{"id":"https://openalex.org/W4362730188","doi":"https://doi.org/10.1587/transele.2022ctp0003","title":"An SOI-Based Lock-in Pixel with a Shallow Buried Channel for Reducing Parasitic Light Sensitivity and Improving Modulation Contrast","display_name":"An SOI-Based Lock-in Pixel with a Shallow Buried Channel for Reducing Parasitic Light Sensitivity and Improving Modulation Contrast","publication_year":2023,"publication_date":"2023-04-09","ids":{"openalex":"https://openalex.org/W4362730188","doi":"https://doi.org/10.1587/transele.2022ctp0003"},"language":"en","primary_location":{"id":"doi:10.1587/transele.2022ctp0003","is_oa":true,"landing_page_url":"http://dx.doi.org/10.1587/transele.2022ctp0003","pdf_url":"https://www.jstage.jst.go.jp/article/transele/E106.C/10/E106.C_2022CTP0003/_pdf","source":{"id":"https://openalex.org/S2489501747","display_name":"IEICE Transactions on Electronics","issn_l":"0916-8524","issn":["0916-8524","1745-1353"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Transactions on Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://www.jstage.jst.go.jp/article/transele/E106.C/10/E106.C_2022CTP0003/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028125522","display_name":"T. Kobayashi","orcid":"https://orcid.org/0000-0001-5669-1937"},"institutions":[{"id":"https://openalex.org/I1298590031","display_name":"Shizuoka University","ror":"https://ror.org/01w6wtk13","country_code":"JP","type":"education","lineage":["https://openalex.org/I1298590031"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tatsuya KOBAYASHI","raw_affiliation_strings":["Graduate School of Integrated Science and Technology, Shizuoka University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Integrated Science and Technology, Shizuoka University","institution_ids":["https://openalex.org/I1298590031"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032893390","display_name":"Keita Yasutomi","orcid":"https://orcid.org/0000-0003-0818-8506"},"institutions":[{"id":"https://openalex.org/I1298590031","display_name":"Shizuoka University","ror":"https://ror.org/01w6wtk13","country_code":"JP","type":"education","lineage":["https://openalex.org/I1298590031"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Keita YASUTOMI","raw_affiliation_strings":["Research Institute of Electronics, Shizuoka University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Institute of Electronics, Shizuoka University","institution_ids":["https://openalex.org/I1298590031"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014567164","display_name":"Naoki Takada","orcid":"https://orcid.org/0000-0002-0423-9612"},"institutions":[{"id":"https://openalex.org/I1298590031","display_name":"Shizuoka University","ror":"https://ror.org/01w6wtk13","country_code":"JP","type":"education","lineage":["https://openalex.org/I1298590031"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Naoki TAKADA","raw_affiliation_strings":["Graduate School of Integrated Science and Technology, Shizuoka University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Integrated Science and Technology, Shizuoka University","institution_ids":["https://openalex.org/I1298590031"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065338590","display_name":"Shoji Kawahito","orcid":"https://orcid.org/0000-0003-4456-5006"},"institutions":[{"id":"https://openalex.org/I1298590031","display_name":"Shizuoka University","ror":"https://ror.org/01w6wtk13","country_code":"JP","type":"education","lineage":["https://openalex.org/I1298590031"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shoji KAWAHITO","raw_affiliation_strings":["Research Institute of Electronics, Shizuoka University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Institute of Electronics, Shizuoka University","institution_ids":["https://openalex.org/I1298590031"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I1298590031"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0255914,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"E106.C","issue":"10","first_page":"538","last_page":"545"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.7654057741165161},{"id":"https://openalex.org/keywords/silicon-on-insulator","display_name":"Silicon on insulator","score":0.6247479319572449},{"id":"https://openalex.org/keywords/lock","display_name":"Lock (firearm)","score":0.6022461652755737},{"id":"https://openalex.org/keywords/modulation","display_name":"Modulation (music)","score":0.5794057250022888},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.5467154383659363},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.4991953372955322},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4900408983230591},{"id":"https://openalex.org/keywords/contrast","display_name":"Contrast (vision)","score":0.4543168246746063},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4335300922393799},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.37715214490890503},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.352136492729187},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2630142569541931},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26006120443344116},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.23532834649085999},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.1370345950126648},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.11199688911437988}],"concepts":[{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.7654057741165161},{"id":"https://openalex.org/C53143962","wikidata":"https://www.wikidata.org/wiki/Q1478788","display_name":"Silicon on insulator","level":3,"score":0.6247479319572449},{"id":"https://openalex.org/C174839445","wikidata":"https://www.wikidata.org/wiki/Q1134386","display_name":"Lock (firearm)","level":2,"score":0.6022461652755737},{"id":"https://openalex.org/C123079801","wikidata":"https://www.wikidata.org/wiki/Q750240","display_name":"Modulation (music)","level":2,"score":0.5794057250022888},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.5467154383659363},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.4991953372955322},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4900408983230591},{"id":"https://openalex.org/C2776502983","wikidata":"https://www.wikidata.org/wiki/Q690182","display_name":"Contrast (vision)","level":2,"score":0.4543168246746063},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4335300922393799},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.37715214490890503},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.352136492729187},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2630142569541931},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26006120443344116},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.23532834649085999},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.1370345950126648},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.11199688911437988},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/transele.2022ctp0003","is_oa":true,"landing_page_url":"http://dx.doi.org/10.1587/transele.2022ctp0003","pdf_url":"https://www.jstage.jst.go.jp/article/transele/E106.C/10/E106.C_2022CTP0003/_pdf","source":{"id":"https://openalex.org/S2489501747","display_name":"IEICE Transactions on Electronics","issn_l":"0916-8524","issn":["0916-8524","1745-1353"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Transactions on Electronics","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/transele.2022ctp0003","is_oa":true,"landing_page_url":"http://dx.doi.org/10.1587/transele.2022ctp0003","pdf_url":"https://www.jstage.jst.go.jp/article/transele/E106.C/10/E106.C_2022CTP0003/_pdf","source":{"id":"https://openalex.org/S2489501747","display_name":"IEICE Transactions on Electronics","issn_l":"0916-8524","issn":["0916-8524","1745-1353"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Transactions on Electronics","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4362730188.pdf"},"referenced_works_count":30,"referenced_works":["https://openalex.org/W1975328031","https://openalex.org/W2020640905","https://openalex.org/W2025712175","https://openalex.org/W2057171916","https://openalex.org/W2114116622","https://openalex.org/W2158311142","https://openalex.org/W2320275999","https://openalex.org/W2578612933","https://openalex.org/W2626854628","https://openalex.org/W2743552798","https://openalex.org/W2743826502","https://openalex.org/W2778710886","https://openalex.org/W2790853419","https://openalex.org/W2791731233","https://openalex.org/W2964155695","https://openalex.org/W2973002139","https://openalex.org/W2994644849","https://openalex.org/W2997346195","https://openalex.org/W3085380924","https://openalex.org/W3092058258","https://openalex.org/W3102557549","https://openalex.org/W3108071383","https://openalex.org/W3135101855","https://openalex.org/W3136617232","https://openalex.org/W3165932260","https://openalex.org/W3204766074","https://openalex.org/W4205464024","https://openalex.org/W4205590123","https://openalex.org/W4226016707","https://openalex.org/W4390776846"],"related_works":["https://openalex.org/W2104300577","https://openalex.org/W2771786520","https://openalex.org/W2810180604","https://openalex.org/W2944964251","https://openalex.org/W2012754971","https://openalex.org/W44660823","https://openalex.org/W2034653092","https://openalex.org/W2168200057","https://openalex.org/W2101030291","https://openalex.org/W2539048457"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,17,27,33],"high-NIR":[4],"sensitivity":[5,47],"SOI-gate":[6],"lock-in":[7],"pixel":[8,15],"with":[9],"improved":[10],"modulation":[11],"contrast.":[12],"The":[13],"proposed":[14],"has":[16],"shallow":[18],"buried":[19],"channel":[20],"and":[21,32],"intermediate":[22],"gates":[23],"to":[24,36,51,54],"create":[25],"both":[26],"high":[28],"lateral":[29],"electric":[30],"field":[31],"potential":[34],"barrier":[35],"parasitic":[37,45],"light":[38,46],"sensitivity.":[39],"Device":[40],"simulation":[41],"results":[42],"showed":[43],"that":[44],"reduced":[48],"from":[49],"13.7%":[50],"0.13%":[52],"compared":[53],"the":[55],"previous":[56],"structure.":[57]},"counts_by_year":[],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}