{"id":"https://openalex.org/W2049135494","doi":"https://doi.org/10.1587/transinf.2014edp7039","title":"On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST","display_name":"On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST","publication_year":2014,"publication_date":"2014-01-01","ids":{"openalex":"https://openalex.org/W2049135494","doi":"https://doi.org/10.1587/transinf.2014edp7039","mag":"2049135494"},"language":"en","primary_location":{"id":"doi:10.1587/transinf.2014edp7039","is_oa":true,"landing_page_url":"https://doi.org/10.1587/transinf.2014edp7039","pdf_url":"https://www.jstage.jst.go.jp/article/transinf/E97.D/10/E97.D_2014EDP7039/_pdf","source":{"id":"https://openalex.org/S2486202937","display_name":"IEICE Transactions on Information and Systems","issn_l":"0916-8532","issn":["0916-8532","1745-1361"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Transactions on Information and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/transinf/E97.D/10/E97.D_2014EDP7039/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029947988","display_name":"Akihiro TOMITA","orcid":null},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Akihiro TOMITA","raw_affiliation_strings":["Kyushu Institute of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084697545","display_name":"Xiaoqing Wen","orcid":"https://orcid.org/0000-0001-8305-604X"},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Xiaoqing WEN","raw_affiliation_strings":["Kyushu Institute of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101964875","display_name":"Yasuo Sat\u00f4","orcid":"https://orcid.org/0000-0002-7556-5159"},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yasuo SATO","raw_affiliation_strings":["Kyushu Institute of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109872072","display_name":"Seiji Kajihara","orcid":null},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Seiji KAJIHARA","raw_affiliation_strings":["Kyushu Institute of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079877073","display_name":"Kohei Miyase","orcid":null},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kohei MIYASE","raw_affiliation_strings":["Kyushu Institute of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088238834","display_name":"Stefan Holst","orcid":null},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Stefan HOLST","raw_affiliation_strings":["Kyushu Institute of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005116115","display_name":"Patrick Girard","orcid":"https://orcid.org/0000-0003-0722-8772"},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Patrick GIRARD","raw_affiliation_strings":["LIRMM"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LIRMM","institution_ids":["https://openalex.org/I4210101743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113697198","display_name":"Mohammad Tehranipoor","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Mohammad TEHRANIPOOR","raw_affiliation_strings":["University of Connecticut"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Connecticut","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109249989","display_name":"Laung\u2010Terng Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210107885","display_name":"Syntek Technologies (United States)","ror":"https://ror.org/01rpq5x59","country_code":"US","type":"company","lineage":["https://openalex.org/I4210107885"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Laung-Terng WANG","raw_affiliation_strings":["SynTest Technologies, Inc"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"SynTest Technologies, Inc","institution_ids":["https://openalex.org/I4210107885"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":9,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.11397153,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"E97.D","issue":"10","first_page":"2706","last_page":"2718"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7706377506256104},{"id":"https://openalex.org/keywords/masking","display_name":"Masking (illustration)","score":0.690672755241394},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.6511924266815186},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5884252190589905},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5548445582389832},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.48982664942741394},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.450632780790329},{"id":"https://openalex.org/keywords/block","display_name":"Block (permutation group theory)","score":0.42235806584358215},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.41181594133377075},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.41162586212158203},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3725683093070984},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.13200023770332336},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.13085365295410156},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11380472779273987}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7706377506256104},{"id":"https://openalex.org/C2777402240","wikidata":"https://www.wikidata.org/wiki/Q6783436","display_name":"Masking (illustration)","level":2,"score":0.690672755241394},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.6511924266815186},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5884252190589905},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5548445582389832},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.48982664942741394},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.450632780790329},{"id":"https://openalex.org/C2777210771","wikidata":"https://www.wikidata.org/wiki/Q4927124","display_name":"Block (permutation group theory)","level":2,"score":0.42235806584358215},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.41181594133377075},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.41162586212158203},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3725683093070984},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.13200023770332336},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.13085365295410156},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11380472779273987},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/transinf.2014edp7039","is_oa":true,"landing_page_url":"https://doi.org/10.1587/transinf.2014edp7039","pdf_url":"https://www.jstage.jst.go.jp/article/transinf/E97.D/10/E97.D_2014EDP7039/_pdf","source":{"id":"https://openalex.org/S2486202937","display_name":"IEICE Transactions on Information and Systems","issn_l":"0916-8532","issn":["0916-8532","1745-1361"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Transactions on Information and Systems","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/transinf.2014edp7039","is_oa":true,"landing_page_url":"https://doi.org/10.1587/transinf.2014edp7039","pdf_url":"https://www.jstage.jst.go.jp/article/transinf/E97.D/10/E97.D_2014EDP7039/_pdf","source":{"id":"https://openalex.org/S2486202937","display_name":"IEICE Transactions on Information and Systems","issn_l":"0916-8532","issn":["0916-8532","1745-1361"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Transactions on Information and Systems","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8500000238418579,"id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G1819850925","display_name":null,"funder_award_id":"24650022","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"},{"id":"https://openalex.org/G3544053732","display_name":null,"funder_award_id":"25280016","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"}],"funders":[{"id":"https://openalex.org/F4320321040","display_name":"National Science Council","ror":"https://ror.org/02kv4zf79"},{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2049135494.pdf","grobid_xml":"https://content.openalex.org/works/W2049135494.grobid-xml"},"referenced_works_count":25,"referenced_works":["https://openalex.org/W122525933","https://openalex.org/W151125335","https://openalex.org/W192757576","https://openalex.org/W1900996732","https://openalex.org/W2001352955","https://openalex.org/W2030855213","https://openalex.org/W2080510479","https://openalex.org/W2104746340","https://openalex.org/W2110490782","https://openalex.org/W2112856691","https://openalex.org/W2117791241","https://openalex.org/W2125715320","https://openalex.org/W2126641963","https://openalex.org/W2126872604","https://openalex.org/W2132565185","https://openalex.org/W2134236236","https://openalex.org/W2135615172","https://openalex.org/W2139234345","https://openalex.org/W2148598008","https://openalex.org/W2149681958","https://openalex.org/W2156340730","https://openalex.org/W2161338410","https://openalex.org/W2464594873","https://openalex.org/W2477948566","https://openalex.org/W4242107829"],"related_works":["https://openalex.org/W3081694532","https://openalex.org/W1969211203","https://openalex.org/W1517958729","https://openalex.org/W2092272653","https://openalex.org/W1980230116","https://openalex.org/W4387002515","https://openalex.org/W1992704972","https://openalex.org/W2002555665","https://openalex.org/W271627879","https://openalex.org/W2349444258"],"abstract_inverted_index":{"The":[0,56],"applicability":[1],"of":[2,76],"at-speed":[3],"scan-based":[4],"logic":[5,53],"built-in":[6],"self-test":[7],"(BIST)":[8],"is":[9,34,59],"being":[10],"severely":[11],"challenged":[12],"by":[13,67],"excessive":[14,68],"capture":[15,42,69,104],"power":[16,43,70,105],"that":[17,100],"may":[18],"cause":[19],"erroneous":[20],"test":[21,64,111],"responses":[22,65],"even":[23],"for":[24],"good":[25],"circuits.":[26],"Different":[27],"from":[28,83],"conventional":[29],"low-power":[30],"BIST,":[31],"this":[32],"paper":[33],"the":[35,73,85],"first":[36],"to":[37,60,80],"explicitly":[38],"focus":[39],"on":[40,110],"achieving":[41],"safety":[44,106],"with":[45,90,107],"a":[46,95],"novel":[47],"and":[48,71,94,113],"practical":[49],"scheme,":[50],"called":[51],"capture-power-safe":[52],"BIST":[54],"(CPS-LBIST).":[55],"basic":[57],"idea":[58],"identify":[61],"all":[62],"possibly-erroneous":[63],"caused":[66],"use":[72],"well-known":[74],"approach":[75],"masking":[77],"(bit-masking,":[78],"slice-masking,vector-masking)":[79],"block":[81],"them":[82],"reaching":[84],"multiple-input":[86],"signature":[87],"register(MISR).":[88],"Experiments":[89],"large":[91,96],"benchmark":[92],"circuits":[93],"industrial":[97],"circuit":[98,114],"demonstrate":[99],"CPS-LBIST":[101],"can":[102],"achieve":[103],"negligible":[108],"impact":[109],"quality":[112],"overhead.":[115]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}