{"id":"https://openalex.org/W4386380935","doi":"https://doi.org/10.18293/seke2023-180","title":"Contribution-based Test Case Reduction Strategy for Mutation-based Fault Localization (S)","display_name":"Contribution-based Test Case Reduction Strategy for Mutation-based Fault Localization (S)","publication_year":2023,"publication_date":"2023-07-01","ids":{"openalex":"https://openalex.org/W4386380935","doi":"https://doi.org/10.18293/seke2023-180"},"language":"en","primary_location":{"id":"doi:10.18293/seke2023-180","is_oa":true,"landing_page_url":"https://doi.org/10.18293/seke2023-180","pdf_url":"https://doi.org/10.18293/seke2023-180","source":{"id":"https://openalex.org/S4220650826","display_name":"Proceedings/Proceedings of the ... International Conference on Software Engineering and Knowledge Engineering","issn_l":"2325-9000","issn":["2325-9000","2325-9086"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Conferences on Software Engineering and Knowledge Engineering","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://doi.org/10.18293/seke2023-180","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100386422","display_name":"Haifeng Wang","orcid":"https://orcid.org/0000-0003-2482-375X"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Haifeng Wang","raw_affiliation_strings":["Center for Advanced Metering Infrastructure, National Institute of Metrology, China"],"affiliations":[{"raw_affiliation_string":"Center for Advanced Metering Infrastructure, National Institute of Metrology, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102551594","display_name":"Kun Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kun Yang","raw_affiliation_strings":["Center for Advanced Metering Infrastructure, National Institute of Metrology, China"],"affiliations":[{"raw_affiliation_string":"Center for Advanced Metering Infrastructure, National Institute of Metrology, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102551595","display_name":"Xiangnan Zhao","orcid":null},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiangnan Zhao","raw_affiliation_strings":["Center for Advanced Metering Infrastructure, National Institute of Metrology, China"],"affiliations":[{"raw_affiliation_string":"Center for Advanced Metering Infrastructure, National Institute of Metrology, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070110088","display_name":"Yuchen Cui","orcid":"https://orcid.org/0000-0001-7417-1222"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuchen Cui","raw_affiliation_strings":["Center for Advanced Metering Infrastructure, National Institute of Metrology, China"],"affiliations":[{"raw_affiliation_string":"Center for Advanced Metering Infrastructure, National Institute of Metrology, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004679699","display_name":"Weiwei Wang","orcid":"https://orcid.org/0000-0003-4860-1553"},"institutions":[{"id":"https://openalex.org/I75390827","display_name":"Beijing University of Chemical Technology","ror":"https://ror.org/00df5yc52","country_code":"CN","type":"education","lineage":["https://openalex.org/I75390827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weiwei Wang","raw_affiliation_strings":["College of Information Science and Technology, Beijing University of Chemical Technology, China"],"affiliations":[{"raw_affiliation_string":"College of Information Science and Technology, Beijing University of Chemical Technology, China","institution_ids":["https://openalex.org/I75390827"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100386422"],"corresponding_institution_ids":["https://openalex.org/I4210162136"],"apc_list":null,"apc_paid":null,"fwci":0.4311,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.68744614,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":"2023","issue":null,"first_page":"142","last_page":"145"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7559397220611572},{"id":"https://openalex.org/keywords/test-suite","display_name":"Test suite","score":0.7538880109786987},{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.7232781648635864},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.7117935419082642},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7060425877571106},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.6453716158866882},{"id":"https://openalex.org/keywords/mutation","display_name":"Mutation","score":0.5833215713500977},{"id":"https://openalex.org/keywords/cost-reduction","display_name":"Cost reduction","score":0.5450681447982788},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5110953450202942},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.508311927318573},{"id":"https://openalex.org/keywords/code-coverage","display_name":"Code coverage","score":0.47887176275253296},{"id":"https://openalex.org/keywords/software-bug","display_name":"Software bug","score":0.47335219383239746},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4702816307544708},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4422231614589691},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4332750737667084},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4272952079772949},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.16816627979278564},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15640360116958618},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11488842964172363},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.07441401481628418}],"concepts":[{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7559397220611572},{"id":"https://openalex.org/C151552104","wikidata":"https://www.wikidata.org/wiki/Q7705809","display_name":"Test