{"id":"https://openalex.org/W2093727429","doi":"https://doi.org/10.2200/s00547ed1v01y201311pel006","title":"Transient Electro-Thermal Modeling of Bipolar Power Semiconductor Devices","display_name":"Transient Electro-Thermal Modeling of Bipolar Power Semiconductor Devices","publication_year":2013,"publication_date":"2013-11-26","ids":{"openalex":"https://openalex.org/W2093727429","doi":"https://doi.org/10.2200/s00547ed1v01y201311pel006","mag":"2093727429"},"language":"en","primary_location":{"id":"doi:10.2200/s00547ed1v01y201311pel006","is_oa":false,"landing_page_url":"https://doi.org/10.2200/s00547ed1v01y201311pel006","pdf_url":null,"source":{"id":"https://openalex.org/S58161995","display_name":"Synthesis lectures on power electronics","issn_l":"1931-9525","issn":["1931-9525","1931-9533"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310322570","host_organization_name":"Morgan & Claypool Publishers","host_organization_lineage":["https://openalex.org/P4310322570"],"host_organization_lineage_names":["Morgan & Claypool Publishers"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Synthesis Lectures on Power Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074635364","display_name":"Tanya Kirilova Gachovska","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Tanya Kirilova Gachovska","raw_affiliation_strings":["[Solantro Semiconductor Inc.]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"[Solantro Semiconductor Inc.]","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101913974","display_name":"Bin Du","orcid":"https://orcid.org/0000-0002-4327-0073"},"institutions":[{"id":"https://openalex.org/I4210117054","display_name":"Danfoss (Denmark)","ror":"https://ror.org/039pgdx28","country_code":"DK","type":"company","lineage":["https://openalex.org/I4210117054"]},{"id":"https://openalex.org/I4210144614","display_name":"Danfoss (United States)","ror":"https://ror.org/049jgef55","country_code":"US","type":"company","lineage":["https://openalex.org/I4210117054","https://openalex.org/I4210144614"]}],"countries":["DK","US"],"is_corresponding":false,"raw_author_name":"Bin Du","raw_affiliation_strings":["Danfoss Power Electronics, USA","[Danfoss Power Electronics]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Danfoss Power Electronics, USA","institution_ids":["https://openalex.org/I4210144614"]},{"raw_affiliation_string":"[Danfoss Power Electronics]","institution_ids":["https://openalex.org/I4210117054"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063277601","display_name":"J.L. Hudgins","orcid":"https://orcid.org/0000-0002-2825-6759"},"institutions":[{"id":"https://openalex.org/I114395901","display_name":"University of Nebraska\u2013Lincoln","ror":"https://ror.org/043mer456","country_code":"US","type":"education","lineage":["https://openalex.org/I114395901"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jerry L. Hudgins","raw_affiliation_strings":["University of Nebraska, USA","university of nebraska"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Nebraska, USA","institution_ids":[]},{"raw_affiliation_string":"university of nebraska","institution_ids":["https://openalex.org/I114395901"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5090144912","display_name":"Enrico Santi","orcid":"https://orcid.org/0000-0001-6135-0096"},"institutions":[{"id":"https://openalex.org/I155781252","display_name":"University of South Carolina","ror":"https://ror.org/02b6qw903","country_code":"US","type":"education","lineage":["https://openalex.org/I155781252"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Enrico Santi","raw_affiliation_strings":["University of South Carolina, USA","University of South Carolina"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of South Carolina, USA","institution_ids":["https://openalex.org/I155781252"]},{"raw_affiliation_string":"University of South Carolina","institution_ids":["https://openalex.org/I155781252"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5074635364"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.48,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.71081216,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"4","issue":"2","first_page":"1","last_page":"84"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9912999868392944,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9897000193595886,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/junction-temperature","display_name":"Junction temperature","score":0.7670013308525085},{"id":"https://openalex.org/keywords/semiconductor-device","display_name":"Semiconductor device","score":0.7146311402320862},{"id":"https://openalex.org/keywords/power-semiconductor-device","display_name":"Power semiconductor