{"id":"https://openalex.org/W2523970028","doi":"https://doi.org/10.1587/transinf.2015edp7408","title":"Reliability-Enhanced ECC-Based Memory Architecture Using In-Field Self-Repair","display_name":"Reliability-Enhanced ECC-Based Memory Architecture Using In-Field Self-Repair","publication_year":2016,"publication_date":"2016-01-01","ids":{"openalex":"https://openalex.org/W2523970028","doi":"https://doi.org/10.1587/transinf.2015edp7408","mag":"2523970028"},"language":"en","primary_location":{"id":"doi:10.1587/transinf.2015edp7408","is_oa":true,"landing_page_url":"https://doi.org/10.1587/transinf.2015edp7408","pdf_url":"https://www.jstage.jst.go.jp/article/transinf/E99.D/10/E99.D_2015EDP7408/_pdf","source":{"id":"https://openalex.org/S2486202937","display_name":"IEICE Transactions on Information and Systems","issn_l":"0916-8532","issn":["0916-8532","1745-1361"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Transactions on Information and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/transinf/E99.D/10/E99.D_2015EDP7408/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030175469","display_name":"Gian Mayuga","orcid":"https://orcid.org/0000-0002-3951-6480"},"institutions":[{"id":"https://openalex.org/I75917431","display_name":"Nara Institute of Science and Technology","ror":"https://ror.org/05bhada84","country_code":"JP","type":"education","lineage":["https://openalex.org/I75917431"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Gian MAYUGA","raw_affiliation_strings":["Nara Institute of Science and Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nara Institute of Science and Technology","institution_ids":["https://openalex.org/I75917431"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113798957","display_name":"Yuta Yamato","orcid":null},"institutions":[{"id":"https://openalex.org/I75917431","display_name":"Nara Institute of Science and Technology","ror":"https://ror.org/05bhada84","country_code":"JP","type":"education","lineage":["https://openalex.org/I75917431"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yuta YAMATO","raw_affiliation_strings":["Nara Institute of Science and Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nara Institute of Science and Technology","institution_ids":["https://openalex.org/I75917431"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078779439","display_name":"Tomokazu Yoneda","orcid":null},"institutions":[{"id":"https://openalex.org/I75917431","display_name":"Nara Institute of Science and Technology","ror":"https://ror.org/05bhada84","country_code":"JP","type":"education","lineage":["https://openalex.org/I75917431"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tomokazu YONEDA","raw_affiliation_strings":["Nara Institute of Science and Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nara Institute of Science and Technology","institution_ids":["https://openalex.org/I75917431"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101964875","display_name":"Yasuo Sat\u00f4","orcid":"https://orcid.org/0000-0002-7556-5159"},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yasuo SATO","raw_affiliation_strings":["Kyushu Institute of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070572924","display_name":"Michiko Inoue","orcid":"https://orcid.org/0000-0002-9837-5147"},"institutions":[{"id":"https://openalex.org/I75917431","display_name":"Nara Institute of Science and Technology","ror":"https://ror.org/05bhada84","country_code":"JP","type":"education","lineage":["https://openalex.org/I75917431"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Michiko INOUE","raw_affiliation_strings":["Nara Institute of Science and Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nara Institute of Science and Technology","institution_ids":["https://openalex.org/I75917431"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1782,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.57189751,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"E99.D","issue":"10","first_page":"2591","last_page":"2599"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8227473497390747},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7238631844520569},{"id":"https://openalex.org/keywords/control-reconfiguration","display_name":"Control reconfiguration","score":0.6771569848060608},{"id":"https://openalex.org/keywords/spare-part","display_name":"Spare part","score":0.667479395866394},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6281975507736206},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5980396270751953},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.46736404299736023},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.43948376178741455},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4195299744606018},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.32289308309555054},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.1617644727230072}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8227473497390747},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7238631844520569},{"id":"https://openalex.org/C119701452","wikidata":"https://www.wikidata.org/wiki/Q5165881","display_name":"Control