{"id":"https://openalex.org/W2529517061","doi":"https://doi.org/10.1587/elex.13.20160806","title":"Design of local ESD clamp for cross-power-domain interface circuits","display_name":"Design of local ESD clamp for cross-power-domain interface circuits","publication_year":2016,"publication_date":"2016-01-01","ids":{"openalex":"https://openalex.org/W2529517061","doi":"https://doi.org/10.1587/elex.13.20160806","mag":"2529517061"},"language":"en","primary_location":{"id":"doi:10.1587/elex.13.20160806","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.13.20160806","pdf_url":"https://www.jstage.jst.go.jp/article/elex/13/20/13_13.20160806/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/13/20/13_13.20160806/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002476065","display_name":"Chun\u2010Yu Lin","orcid":"https://orcid.org/0000-0003-3375-520X"},"institutions":[{"id":"https://openalex.org/I134161618","display_name":"National Taiwan Normal University","ror":"https://ror.org/059dkdx38","country_code":"TW","type":"education","lineage":["https://openalex.org/I134161618"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chun-Yu Lin","raw_affiliation_strings":["Department of Electrical Engineering, National Taiwan Normal University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Taiwan Normal University","institution_ids":["https://openalex.org/I134161618"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113728429","display_name":"Yu-Kai Chiu","orcid":null},"institutions":[{"id":"https://openalex.org/I134161618","display_name":"National Taiwan Normal University","ror":"https://ror.org/059dkdx38","country_code":"TW","type":"education","lineage":["https://openalex.org/I134161618"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yu-Kai Chiu","raw_affiliation_strings":["Department of Electrical Engineering, National Taiwan Normal University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Taiwan Normal University","institution_ids":["https://openalex.org/I134161618"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085353119","display_name":"Shuan-Yu Yueh","orcid":null},"institutions":[{"id":"https://openalex.org/I134161618","display_name":"National Taiwan Normal University","ror":"https://ror.org/059dkdx38","country_code":"TW","type":"education","lineage":["https://openalex.org/I134161618"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Shuan-Yu Yueh","raw_affiliation_strings":["Department of Electrical Engineering, National Taiwan Normal University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Taiwan Normal University","institution_ids":["https://openalex.org/I134161618"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I134161618"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.10553941,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"13","issue":"20","first_page":"20160806","last_page":"20160806"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrostatic-discharge","display_name":"Electrostatic discharge","score":0.7857638597488403},{"id":"https://openalex.org/keywords/pmos-logic","display_name":"PMOS logic","score":0.7172918319702148},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6226892471313477},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5670077800750732},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.5205258131027222},{"id":"https://openalex.org/keywords/nmos-logic","display_name":"NMOS logic","score":0.4915851056575775},{"id":"https://openalex.org/keywords/interface","display_name":"Interface (matter)","score":0.4726259708404541},{"id":"https://openalex.org/keywords/clamp","display_name":"Clamp","score":0.4599570035934448},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.45750924944877625},{"id":"https://openalex.org/keywords/power-domains","display_name":"Power domains","score":0.44955286383628845},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4330573081970215},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3959532082080841},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3747404217720032},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.18538746237754822},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.0628507137298584}],"concepts":[{"id":"https://openalex.org/C205483674","wikidata":"https://www.wikidata.org/wiki/Q3574961","display_name":"Electrostatic discharge","level":3,"score":0.7857638597488403},{"id":"https://openalex.org/C27050352","wikidata":"https://www.wikidata.org/wiki/Q173605","display_name":"PMOS logic","level":4,"score":0.7172918319702148},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6226892471313477},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5670077800750732},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.5205258131027222},{"id":"https://openalex.org/C197162436","wikidata":"https://www.wikidata.org/wiki/Q83908","display_name":"NMOS