{"id":"https://openalex.org/W2715257832","doi":"https://doi.org/10.2352/issn.2470-1173.2017.11.imse-187","title":"A Lateral Electric Field charge Modulator with Bipolar-gates for Time-resolved Imaging","display_name":"A Lateral Electric Field charge Modulator with Bipolar-gates for Time-resolved Imaging","publication_year":2017,"publication_date":"2017-01-29","ids":{"openalex":"https://openalex.org/W2715257832","doi":"https://doi.org/10.2352/issn.2470-1173.2017.11.imse-187","mag":"2715257832"},"language":"en","primary_location":{"id":"doi:10.2352/issn.2470-1173.2017.11.imse-187","is_oa":false,"landing_page_url":"https://doi.org/10.2352/issn.2470-1173.2017.11.imse-187","pdf_url":null,"source":{"id":"https://openalex.org/S4210227276","display_name":"Electronic Imaging","issn_l":"2470-1173","issn":["2470-1173"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronic Imaging","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5031628824","display_name":"Yuki Morikawa","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Yuki Morikawa","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032893390","display_name":"Keita Yasutomi","orcid":"https://orcid.org/0000-0003-0818-8506"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Keita Yasutomi","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110503465","display_name":"Shoma Imanishi","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Shoma Imanishi","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074244031","display_name":"Taishi Takasawa","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Taishi Takasawa","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102722014","display_name":"Keiichiro Kagawa","orcid":"https://orcid.org/0000-0002-4214-2029"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Keiichiro Kagawa","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049537828","display_name":"Nobukazu Teranishi","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Nobukazu Teranishi","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5065338590","display_name":"Shoji Kawahito","orcid":"https://orcid.org/0000-0003-4456-5006"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Shoji Kawahito","raw_affiliation_strings":[],"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5031628824"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1433,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.49343284,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"29","issue":"11","first_page":"64","last_page":"67"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/modulation","display_name":"Modulation (music)","score":0.6382960081100464},{"id":"https://openalex.org/keywords/electric-field","display_name":"Electric field","score":0.5939264893531799},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5876882076263428},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5397418737411499},{"id":"https://openalex.org/keywords/charge","display_name":"Charge (physics)","score":0.5118057131767273},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.46709176898002625},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.454972505569458},{"id":"https://openalex.org/keywords/substrate","display_name":"Substrate (aquarium)","score":0.4467744827270508},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.42457181215286255},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3618777394294739},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3443930745124817},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.25786125659942627},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.20293638110160828},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1184203028678894}],"concepts":[{"id":"https://openalex.org/C123079801","wikidata":"https://www.wikidata.org/wiki/Q750240","display_name":"Modulation (music)","level":2,"score":0.6382960081100464},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.5939264893531799},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5876882076263428},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5397418737411499},{"id":"https://openalex.org/C188082385","wikidata":"https://www.wikidata.org/wiki/Q73792","display_name":"Charge (physics)","level":2,"score":0.5118057131767273},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.46709176898002625},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.454972505569458},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.4467744827270508},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.42457181215286255},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3618777394294739},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3443930745124817},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.25786125659942627},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.20293638110160828},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1184203028678894},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.2352/issn.2470-1173.2017.11.imse-187","is_oa":false,"landing_page_url":"https://doi.org/10.2352/issn.2470-1173.2017.11.imse-187","pdf_url":null,"source":{"id":"https://openalex.org/S4210227276","display_name":"Electronic Imaging","issn_l":"2470-1173","issn":["2470-1173"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronic Imaging","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7300000190734863}],"awards":[],"funders":[{"id":"https://openalex.org/F4320322832","display_name":"University of Tokyo","ror":"https://ror.org/057zh3y96"},{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2362645459","https://openalex.org/W4377941396","https://openalex.org/W2085033728","https://openalex.org/W4285411112","https://openalex.org/W2171299904","https://openalex.org/W1647606319","https://openalex.org/W4390494008","https://openalex.org/W2053596378","https://openalex.org/W4236504760","https://openalex.org/W1504075740"],"abstract_inverted_index":{"This":[0],"paper":[1],"reports":[2],"high":[3,21],"time-resolved":[4,22],"imaging":[5],"technique":[6],"using":[7,26],"a":[8],"lateral":[9],"electric":[10],"field":[11],"charge":[12,52],"modulator":[13],"with":[14],"bipolar-gates.":[15],"The":[16,40],"proposed":[17],"pixel":[18],"structure":[19],"achieved":[20],"signal":[23],"detection":[24],"by":[25,30],"negative":[27],"bias":[28],"effect":[29],"work":[31],"function":[32],"difference":[33],"between":[34],"the":[35,50,55],"p-type":[36],"gate":[37],"and":[38,54],"p-substrate.":[39],"test":[41],"chip":[42],"fabricated":[43],"in":[44],"0.11":[45],"um":[46],"CIS":[47],"technology":[48],"demonstrates":[49],"high-speed":[51],"modulation,":[53],"modulation":[56],"contrast":[57],"is":[58],"measured":[59],"to":[60],"be":[61],"97%.":[62]},"counts_by_year":[{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}