{"id":"https://openalex.org/W3023598129","doi":"https://doi.org/10.1587/transinf.2019edp7205","title":"Universal Testing for Linear Feed-Forward/Feedback Shift Registers","display_name":"Universal Testing for Linear Feed-Forward/Feedback Shift Registers","publication_year":2020,"publication_date":"2020-04-30","ids":{"openalex":"https://openalex.org/W3023598129","doi":"https://doi.org/10.1587/transinf.2019edp7205","mag":"3023598129"},"language":"en","primary_location":{"id":"doi:10.1587/transinf.2019edp7205","is_oa":true,"landing_page_url":"https://doi.org/10.1587/transinf.2019edp7205","pdf_url":"https://www.jstage.jst.go.jp/article/transinf/E103.D/5/E103.D_2019EDP7205/_pdf","source":{"id":"https://openalex.org/S2486202937","display_name":"IEICE Transactions on Information and Systems","issn_l":"0916-8532","issn":["0916-8532","1745-1361"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Transactions on Information and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/transinf/E103.D/5/E103.D_2019EDP7205/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111955990","display_name":"Hideo Fujiwara","orcid":null},"institutions":[{"id":"https://openalex.org/I11381156","display_name":"Osaka Gakuin University","ror":"https://ror.org/04a8t1e98","country_code":"JP","type":"education","lineage":["https://openalex.org/I11381156"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Hideo FUJIWARA","raw_affiliation_strings":["Osaka Gakuin University"],"affiliations":[{"raw_affiliation_string":"Osaka Gakuin University","institution_ids":["https://openalex.org/I11381156"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044432485","display_name":"Katsuya Fujiwara","orcid":"https://orcid.org/0000-0002-5001-5871"},"institutions":[{"id":"https://openalex.org/I203765153","display_name":"Akita University","ror":"https://ror.org/03hv1ad10","country_code":"JP","type":"education","lineage":["https://openalex.org/I203765153"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Katsuya FUJIWARA","raw_affiliation_strings":["Akita University"],"affiliations":[{"raw_affiliation_string":"Akita University","institution_ids":["https://openalex.org/I203765153"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113865938","display_name":"Toshinori Hosokawa","orcid":null},"institutions":[{"id":"https://openalex.org/I52706244","display_name":"College of Industrial Technology","ror":"https://ror.org/054a9s036","country_code":"JP","type":"education","lineage":["https://openalex.org/I52706244"]},{"id":"https://openalex.org/I104946051","display_name":"Nihon University","ror":"https://ror.org/05jk51a88","country_code":"JP","type":"education","lineage":["https://openalex.org/I104946051"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshinori HOSOKAWA","raw_affiliation_strings":["College of Industrial Technology, Nihon University"],"affiliations":[{"raw_affiliation_string":"College of Industrial Technology, Nihon University","institution_ids":["https://openalex.org/I52706244","https://openalex.org/I104946051"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5111955990"],"corresponding_institution_ids":["https://openalex.org/I11381156"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.05516841,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":"E103.D","issue":"5","first_page":"1023","last_page":"1030"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9925000071525574,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/shift-register","display_name":"Shift register","score":0.9198861122131348},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7372196912765503},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.6606149077415466},{"id":"https://openalex.org/keywords/linear-feedback-shift-register","display_name":"Linear feedback shift register","score":0.6342552900314331},{"id":"https://openalex.org/keywords/feed-forward","display_name":"Feed forward","score":0.5701399445533752},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5631402730941772},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5592799186706543},{"id":"https://openalex.org/keywords/sequence","display_name":"Sequence (biology)","score":0.5487120151519775},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.41083475947380066},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.3351011276245117},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.33290550112724304},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.21098974347114563},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.15698066353797913},{"id":"https://openalex.org/keywords/control-engineering","display_name":"Control