suite","level":4,"score":0.7538880109786987},{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.7232781648635864},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.7117935419082642},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7060425877571106},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.6453716158866882},{"id":"https://openalex.org/C501734568","wikidata":"https://www.wikidata.org/wiki/Q42918","display_name":"Mutation","level":3,"score":0.5833215713500977},{"id":"https://openalex.org/C2778820799","wikidata":"https://www.wikidata.org/wiki/Q3454688","display_name":"Cost reduction","level":2,"score":0.5450681447982788},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5110953450202942},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.508311927318573},{"id":"https://openalex.org/C53942775","wikidata":"https://www.wikidata.org/wiki/Q1211721","display_name":"Code coverage","level":3,"score":0.47887176275253296},{"id":"https://openalex.org/C1009929","wikidata":"https://www.wikidata.org/wiki/Q179550","display_name":"Software bug","level":3,"score":0.47335219383239746},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4702816307544708},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4422231614589691},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4332750737667084},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4272952079772949},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.16816627979278564},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15640360116958618},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11488842964172363},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.07441401481628418},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C187736073","wikidata":"https://www.wikidata.org/wiki/Q2920921","display_name":"Management","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.18293/seke2023-180","is_oa":true,"landing_page_url":"https://doi.org/10.18293/seke2023-180","pdf_url":"https://doi.org/10.18293/seke2023-180","source":{"id":"https://openalex.org/S4220650826","display_name":"Proceedings/Proceedings of the ... International Conference on Software Engineering and Knowledge Engineering","issn_l":"2325-9000","issn":["2325-9000","2325-9086"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Conferences on Software Engineering and Knowledge Engineering","raw_type":"proceedings-article"}],"best_oa_location":{"id":"doi:10.18293/seke2023-180","is_oa":true,"landing_page_url":"https://doi.org/10.18293/seke2023-180","pdf_url":"https://doi.org/10.18293/seke2023-180","source":{"id":"https://openalex.org/S4220650826","display_name":"Proceedings/Proceedings of the ... International Conference on Software Engineering and Knowledge Engineering","issn_l":"2325-9000","issn":["2325-9000","2325-9086"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Conferences on Software Engineering and Knowledge Engineering","raw_type":"proceedings-article"},"sustainable_development_goals":[{"display_name":"Climate action","id":"https://metadata.un.org/sdg/13","score":0.550000011920929}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4386380935.pdf"},"referenced_works_count":12,"referenced_works":["https://openalex.org/W1950030762","https://openalex.org/W2013655083","https://openalex.org/W2156723666","https://openalex.org/W2620081107","https://openalex.org/W2744254414","https://openalex.org/W2751165549","https://openalex.org/W2900455437","https://openalex.org/W3026584292","https://openalex.org/W3036918158","https://openalex.org/W3081485108","https://openalex.org/W4226337124","https://openalex.org/W6739129715"],"related_works":["https://openalex.org/W149511501","https://openalex.org/W3022945690","https://openalex.org/W2401619241","https://openalex.org/W2417055705","https://openalex.org/W4313447549","https://openalex.org/W4295918990","https://openalex.org/W1263985882","https://openalex.org/W1888619389","https://openalex.org/W99582078","https://openalex.org/W176721908"],"abstract_inverted_index":{"Fault":[0,12],"localization":[1],"is":[2,15,69],"one":[3],"of":[4,38,42,51,60,66,87,94,146,157],"the":[5,26,36,40,46,58,64,85,91,101,106,110,116,126,134,147,158],"most":[6],"expensive":[7],"steps":[8],"during":[9],"software":[10,123],"debugging.Mutation-based":[11],"Localization":[13],"(MBFL)":[14],"a":[16,21,76,164],"promising":[17,55],"technique":[18],"but":[19],"with":[20],"high":[22],"computational":[23],"cost":[24,37,59,159],"since":[25],"large":[27],"mutation":[28,31],"execution":[29],"on":[30,120,160],"analysis.Previous":[32],"studies":[33],"mainly":[34],"reduce":[35,155],"decreasing":[39,63],"number":[41,65],"mutants":[43],"and":[44,98,149],"optimizing":[45],"process":[47],"execution,":[48],"such":[49],"kinds":[50],"strategies":[52,140],"have":[53],"shown":[54],"results.However,":[56],"reducing":[57],"MBFL":[61,136,169],"by":[62],"test":[67,96,102,112,137],"cases":[68,103],"also":[70],"effective.In":[71],"this":[72],"paper,":[73],"we":[74],"propose":[75],"Contribution-Based":[77],"Test":[78],"Case":[79],"Reduction":[80],"(CBTCR)":[81],"strategy":[82],"for":[83,114],"improving":[84],"efficiency":[86],"MBFL.CBTCR":[88],"first":[89],"measures":[90],"contribution":[92],"value":[93],"each":[95],"case":[97,138],"then":[99],"selects":[100],"according":[104],"to":[105,167],"value.Then":[107],"it":[108],"takes":[109],"reduced":[111],"suite":[113],"executing":[115],"mutants.We":[117],"evaluate":[118],"CBTCR":[119,132,152],"383":[121],"real":[122],"faults":[124],"from":[125],"Defects4J":[127],"benchmark.The":[128],"results":[129],"show":[130],"that":[131],"outperforms":[133],"other":[135],"reduction":[139],"(e.g.,":[141],"FTMES,":[142],"IETCR)":[143],"in":[144],"terms":[145],"Top-N":[148],"MAP":[150],"metrics.Also,":[151],"can":[153],"significantly":[154],"85.43%":[156],"average":[161],"while":[162],"maintaining":[163],"similar":[165],"accuracy":[166],"original":[168],"techniques.":[170]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2025-12-25T23:11:45.687758","created_date":"2025-10-10T00:00:00"}