logic","level":4,"score":0.4915851056575775},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.4726259708404541},{"id":"https://openalex.org/C2776161997","wikidata":"https://www.wikidata.org/wiki/Q846600","display_name":"Clamp","level":3,"score":0.4599570035934448},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.45750924944877625},{"id":"https://openalex.org/C16021271","wikidata":"https://www.wikidata.org/wiki/Q17152552","display_name":"Power domains","level":3,"score":0.44955286383628845},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4330573081970215},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3959532082080841},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3747404217720032},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.18538746237754822},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0628507137298584},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C55352822","wikidata":"https://www.wikidata.org/wiki/Q5558978","display_name":"Gibbs isotherm","level":3,"score":0.0},{"id":"https://openalex.org/C84111939","wikidata":"https://www.wikidata.org/wiki/Q5125465","display_name":"Clamping","level":2,"score":0.0},{"id":"https://openalex.org/C58226133","wikidata":"https://www.wikidata.org/wiki/Q1324199","display_name":"Pulmonary surfactant","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.13.20160806","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.13.20160806","pdf_url":"https://www.jstage.jst.go.jp/article/elex/13/20/13_13.20160806/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.13.20160806","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.13.20160806","pdf_url":"https://www.jstage.jst.go.jp/article/elex/13/20/13_13.20160806/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.7799999713897705,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G1052468712","display_name":null,"funder_award_id":"MOST 105-","funder_id":"https://openalex.org/F4320322795","funder_display_name":"Ministry of Science and Technology, Taiwan"},{"id":"https://openalex.org/G3468423577","display_name":null,"funder_award_id":"MOST 105","funder_id":"https://openalex.org/F4320322795","funder_display_name":"Ministry of Science and Technology, Taiwan"},{"id":"https://openalex.org/G4040405074","display_name":null,"funder_award_id":"MOST 105-2622-E-003-001-CC2","funder_id":"https://openalex.org/F4320322795","funder_display_name":"Ministry of Science and Technology, Taiwan"}],"funders":[{"id":"https://openalex.org/F4320322795","display_name":"Ministry of Science and Technology, Taiwan","ror":"https://ror.org/02kv4zf79"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2529517061.pdf","grobid_xml":"https://content.openalex.org/works/W2529517061.grobid-xml"},"referenced_works_count":11,"referenced_works":["https://openalex.org/W1484234395","https://openalex.org/W1565374689","https://openalex.org/W1959702351","https://openalex.org/W2072561603","https://openalex.org/W2109102292","https://openalex.org/W2116299747","https://openalex.org/W2120399117","https://openalex.org/W2158240994","https://openalex.org/W2159666978","https://openalex.org/W2335548959","https://openalex.org/W2536622667"],"related_works":["https://openalex.org/W4386261925","https://openalex.org/W2082944690","https://openalex.org/W2263373136","https://openalex.org/W2104885411","https://openalex.org/W2023334077","https://openalex.org/W2005494397","https://openalex.org/W1811213809","https://openalex.org/W1914349328","https://openalex.org/W2160067645","https://openalex.org/W2339836056"],"abstract_inverted_index":{"To":[0],"effectively":[1],"protect":[2],"the":[3,40,58,62,69,72],"cross-power-domain":[4,83],"interface":[5,63,84],"circuits":[6,24,64],"from":[7],"electrostatic":[8],"discharge":[9],"(ESD)":[10],"damages,":[11],"a":[12,79],"PMOS-based":[13],"local":[14,74],"ESD":[15,66,75],"clamp":[16,76],"was":[17],"proposed":[18,28,37,73],"in":[19,33],"this":[20],"work.":[21],"The":[22,36],"test":[23],"of":[25],"prior":[26],"and":[27,47],"designs":[29],"have":[30],"been":[31],"implemented":[32],"silicon":[34],"chip.":[35],"design":[38],"has":[39],"small":[41],"chip":[42],"area,":[43],"low":[44,48],"leakage":[45],"current,":[46],"peak":[49],"transient":[50],"voltage;":[51],"therefore,":[52],"it":[53],"can":[54,77],"help":[55],"to":[56],"reduce":[57],"overstress":[59],"voltages":[60],"across":[61],"under":[65],"tests.":[67],"With":[68],"better":[70,80],"performances,":[71],"be":[78],"solution":[81],"for":[82],"circuits.":[85]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}