{"id":"https://openalex.org/W3147714977","doi":"https://doi.org/10.1587/transele.2020ecp5041","title":"Dependence of Arc Duration and Contact Gap at Arc Extinction of Break Arcs Occurring in a 48VDC/10A-300A Resistive Circuit on Contact Opening Speed","display_name":"Dependence of Arc Duration and Contact Gap at Arc Extinction of Break Arcs Occurring in a 48VDC/10A-300A Resistive Circuit on Contact Opening Speed","publication_year":2021,"publication_date":"2021-03-31","ids":{"openalex":"https://openalex.org/W3147714977","doi":"https://doi.org/10.1587/transele.2020ecp5041","mag":"3147714977"},"language":"en","primary_location":{"id":"doi:10.1587/transele.2020ecp5041","is_oa":false,"landing_page_url":"https://doi.org/10.1587/transele.2020ecp5041","pdf_url":null,"source":{"id":"https://openalex.org/S2489501747","display_name":"IEICE Transactions on Electronics","issn_l":"0916-8524","issn":["0916-8524","1745-1353"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Transactions on Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010399872","display_name":"Haruko Yazaki","orcid":null},"institutions":[{"id":"https://openalex.org/I1298590031","display_name":"Shizuoka University","ror":"https://ror.org/01w6wtk13","country_code":"JP","type":"education","lineage":["https://openalex.org/I1298590031"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Haruko YAZAKI","raw_affiliation_strings":["Shizuoka University"],"affiliations":[{"raw_affiliation_string":"Shizuoka University","institution_ids":["https://openalex.org/I1298590031"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001762115","display_name":"Junya Sekikawa","orcid":null},"institutions":[{"id":"https://openalex.org/I1298590031","display_name":"Shizuoka University","ror":"https://ror.org/01w6wtk13","country_code":"JP","type":"education","lineage":["https://openalex.org/I1298590031"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Junya SEKIKAWA","raw_affiliation_strings":["Shizuoka University"],"affiliations":[{"raw_affiliation_string":"Shizuoka University","institution_ids":["https://openalex.org/I1298590031"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5010399872"],"corresponding_institution_ids":["https://openalex.org/I1298590031"],"apc_list":null,"apc_paid":null,"fwci":0.1109,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.37086093,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"E104.C","issue":"11","first_page":"656","last_page":"662"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12371","display_name":"Electrical Contact Performance and Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12371","display_name":"Electrical Contact Performance and Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12077","display_name":"Vacuum and Plasma Arcs","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/arc","display_name":"Arc (geometry)","score":0.7242294549942017},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.6863152384757996},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6685749292373657},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5305300951004028},{"id":"https://openalex.org/keywords/electrical-contacts","display_name":"Electrical contacts","score":0.4785464406013489},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.42355817556381226},{"id":"https://openalex.org/keywords/electric-arc","display_name":"Electric arc","score":0.42303013801574707},{"id":"https://openalex.org/keywords/extinction","display_name":"Extinction (optical mineralogy)","score":0.41217219829559326},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.4025171101093292},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.38127198815345764},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15902382135391235},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.1573399305343628},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.15373444557189941},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.10505416989326477},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08288946747779846}],"concepts":[{"id":"https://openalex.org/C83415579","wikidata":"https://www.wikidata.org/wiki/Q161973","display_name":"Arc (geometry)","level":2,"score":0.7242294549942017},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.6863152384757996},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6685749292373657},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5305300951004028},{"id":"https://openalex.org/C132235601","wikidata":"https://www.wikidata.org/wiki/Q394001","display_name":"Electrical contacts","level":2,"score":0.4785464406013489},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.42355817556381226},{"id":"https://openalex.org/C114375839","wikidata":"https://www.wikidata.org/wiki/Q207456","display_name":"Electric