{"id":"https://openalex.org/W4413888871","doi":"https://doi.org/10.1587/elex.22.20250410","title":"A small-area and low-power readout circuit for a LOFIC CMOS image sensor","display_name":"A small-area and low-power readout circuit for a LOFIC CMOS image sensor","publication_year":2025,"publication_date":"2025-09-01","ids":{"openalex":"https://openalex.org/W4413888871","doi":"https://doi.org/10.1587/elex.22.20250410"},"language":"en","primary_location":{"id":"doi:10.1587/elex.22.20250410","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.22.20250410","pdf_url":"https://www.jstage.jst.go.jp/article/elex/advpub/0/advpub_22.20250410/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/advpub/0/advpub_22.20250410/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Seina Hori","orcid":null},"institutions":[{"id":"https://openalex.org/I135768898","display_name":"Ritsumeikan University","ror":"https://ror.org/0197nmd03","country_code":"JP","type":"education","lineage":["https://openalex.org/I135768898","https://openalex.org/I4390039241"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Seina Hori","raw_affiliation_strings":["Dept. of Science and Engineering, Ritsumeikan University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Science and Engineering, Ritsumeikan University","institution_ids":["https://openalex.org/I135768898"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000844537","display_name":"Ai Otani","orcid":"https://orcid.org/0009-0006-0687-3381"},"institutions":[{"id":"https://openalex.org/I135768898","display_name":"Ritsumeikan University","ror":"https://ror.org/0197nmd03","country_code":"JP","type":"education","lineage":["https://openalex.org/I135768898","https://openalex.org/I4390039241"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ai Otani","raw_affiliation_strings":["Dept. of Science and Engineering, Ritsumeikan University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Science and Engineering, Ritsumeikan University","institution_ids":["https://openalex.org/I135768898"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5115513840","display_name":"Yuki Rogi","orcid":null},"institutions":[{"id":"https://openalex.org/I135768898","display_name":"Ritsumeikan University","ror":"https://ror.org/0197nmd03","country_code":"JP","type":"education","lineage":["https://openalex.org/I135768898","https://openalex.org/I4390039241"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yuki Rogi","raw_affiliation_strings":["Dept. of Science and Engineering, Ritsumeikan University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Science and Engineering, Ritsumeikan University","institution_ids":["https://openalex.org/I135768898"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049238725","display_name":"Hiroaki Ogawa","orcid":null},"institutions":[{"id":"https://openalex.org/I135768898","display_name":"Ritsumeikan University","ror":"https://ror.org/0197nmd03","country_code":"JP","type":"education","lineage":["https://openalex.org/I135768898","https://openalex.org/I4390039241"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroaki Ogawa","raw_affiliation_strings":["Dept. of Science and Engineering, Ritsumeikan University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Science and Engineering, Ritsumeikan University","institution_ids":["https://openalex.org/I135768898"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035779550","display_name":"K. Miyauchi","orcid":"https://orcid.org/0000-0002-2732-7957"},"institutions":[{"id":"https://openalex.org/I135768898","display_name":"Ritsumeikan University","ror":"https://ror.org/0197nmd03","country_code":"JP","type":"education","lineage":["https://openalex.org/I135768898","https://openalex.org/I4390039241"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ken Miyauchi","raw_affiliation_strings":["Brillnics Japan Inc","Dept. of Science and Engineering, Ritsumeikan University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Brillnics Japan Inc","institution_ids":[]},{"raw_affiliation_string":"Dept. of Science and Engineering, Ritsumeikan University","institution_ids":["https://openalex.org/I135768898"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031628824","display_name":"Yuki Morikawa","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yuki Morikawa","raw_affiliation_strings":["Brillnics Japan Inc"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Brillnics Japan Inc","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033946164","display_name":"Hideki Owada","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hideki Owada","raw_affiliation_strings":["Brillnics Japan Inc"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Brillnics Japan Inc","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024655301","display_name":"Chia-Chi Kuo","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Chia-Chi Kuo","raw_affiliation_strings":["Brillnics Japan Inc"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Brillnics Japan Inc","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027095973","display_name":"Isao Takayanagi","orcid":"https://orcid.org/0000-0003-3016-3348"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Isao Takayanagi","raw_affiliation_strings":["Brillnics Japan