{"id":"https://openalex.org/W2580642633","doi":"https://doi.org/10.2352/issn.2470-1173.2016.12.imse-282","title":"A comparative noise analysis and measurement for n-type and p-type pixels with CMS technique","display_name":"A comparative noise analysis and measurement for n-type and p-type pixels with CMS technique","publication_year":2016,"publication_date":"2016-02-14","ids":{"openalex":"https://openalex.org/W2580642633","doi":"https://doi.org/10.2352/issn.2470-1173.2016.12.imse-282","mag":"2580642633"},"language":"en","primary_location":{"id":"doi:10.2352/issn.2470-1173.2016.12.imse-282","is_oa":false,"landing_page_url":"https://doi.org/10.2352/issn.2470-1173.2016.12.imse-282","pdf_url":null,"source":{"id":"https://openalex.org/S4210227276","display_name":"Electronic Imaging","issn_l":"2470-1173","issn":["2470-1173"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronic Imaging","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072566962","display_name":"Xiao\u2010Liang Ge","orcid":"https://orcid.org/0000-0001-6265-9597"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Xiaoliang Ge","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084213770","display_name":"Bastien Mamdy","orcid":"https://orcid.org/0000-0003-1381-5447"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Bastien Mamdy","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5024949637","display_name":"Albert Theuwissen","orcid":"https://orcid.org/0000-0002-2176-6828"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Albert Theuwissen","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1473,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.61041076,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"28","issue":"12","first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9941999912261963,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.7160778045654297},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.7003676891326904},{"id":"https://openalex.org/keywords/noise-spectral-density","display_name":"Noise spectral density","score":0.5585924983024597},{"id":"https://openalex.org/keywords/type","display_name":"Type (biology)","score":0.5089845657348633},{"id":"https://openalex.org/keywords/dark-frame-subtraction","display_name":"Dark-frame subtraction","score":0.4648759663105011},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.45962679386138916},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.44439971446990967},{"id":"https://openalex.org/keywords/noise-measurement","display_name":"Noise measurement","score":0.4394802153110504},{"id":"https://openalex.org/keywords/image-noise","display_name":"Image noise","score":0.4327068328857422},{"id":"https://openalex.org/keywords/noise-temperature","display_name":"Noise temperature","score":0.41328081488609314},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.36328020691871643},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.34959930181503296},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2901216149330139},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.27570122480392456},{"id":"https://openalex.org/keywords/noise-figure","display_name":"Noise figure","score":0.26638299226760864},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2480749487876892},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.22435468435287476},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.2020423710346222},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19856059551239014},{"id":"https://openalex.org/keywords/median-filter","display_name":"Median filter","score":0.19800812005996704},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.17881187796592712},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.15761056542396545},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.15453779697418213}],"concepts":[{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.7160778045654297},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.7003676891326904},{"id":"https://openalex.org/C133976006","wikidata":"https://www.wikidata.org/wiki/Q3023291","display_name":"Noise spectral density","level":5,"score":0.5585924983024597},{"id":"https://openalex.org/C2777299769","wikidata":"https://www.wikidata.org/wiki/Q3707858","display_name":"Type (biology)","level":2,"score":0.5089845657348633},{"id":"https://openalex.org/C1160358","wikidata":"https://www.wikidata.org/wiki/Q861103","display_name":"Dark-frame subtraction","level":5,"score":0.4648759663105011},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.45962679386138916},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.44439971446990967},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.4394802153110504},{"id":"https://openalex.org/C35772409","wikidata":"https://www.wikidata.org/wiki/Q1323086","display_name":"Image noise","level":3,"score":0.4327068328857422},{"id":"https://openalex.org/C52660251","wikidata":"https://www.wikidata.org/wiki/Q17083145","display_name":"Noise temperature","level":3,"score":0.41328081488609314},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.36328020691871643},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.34959930181503296},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2901216149330139},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.27570122480392456},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.26638299226760864},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2480749487876892},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.22435468435287476},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.2020423710346222},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19856059551239014},{"id":"https://openalex.org/C55352655","wikidata":"https://www.wikidata.org/wiki/Q304247","display_name":"Median filter","level":4,"score":0.19800812005996704},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.17881187796592712},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.15761056542396545},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.15453779697418213},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.2352/issn.2470-1173.2016.12.imse-282","is_oa":false,"landing_page_url":"https://doi.org/10.2352/issn.2470-1173.2016.12.imse-282","pdf_url":null,"source":{"id":"https://openalex.org/S4210227276","display_name":"Electronic Imaging","issn_l":"2470-1173","issn":["2470-1173"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronic Imaging","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1988257008","https://openalex.org/W4387697428","https://openalex.org/W2180056344","https://openalex.org/W2118931924","https://openalex.org/W2148623572","https://openalex.org/W2015133066","https://openalex.org/W1995439684","https://openalex.org/W2185170994","https://openalex.org/W2099930065","https://openalex.org/W2462235995"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,57,77,91,103],"noise":[4,7,22,34,72,100],"analysis":[5],"and":[6,11,40,60,69,87,94,109],"measurements":[8],"of":[9,27,50],"n-type":[10,59,86],"p-type":[12,61,88],"pixels":[13,89],"with":[14,31,56,74,102],"correlated":[15],"multiple":[16],"sampling":[17],"(CMS)":[18],"technique.":[19],"The":[20,67],"output":[21],"power":[23],"spectral":[24,44],"density":[25],"(PSD)":[26],"both":[28],"pixel":[29,52],"types":[30],"different":[32],"CMS":[33,75,108],"reduction":[35],"factors":[36],"have":[37,53],"been":[38,54],"simulated":[39],"calculated":[41,68],"in":[42],"the":[43,70,85],"domain.":[45],"For":[46],"validation,":[47],"two":[48],"groups":[49],"test":[51],"fabricated":[55],"state-of-the-art":[58],"CMOS":[62],"image":[63],"sensor":[64],"(CIS)":[65],"technology.":[66],"measured":[71],"results":[73,81],"show":[76,83],"good":[78],"agreement.":[79],"Measurement":[80],"also":[82],"that":[84],"reach":[90],"1.1":[92],"e-":[93],"0.88":[95],"h+":[96],"input-":[97],"referred":[98],"temporal":[99],"respectively":[101],"board-level":[104],"64":[105],"times":[106],"digital":[107],"\u00d76":[110],"analog":[111],"gain.":[112]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}