{"id":"https://openalex.org/W4385495901","doi":"https://doi.org/10.17706/jsw.18.3.159-171","title":"Accelerated Defect Discovery and Reliability Improvement through Risk-Prioritized Testing for Web Applications","display_name":"Accelerated Defect Discovery and Reliability Improvement through Risk-Prioritized Testing for Web Applications","publication_year":2023,"publication_date":"2023-08-01","ids":{"openalex":"https://openalex.org/W4385495901","doi":"https://doi.org/10.17706/jsw.18.3.159-171"},"language":"en","primary_location":{"id":"doi:10.17706/jsw.18.3.159-171","is_oa":true,"landing_page_url":"http://dx.doi.org/10.17706/jsw.18.3.159-171","pdf_url":null,"source":{"id":"https://openalex.org/S114141714","display_name":"Journal of Software","issn_l":"1796-217X","issn":["1796-217X"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310318660","host_organization_name":"Academy Publisher","host_organization_lineage":["https://openalex.org/P4310318660"],"host_organization_lineage_names":["Academy Publisher"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Software","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"http://dx.doi.org/10.17706/jsw.18.3.159-171","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102121181","display_name":"Jeff Tian","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Jeff Tian","raw_affiliation_strings":[],"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5102121181"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.10054582,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"159","last_page":"171"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9901999831199646,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.9066404700279236},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6705235838890076},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5673774480819702}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.9066404700279236},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6705235838890076},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5673774480819702},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.17706/jsw.18.3.159-171","is_oa":true,"landing_page_url":"http://dx.doi.org/10.17706/jsw.18.3.159-171","pdf_url":null,"source":{"id":"https://openalex.org/S114141714","display_name":"Journal of Software","issn_l":"1796-217X","issn":["1796-217X"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310318660","host_organization_name":"Academy Publisher","host_organization_lineage":["https://openalex.org/P4310318660"],"host_organization_lineage_names":["Academy Publisher"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Software","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.17706/jsw.18.3.159-171","is_oa":true,"landing_page_url":"http://dx.doi.org/10.17706/jsw.18.3.159-171","pdf_url":null,"source":{"id":"https://openalex.org/S114141714","display_name":"Journal of Software","issn_l":"1796-217X","issn":["1796-217X"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310318660","host_organization_name":"Academy Publisher","host_organization_lineage":["https://openalex.org/P4310318660"],"host_organization_lineage_names":["Academy Publisher"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Software","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W1607054433","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2994319598","https://openalex.org/W2369695847","https://openalex.org/W2110842462","https://openalex.org/W4233757488"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3],"present":[4],"a":[5],"risk-prioritized":[6],"testing":[7],"strategy":[8,21],"aimed":[9],"at":[10],"accelerating":[11],"defect":[12,26,34],"discovery":[13],"and":[14,33],"reliability":[15],"improvement":[16],"for":[17],"Web":[18,31],"applications":[19],"This":[20],"is":[22],"based":[23],"on":[24],"analyzing":[25],"rate":[27],"or":[28],"density":[29],"using":[30],"logs":[32],"data":[35]},"counts_by_year":[],"updated_date":"2025-12-23T23:11:35.936235","created_date":"2025-10-10T00:00:00"}