device","score":0.70293128490448},{"id":"https://openalex.org/keywords/semiconductor","display_name":"Semiconductor","score":0.6317504644393921},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.5945891737937927},{"id":"https://openalex.org/keywords/thermal-resistance","display_name":"Thermal resistance","score":0.4776502847671509},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4714806079864502},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4705747961997986},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.44473764300346375},{"id":"https://openalex.org/keywords/fourier-series","display_name":"Fourier series","score":0.4416908919811249},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.42403578758239746},{"id":"https://openalex.org/keywords/semiconductor-device-modeling","display_name":"Semiconductor device modeling","score":0.4133909046649933},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3814292550086975},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3474385142326355},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.332132488489151},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3292046785354614},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.23895475268363953},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18557417392730713}],"concepts":[{"id":"https://openalex.org/C167781694","wikidata":"https://www.wikidata.org/wiki/Q6311800","display_name":"Junction temperature","level":3,"score":0.7670013308525085},{"id":"https://openalex.org/C79635011","wikidata":"https://www.wikidata.org/wiki/Q175805","display_name":"Semiconductor device","level":3,"score":0.7146311402320862},{"id":"https://openalex.org/C129014197","wikidata":"https://www.wikidata.org/wiki/Q906544","display_name":"Power semiconductor device","level":3,"score":0.70293128490448},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.6317504644393921},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.5945891737937927},{"id":"https://openalex.org/C137693562","wikidata":"https://www.wikidata.org/wiki/Q899628","display_name":"Thermal resistance","level":3,"score":0.4776502847671509},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4714806079864502},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4705747961997986},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.44473764300346375},{"id":"https://openalex.org/C207864730","wikidata":"https://www.wikidata.org/wiki/Q179467","display_name":"Fourier series","level":2,"score":0.4416908919811249},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.42403578758239746},{"id":"https://openalex.org/C4775677","wikidata":"https://www.wikidata.org/wiki/Q7449393","display_name":"Semiconductor device modeling","level":3,"score":0.4133909046649933},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3814292550086975},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3474385142326355},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.332132488489151},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3292046785354614},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.23895475268363953},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18557417392730713},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.2200/s00547ed1v01y201311pel006","is_oa":false,"landing_page_url":"https://doi.org/10.2200/s00547ed1v01y201311pel006","pdf_url":null,"source":{"id":"https://openalex.org/S58161995","display_name":"Synthesis lectures on power electronics","issn_l":"1931-9525","issn":["1931-9525","1931-9533"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310322570","host_organization_name":"Morgan & Claypool Publishers","host_organization_lineage":["https://openalex.org/P4310322570"],"host_organization_lineage_names":["Morgan & Claypool Publishers"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Synthesis Lectures on Power Electronics","raw_type":"journal-article"},{"id":"pmh:oai:cds.cern.ch:2122942","is_oa":false,"landing_page_url":"http://cds.cern.ch/record/2122942","pdf_url":null,"source":{"id":"https://openalex.org/S4306402194","display_name":"CERN Document Server (European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":""}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8500000238418579,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1786219425","https://openalex.org/W2062970180","https://openalex.org/W2127100446","https://openalex.org/W2175982826","https://openalex.org/W6638224878"],"related_works":["https://openalex.org/W2249924763","https://openalex.org/W626773769","https://openalex.org/W1037986594","https://openalex.org/W2794381118","https://openalex.org/W2079564482","https://openalex.org/W1516420621","https://openalex.org/W2078190393","https://openalex.org/W2145921319","https://openalex.org/W2033435528","https://openalex.org/W52768507"],"abstract_inverted_index":null,"counts_by_year":[{"year":2020,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-05-09T13:55:54.758798","created_date":"2025-10-10T00:00:00"}