{"id":"https://openalex.org/W2954788386","doi":"https://doi.org/10.1587/transele.2018ctp0007","title":"Impact of On-Chip Inductor and Power-Delivery-Network Stacking on Signal and Power Integrity","display_name":"Impact of On-Chip Inductor and Power-Delivery-Network Stacking on Signal and Power Integrity","publication_year":2019,"publication_date":"2019-06-30","ids":{"openalex":"https://openalex.org/W2954788386","doi":"https://doi.org/10.1587/transele.2018ctp0007","mag":"2954788386"},"language":"en","primary_location":{"id":"doi:10.1587/transele.2018ctp0007","is_oa":false,"landing_page_url":"http://doi.org/10.1587/transele.2018ctp0007","pdf_url":null,"source":{"id":"https://openalex.org/S2489501747","display_name":"IEICE Transactions on Electronics","issn_l":"0916-8524","issn":["0916-8524","1745-1353"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Transactions on Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038761727","display_name":"Akira Tsuchiya","orcid":"https://orcid.org/0000-0002-3299-9328"},"institutions":[{"id":"https://openalex.org/I139159150","display_name":"University of Shiga Prefecture","ror":"https://ror.org/02dvjfw95","country_code":"JP","type":"education","lineage":["https://openalex.org/I139159150"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Akira TSUCHIYA","raw_affiliation_strings":["The University of Shiga Prefecture"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The University of Shiga Prefecture","institution_ids":["https://openalex.org/I139159150"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014616119","display_name":"Akitaka Hiratsuka","orcid":null},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Akitaka HIRATSUKA","raw_affiliation_strings":["Kyoto University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyoto University","institution_ids":["https://openalex.org/I22299242"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082242690","display_name":"Toshiyuki Inoue","orcid":"https://orcid.org/0000-0002-6621-1412"},"institutions":[{"id":"https://openalex.org/I139159150","display_name":"University of Shiga Prefecture","ror":"https://ror.org/02dvjfw95","country_code":"JP","type":"education","lineage":["https://openalex.org/I139159150"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshiyuki INOUE","raw_affiliation_strings":["The University of Shiga Prefecture"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The University of Shiga Prefecture","institution_ids":["https://openalex.org/I139159150"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022381888","display_name":"Keiji Kishine","orcid":"https://orcid.org/0000-0003-3213-6650"},"institutions":[{"id":"https://openalex.org/I139159150","display_name":"University of Shiga Prefecture","ror":"https://ror.org/02dvjfw95","country_code":"JP","type":"education","lineage":["https://openalex.org/I139159150"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Keiji KISHINE","raw_affiliation_strings":["The University of Shiga Prefecture"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The University of Shiga Prefecture","institution_ids":["https://openalex.org/I139159150"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026865951","display_name":"Hidetoshi Onodera","orcid":"https://orcid.org/0000-0001-5198-0668"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hidetoshi ONODERA","raw_affiliation_strings":["Kyoto University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyoto University","institution_ids":["https://openalex.org/I22299242"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.05268956,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"E102.C","issue":"7","first_page":"573","last_page":"579"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/power-integrity","display_name":"Power integrity","score":0.7942230701446533},{"id":"https://openalex.org/keywords/inductor","display_name":"Inductor","score":0.7428238391876221},{"id":"https://openalex.org/keywords/signal-integrity","display_name":"Signal integrity","score":0.718835711479187},{"id":"https://openalex.org/keywords/stacking","display_name":"Stacking","score":0.6881965398788452},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.6022093892097473},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5170691609382629},{"id":"https://openalex.org/keywords/power-network","display_name":"Power network","score":0.4981365203857422},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.48895084857940674},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4853934049606323},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.40021586418151855},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.33620572090148926},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3250439763069153},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.13351985812187195},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.12030884623527527},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.11586973071098328},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11428627371788025}],"concepts":[{"id":"https://openalex.org/C2777561913","wikidata":"https://www.wikidata.org/wiki/Q19599527","display_name":"Power integrity","level":4,"score":0.7942230701446533},{"id":"https://openalex.org/C144534570","wikidata":"https://www.wikidata.org/wiki/Q5325","display_name":"Inductor","level":3,"score":0.7428238391876221},{"id":"https://openalex.org/C44938667","wikidata":"https://www.wikidata.org/wiki/Q4503810","display_name":"Signal integrity","level":3,"score":0.718835711479187},{"id":"https://openalex.org/C33347731","wikidata":"https://www.wikidata.org/wiki/Q285210","display_name":"Stacking","level":2,"score":0.6881965398788452},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.6022093892097473},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5170691609382629},{"id":"https://openalex.org/C2989126829","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Power network","level":4,"score":0.4981365203857422},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.48895084857940674},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4853934049606323},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40021586418151855},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33620572090148926},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3250439763069153},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.13351985812187195},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.12030884623527527},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.11586973071098328},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11428627371788025},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C46141821","wikidata":"https://www.wikidata.org/wiki/Q209402","display_name":"Nuclear magnetic resonance","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/transele.2018ctp0007","is_oa":false,"landing_page_url":"http://doi.org/10.1587/transele.2018ctp0007","pdf_url":null,"source":{"id":"https://openalex.org/S2489501747","display_name":"IEICE Transactions on Electronics","issn_l":"0916-8524","issn":["0916-8524","1745-1353"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Transactions on Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8500000238418579}],"awards":[{"id":"https://openalex.org/G7400284165","display_name":"Research and Development of Beam Forming Microwave Sensor for Non-Contact Sleeping Condition Measurement in Multi-Spot","funder_award_id":"19K14998","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"}],"funders":[{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1569638374","https://openalex.org/W2113539653","https://openalex.org/W2162304438","https://openalex.org/W2166417864","https://openalex.org/W2167004581","https://openalex.org/W2811091138"],"related_works":["https://openalex.org/W2965410099","https://openalex.org/W4235454973","https://openalex.org/W4386105410","https://openalex.org/W2250058922","https://openalex.org/W2148913576","https://openalex.org/W3097351224","https://openalex.org/W4250319866","https://openalex.org/W2385649681","https://openalex.org/W4312198714","https://openalex.org/W1987899475"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}