engineering","score":0.08196189999580383},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.07705140113830566}],"concepts":[{"id":"https://openalex.org/C49654631","wikidata":"https://www.wikidata.org/wiki/Q746165","display_name":"Shift register","level":3,"score":0.9198861122131348},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7372196912765503},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.6606149077415466},{"id":"https://openalex.org/C159862308","wikidata":"https://www.wikidata.org/wiki/Q681101","display_name":"Linear feedback shift register","level":4,"score":0.6342552900314331},{"id":"https://openalex.org/C38858127","wikidata":"https://www.wikidata.org/wiki/Q5441228","display_name":"Feed forward","level":2,"score":0.5701399445533752},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5631402730941772},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5592799186706543},{"id":"https://openalex.org/C2778112365","wikidata":"https://www.wikidata.org/wiki/Q3511065","display_name":"Sequence (biology)","level":2,"score":0.5487120151519775},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.41083475947380066},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.3351011276245117},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.33290550112724304},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.21098974347114563},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.15698066353797913},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.08196189999580383},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.07705140113830566},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/transinf.2019edp7205","is_oa":true,"landing_page_url":"https://doi.org/10.1587/transinf.2019edp7205","pdf_url":"https://www.jstage.jst.go.jp/article/transinf/E103.D/5/E103.D_2019EDP7205/_pdf","source":{"id":"https://openalex.org/S2486202937","display_name":"IEICE Transactions on Information and Systems","issn_l":"0916-8532","issn":["0916-8532","1745-1361"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Transactions on Information and Systems","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/transinf.2019edp7205","is_oa":true,"landing_page_url":"https://doi.org/10.1587/transinf.2019edp7205","pdf_url":"https://www.jstage.jst.go.jp/article/transinf/E103.D/5/E103.D_2019EDP7205/_pdf","source":{"id":"https://openalex.org/S2486202937","display_name":"IEICE Transactions on Information and Systems","issn_l":"0916-8532","issn":["0916-8532","1745-1361"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Transactions on Information and Systems","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3023598129.pdf","grobid_xml":"https://content.openalex.org/works/W3023598129.grobid-xml"},"referenced_works_count":7,"referenced_works":["https://openalex.org/W1989164897","https://openalex.org/W2044007453","https://openalex.org/W2056583394","https://openalex.org/W2103468612","https://openalex.org/W2141866079","https://openalex.org/W2156936759","https://openalex.org/W4302084786"],"related_works":["https://openalex.org/W1991602179","https://openalex.org/W2623444083","https://openalex.org/W75082849","https://openalex.org/W3157572643","https://openalex.org/W2391979783","https://openalex.org/W2375911758","https://openalex.org/W2154529098","https://openalex.org/W2119351822","https://openalex.org/W2340052325","https://openalex.org/W1498635933"],"abstract_inverted_index":{"Linear":[0],"feed-forward/feedback":[1,33,40,83,106,138],"shift":[2,34,41,84,107,139],"registers":[3,35,108],"are":[4],"used":[5],"as":[6],"an":[7,57],"effective":[8],"tool":[9],"of":[10,30,98,104,119,129,136],"testing":[11,31],"circuits":[12],"in":[13],"various":[14],"fields":[15],"including":[16],"built-in":[17],"self-test":[18],"and":[19],"secure":[20],"scan":[21],"design.":[22],"In":[23],"this":[24],"paper,":[25],"we":[26],"consider":[27],"the":[28,102,117,126,134],"issue":[29],"linear":[32,39,82,105,137],"themselves.":[36],"To":[37],"test":[38,49,66,73,94,112,120,131],"registers,":[42],"it":[43],"is":[44,114,122],"necessary":[45],"to":[46],"generate":[47,71],"a":[48,62,72,92],"sequence":[50,74,95],"for":[51,80,101,133],"each":[52],"register.":[53],"We":[54,86,124],"first":[55],"present":[56],"experimental":[58],"result":[59],"such":[60],"that":[61,89,110],"commercial":[63],"ATPG":[64],"(automatic":[65],"pattern":[67],"generator)":[68],"cannot":[69],"always":[70],"with":[75,96],"high":[76],"fault":[77,99],"coverage":[78,100],"even":[79],"64-stage":[81],"registers.":[85,140],"then":[87],"show":[88],"there":[90],"exists":[91],"universal":[93,130],"100%":[97],"class":[103,135],"so":[109],"no":[111],"generation":[113,121],"required,":[115],"i.e.,":[116],"cost":[118],"zero.":[123],"prove":[125],"existence":[127],"theorem":[128],"sequences":[132]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}