arc","level":3,"score":0.42303013801574707},{"id":"https://openalex.org/C101991246","wikidata":"https://www.wikidata.org/wiki/Q5422078","display_name":"Extinction (optical mineralogy)","level":2,"score":0.41217219829559326},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.4025171101093292},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.38127198815345764},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15902382135391235},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.1573399305343628},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.15373444557189941},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.10505416989326477},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08288946747779846},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/transele.2020ecp5041","is_oa":false,"landing_page_url":"https://doi.org/10.1587/transele.2020ecp5041","pdf_url":null,"source":{"id":"https://openalex.org/S2489501747","display_name":"IEICE Transactions on Electronics","issn_l":"0916-8524","issn":["0916-8524","1745-1353"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Transactions on Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1674470968","https://openalex.org/W1735316715","https://openalex.org/W1804664721","https://openalex.org/W1975286217","https://openalex.org/W1982249167","https://openalex.org/W1992161590","https://openalex.org/W2021843195","https://openalex.org/W2030595545","https://openalex.org/W2038731326","https://openalex.org/W2050421587","https://openalex.org/W2054851777","https://openalex.org/W2060103945","https://openalex.org/W2070106562","https://openalex.org/W2075286487","https://openalex.org/W2078579333","https://openalex.org/W2079491086","https://openalex.org/W2088358364","https://openalex.org/W2515370548","https://openalex.org/W2515687437","https://openalex.org/W2515875131","https://openalex.org/W2518170494","https://openalex.org/W2750772388","https://openalex.org/W2752319308","https://openalex.org/W2766605753","https://openalex.org/W2889362051","https://openalex.org/W2943039616","https://openalex.org/W2970656027","https://openalex.org/W3046617186"],"related_works":["https://openalex.org/W2345777271","https://openalex.org/W2016192970","https://openalex.org/W2479963166","https://openalex.org/W2041090114","https://openalex.org/W2001056891","https://openalex.org/W1971732860","https://openalex.org/W1579760497","https://openalex.org/W2041424656","https://openalex.org/W1997932937","https://openalex.org/W388301927"],"abstract_inverted_index":{"Dependences":[0],"of":[1,178,181,237,247,252,274,284],"arc":[2,9,75,104,186,276],"duration":[3,76],"D":[4,77,87],"and":[5,63,157,222,250,260,281],"contact":[6,13,30,81,101,279],"gap":[7,102],"at":[8,28,88,94,103,117,123,155,166,172,258,265],"extinction":[10,105,190],"d":[11,106,116,126,147,165,239,264],"on":[12,278],"opening":[14,31,34,82],"speed":[15,35,83],"v":[16,36,133,152,211,232,268],"are":[17,52],"studied":[18],"for":[19,134,162],"break":[20,253,285],"arcs":[21],"generated":[22],"in":[23,184],"a":[24,40],"48VDC":[25],"resistive":[26],"circuit":[27],"constant":[29,129,207],"speeds.":[32],"The":[33,65,125,194,203,235],"is":[37,55],"varied":[38,56],"over":[39],"wide":[41,272],"range":[42],"from":[43],"0.05":[44],"to":[45,57,108,197,227],"0.5m/s.":[46],"Circuit":[47],"current":[48,72,136,201],"while":[49],"electrical":[50],"contacts":[51],"closed":[53],"I0":[54,137,140,214],"10A,":[58],"20A,":[59],"50A,":[60],"100A,":[61],"200A,":[62],"300A.":[64,158],"following":[66],"results":[67,180,246],"were":[68,192],"obtained.":[69],"For":[70],"each":[71,135],"I0,":[73],"the":[74,86,97,100,112,115,132,139,146,151,160,164,176,179,182,210,213,224,231,238,244,248,262,266,275],"decreased":[78],"with":[79,110,130,199,208],"increasing":[80,111,131,200,209],"v.":[84],"However,":[85,114,145,219],"I0=300A":[89,118,167],"was":[90,119,127,141,153,168,205,215,233,269],"shorter":[91,120,149,169,263],"than":[92,121,143,170,217],"that":[93,122,171],"I0=200A.":[95,124],"On":[96],"other":[98],"hand,":[99],"tended":[107,196,226],"increase":[109,198],"I0.":[113,202],"almost":[128,206],"when":[138,150,212,220,230],"lower":[142,216],"200A.":[144,218],"became":[148],"slower":[154],"I0=200A":[156,221,259],"At":[159,255],"v=0.05m/s,":[161],"example,":[163],"I0=100A.":[173],"To":[174],"explain":[175],"cause":[177],"d,":[183],"addition,":[185],"length":[187],"just":[188],"before":[189],"L":[191,195,204,225,249],"analyzed.":[193],"300A,":[223,261],"become":[228],"longer":[229],"slower.":[234],"characteristics":[236],"will":[240],"be":[241],"discussed":[242],"using":[243],"analyzed":[245],"motion":[251,273],"arcs.":[254,286],"higher":[256],"currents":[257],"slowest":[267],"caused":[270],"by":[271],"spots":[277],"surfaces":[280],"larger":[282],"deformation":[283]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}