{"id":"https://openalex.org/W4225252527","doi":"https://doi.org/10.1587/transinf.2021edp7216","title":"Evaluation and Test of Production Defects in Hardened Latches","display_name":"Evaluation and Test of Production Defects in Hardened Latches","publication_year":2022,"publication_date":"2022-04-30","ids":{"openalex":"https://openalex.org/W4225252527","doi":"https://doi.org/10.1587/transinf.2021edp7216"},"language":"en","primary_location":{"id":"doi:10.1587/transinf.2021edp7216","is_oa":true,"landing_page_url":"https://doi.org/10.1587/transinf.2021edp7216","pdf_url":"https://www.jstage.jst.go.jp/article/transinf/E105.D/5/E105.D_2021EDP7216/_pdf","source":{"id":"https://openalex.org/S2486202937","display_name":"IEICE Transactions on Information and Systems","issn_l":"0916-8532","issn":["0916-8532","1745-1361"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Transactions on Information and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/transinf/E105.D/5/E105.D_2021EDP7216/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090188522","display_name":"Ruijun Ma","orcid":"https://orcid.org/0009-0006-8283-5088"},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ruijun MA","raw_affiliation_strings":["Kyushu Institute of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088238834","display_name":"Stefan Holst","orcid":null},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Stefan HOLST","raw_affiliation_strings":["Kyushu Institute of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084697545","display_name":"Xiaoqing Wen","orcid":"https://orcid.org/0000-0001-8305-604X"},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Xiaoqing WEN","raw_affiliation_strings":["Kyushu Institute of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072439444","display_name":"Aibin Yan","orcid":"https://orcid.org/0000-0003-0024-987X"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Aibin YAN","raw_affiliation_strings":["Anhui University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Anhui University","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101851817","display_name":"Hui Xu","orcid":"https://orcid.org/0000-0003-4629-8335"},"institutions":[{"id":"https://openalex.org/I184681353","display_name":"Anhui University of Science and Technology","ror":"https://ror.org/00q9atg80","country_code":"CN","type":"education","lineage":["https://openalex.org/I184681353"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hui XU","raw_affiliation_strings":["Anhui University of Science and Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Anhui University of Science and Technology","institution_ids":["https://openalex.org/I184681353"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.6184,"has_fulltext":true,"cited_by_count":8,"citation_normalized_percentile":{"value":0.64250357,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"E105.D","issue":"5","first_page":"996","last_page":"1009"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bridging","display_name":"Bridging (networking)","score":0.8168796300888062},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6695845127105713},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5817041397094727},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5296542048454285},{"id":"https://openalex.org/keywords/iddq-testing","display_name":"Iddq testing","score":0.47341567277908325},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4623938798904419},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.4539165794849396},{"id":"https://openalex.org/keywords/production","display_name":"Production (economics)","score":0.44949623942375183},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.4300597012042999},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.4151109457015991},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.36444705724716187},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.30965983867645264},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13268083333969116},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.09233051538467407}],"concepts":[{"id":"https://openalex.org/C174348530","wikidata":"https://www.wikidata.org/wiki/Q188635","display_name":"Bridging (networking)","level":2,"score":0.8168796300888062},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6695845127105713},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5817041397094727},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5296542048454285},{"id":"https://openalex.org/C206678392","wikidata":"https://www.wikidata.org/wiki/Q5987815","display_name":"Iddq testing","level":3,"score":0.47341567277908325},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4623938798904419},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.4539165794849396},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.44949623942375183},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.4300597012042999},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.4151109457015991},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.36444705724716187},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.30965983867645264},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13268083333969116},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.09233051538467407},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/transinf.2021edp7216","is_oa":true,"landing_page_url":"https://doi.org/10.1587/transinf.2021edp7216","pdf_url":"https://www.jstage.jst.go.jp/article/transinf/E105.D/5/E105.D_2021EDP7216/_pdf","source":{"id":"https://openalex.org/S2486202937","display_name":"IEICE