],"lead":[128],"successful":[130],"non-invasive":[131],"CHOs’":[134],"behavior.":[135],"samples":[137],"studied":[138],"herein":[139],"are":[140],"parchments":[142],"subjected":[143],"controlled":[145],"RH":[146],"that":[148],"impose":[149],"variations":[154],"time.":[156]},"counts_by_year":[{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":1}],"updated_date":"2026-08-04T08:18:43.703281","created_date":"2025-10-10T00:00:00"}