reconfiguration","level":2,"score":0.6771569848060608},{"id":"https://openalex.org/C194648553","wikidata":"https://www.wikidata.org/wiki/Q1364774","display_name":"Spare part","level":2,"score":0.667479395866394},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6281975507736206},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5980396270751953},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.46736404299736023},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.43948376178741455},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4195299744606018},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.32289308309555054},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.1617644727230072},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C162853370","wikidata":"https://www.wikidata.org/wiki/Q39809","display_name":"Marketing","level":1,"score":0.0},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/transinf.2015edp7408","is_oa":true,"landing_page_url":"https://doi.org/10.1587/transinf.2015edp7408","pdf_url":"https://www.jstage.jst.go.jp/article/transinf/E99.D/10/E99.D_2015EDP7408/_pdf","source":{"id":"https://openalex.org/S2486202937","display_name":"IEICE Transactions on Information and Systems","issn_l":"0916-8532","issn":["0916-8532","1745-1361"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Transactions on Information and Systems","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/transinf.2015edp7408","is_oa":true,"landing_page_url":"https://doi.org/10.1587/transinf.2015edp7408","pdf_url":"https://www.jstage.jst.go.jp/article/transinf/E99.D/10/E99.D_2015EDP7408/_pdf","source":{"id":"https://openalex.org/S2486202937","display_name":"IEICE Transactions on Information and Systems","issn_l":"0916-8532","issn":["0916-8532","1745-1361"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Transactions on Information and Systems","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.5299999713897705,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2523970028.pdf","grobid_xml":"https://content.openalex.org/works/W2523970028.grobid-xml"},"referenced_works_count":12,"referenced_works":["https://openalex.org/W646173351","https://openalex.org/W1515138646","https://openalex.org/W1582612119","https://openalex.org/W1909747176","https://openalex.org/W2061180973","https://openalex.org/W2086936129","https://openalex.org/W2119482888","https://openalex.org/W2122249806","https://openalex.org/W2127178251","https://openalex.org/W2128767249","https://openalex.org/W2139254411","https://openalex.org/W2171372273"],"related_works":["https://openalex.org/W2376859990","https://openalex.org/W2912704652","https://openalex.org/W2381161177","https://openalex.org/W2319226115","https://openalex.org/W830772239","https://openalex.org/W2970750595","https://openalex.org/W2366601680","https://openalex.org/W2392193501","https://openalex.org/W2738649048","https://openalex.org/W2277714805"],"abstract_inverted_index":{"Embedded":[0],"memory":[1,45,115,126],"is":[2,9,149],"extensively":[3],"being":[4],"used":[5,65,74,130],"in":[6,12],"SoCs,":[7],"and":[8,14,49,57,69,108,144],"rapidly":[10],"growing":[11],"size":[13,44],"density.":[15],"It":[16,117],"contributes":[17],"to":[18,20,35,66,76,91],"SoCs":[19],"have":[21],"greater":[22],"features,":[23],"but":[24],"at":[25],"the":[26,31,92,145],"expense":[27],"of":[28,38],"taking":[29],"up":[30],"most":[32],"area.":[33],"Due":[34],"continuous":[36],"scaling":[37],"nanoscale":[39],"device":[40],"technology,":[41],"large":[42],"area":[43,146],"introduces":[46],"aging-induced":[47],"faults":[48],"soft":[50],"errors,":[51],"which":[52],"affects":[53],"reliability.":[54],"In-field":[55],"test":[56],"repair,":[58],"as":[59,61],"well":[60],"ECC,":[62],"can":[63],"be":[64],"maintain":[67],"reliability,":[68,143],"recently,":[70],"these":[71],"methods":[72],"are":[73,84,89,128],"together":[75],"form":[77],"a":[78,99],"combined":[79],"approach,":[80],"wherein":[81],"uncorrectable":[82,106],"words":[83,88,127,133],"repaired,":[85],"while":[86],"correctable":[87,110],"left":[90],"ECC.":[93],"In":[94],"this":[95],"paper,":[96],"we":[97],"propose":[98],"novel":[100],"in-field":[101],"repair":[102],"strategy":[103,141],"that":[104,123,139],"repairs":[105],"words,":[107,111],"possibly":[109],"for":[112],"an":[113,119],"ECC-based":[114],"architecture.":[116],"executes":[118],"adaptive":[120],"reconfiguration":[121],"method":[122],"ensures":[124],"'fresh'":[125],"always":[129],"until":[131],"spare":[132],"run":[134],"out.":[135],"Experimental":[136],"results":[137],"demonstrate":[138],"our":[140],"enhances":[142],"overhead":[147],"contribution":[148],"small.":[150]},"counts_by_year":[{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}