Transactions on Information and Systems","issn_l":"0916-8532","issn":["0916-8532","1745-1361"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Transactions on Information and Systems","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/transinf.2021edp7216","is_oa":true,"landing_page_url":"https://doi.org/10.1587/transinf.2021edp7216","pdf_url":"https://www.jstage.jst.go.jp/article/transinf/E105.D/5/E105.D_2021EDP7216/_pdf","source":{"id":"https://openalex.org/S2486202937","display_name":"IEICE Transactions on Information and Systems","issn_l":"0916-8532","issn":["0916-8532","1745-1361"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Transactions on Information and Systems","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4949740588","display_name":null,"funder_award_id":"62111540164","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5489576958","display_name":"Research on Defect-Aware Soft Error Mitigation for Highly Reliable LSIs","funder_award_id":"23K21653","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4225252527.pdf","grobid_xml":"https://content.openalex.org/works/W4225252527.grobid-xml"},"referenced_works_count":33,"referenced_works":["https://openalex.org/W1975756435","https://openalex.org/W1980433502","https://openalex.org/W1998591589","https://openalex.org/W2009889165","https://openalex.org/W2030112294","https://openalex.org/W2034813406","https://openalex.org/W2036953450","https://openalex.org/W2050431855","https://openalex.org/W2072055405","https://openalex.org/W2089621058","https://openalex.org/W2093095207","https://openalex.org/W2105981249","https://openalex.org/W2114580895","https://openalex.org/W2120956034","https://openalex.org/W2122335215","https://openalex.org/W2131924443","https://openalex.org/W2134239437","https://openalex.org/W2138223068","https://openalex.org/W2145050244","https://openalex.org/W2148327955","https://openalex.org/W2152652532","https://openalex.org/W2162465831","https://openalex.org/W2168525368","https://openalex.org/W2171896075","https://openalex.org/W2180580882","https://openalex.org/W2213956287","https://openalex.org/W2559872944","https://openalex.org/W2560368994","https://openalex.org/W2809721523","https://openalex.org/W2968433410","https://openalex.org/W3000209635","https://openalex.org/W3014325818","https://openalex.org/W3081672332"],"related_works":["https://openalex.org/W2010752054","https://openalex.org/W2174547182","https://openalex.org/W2543657828","https://openalex.org/W2575349682","https://openalex.org/W4252310117","https://openalex.org/W2059274721","https://openalex.org/W3147443654","https://openalex.org/W2102383741","https://openalex.org/W2134896942","https://openalex.org/W4231292603"],"abstract_inverted_index":{"As":[0,144],"modern":[1],"CMOS":[2],"circuits":[3],"fabricated":[4],"with":[5,53,76],"advanced":[6],"technology":[7],"nodes":[8],"are":[9,49],"becoming":[10],"more":[11,13],"and":[12,57,118,136,156],"susceptible":[14],"to":[15,51,113],"soft-errors,":[16],"many":[17],"hardened":[18,38,67,96,115,153],"latches":[19,39],"have":[20],"been":[21],"proposed":[22,133],"for":[23,29,88,173],"reliable":[24],"LSI":[25,157,171],"designs.":[26],"We":[27],"reveal":[28],"the":[30,64,90,108,129,132,137,140,145,150,159,167],"first":[31,146],"time":[32],"that":[33,106],"production":[34,47,60,93],"defects":[35,48,61,94],"in":[36],"such":[37],"can":[40,62],"cause":[41],"two":[42,74],"serious":[43],"problems:":[44],"(1)":[45,80],"these":[46,59,73],"difficult":[50],"detect":[52],"conventional":[54],"scan":[55,122,142],"test":[56,123],"(2)":[58,98],"reduce":[63],"reliability":[65,169],"of":[66,92,131,139,161,170],"latches.":[68],"This":[69],"paper":[70,163],"systematically":[71],"addresses":[72],"problems":[75],"three":[77],"major":[78],"contributions:":[79],"Post-Test":[81],"Vulnerability":[82],"Factor":[83],"(PTVF),":[84],"a":[85,99],"first-of-its-kind":[86],"metric":[87,135],"quantifying":[89],"impact":[91],"on":[95],"latches,":[97],"novel":[100],"Scan-Test-Aware":[101],"Hardened":[102],"Latch":[103],"(STAHL)":[104],"design":[105,155],"has":[107],"highest":[109],"defect":[110],"coverage":[111],"compared":[112],"state-of-the-art":[114],"latch":[116,154],"designs,":[117],"(3)":[119],"an":[120],"STAHL-based":[121,141],"procedure.":[124],"Comprehensive":[125],"simulation":[126],"results":[127],"demonstrate":[128],"accuracy":[130],"PTVF":[134],"effectiveness":[138],"test.":[143],"comprehensive":[147],"study":[148],"bridging":[149],"gap":[151],"between":[152],"testing,":[158],"findings":[160],"this":[162],"will":[164],"significantly":[165],"improve":[166],"soft-error-related":[168],"designs":[172],"safety-critical":[174],"applications.":[175]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}