Inc"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Brillnics Japan Inc","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049285154","display_name":"Shunsuke Okura","orcid":"https://orcid.org/0000-0001-6422-3703"},"institutions":[{"id":"https://openalex.org/I135768898","display_name":"Ritsumeikan University","ror":"https://ror.org/0197nmd03","country_code":"JP","type":"education","lineage":["https://openalex.org/I135768898","https://openalex.org/I4390039241"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shunsuke Okura","raw_affiliation_strings":["Dept. of Science and Engineering, Ritsumeikan University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Science and Engineering, Ritsumeikan University","institution_ids":["https://openalex.org/I135768898"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":10,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.19065268,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"22","issue":"20","first_page":"20250410","last_page":"20250410"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9509999752044678,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9460999965667725,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7116516828536987},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.6654277443885803},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.476604163646698},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.47060972452163696},{"id":"https://openalex.org/keywords/ultra-low-power","display_name":"Ultra low power","score":0.4590316116809845},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4173809587955475},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.40266987681388855},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.21683552861213684},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20832908153533936},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.19068047404289246},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.17165499925613403}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7116516828536987},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.6654277443885803},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.476604163646698},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.47060972452163696},{"id":"https://openalex.org/C3017773396","wikidata":"https://www.wikidata.org/wiki/Q6692774","display_name":"Ultra low power","level":4,"score":0.4590316116809845},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4173809587955475},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40266987681388855},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.21683552861213684},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20832908153533936},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19068047404289246},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.17165499925613403},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.22.20250410","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.22.20250410","pdf_url":"https://www.jstage.jst.go.jp/article/elex/advpub/0/advpub_22.20250410/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.22.20250410","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.22.20250410","pdf_url":"https://www.jstage.jst.go.jp/article/elex/advpub/0/advpub_22.20250410/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320322832","display_name":"University of Tokyo","ror":"https://ror.org/057zh3y96"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4413888871.pdf","grobid_xml":"https://content.openalex.org/works/W4413888871.grobid-xml"},"referenced_works_count":28,"referenced_works":["https://openalex.org/W1513304605","https://openalex.org/W1589804494","https://openalex.org/W2031533823","https://openalex.org/W2064888815","https://openalex.org/W2078276934","https://openalex.org/W2105254225","https://openalex.org/W2129163123","https://openalex.org/W2134145839","https://openalex.org/W2139871408","https://openalex.org/W2147283416","https://openalex.org/W2170733362","https://openalex.org/W2331546870","https://openalex.org/W2523867895","https://openalex.org/W2526894178","https://openalex.org/W2743554312","https://openalex.org/W2784246979","https://openalex.org/W2789062182","https://openalex.org/W2891254971","https://openalex.org/W2912475390","https://openalex.org/W2915027029","https://openalex.org/W2996355179","https://openalex.org/W3112867989","https://openalex.org/W3138839066","https://openalex.org/W4226173292","https://openalex.org/W4226307350","https://openalex.org/W4376629932","https://openalex.org/W4385190076","https://openalex.org/W4391622643"],"related_works":["https://openalex.org/W2349576212","https://openalex.org/W1981776476","https://openalex.org/W2352535872","https://openalex.org/W1590693222","https://openalex.org/W2382967348","https://openalex.org/W2334823507","https://openalex.org/W2329660408","https://openalex.org/W2107073676","https://openalex.org/W2565551736","https://openalex.org/W2109445684"],"abstract_inverted_index":{"Lateral":[0],"overflow":[1],"integration":[2],"capacitor":[3],"(LOFIC)":[4],"CMOS":[5,127],"image":[6],"sensors":[7],"(CISs)":[8],"can":[9],"realize":[10],"high-dynamic-range":[11],"(HDR)":[12],"imaging":[13],"by":[14,94,111],"combining":[15],"high-conversion-gain":[16],"(HCG)":[17],"signal":[18,78,87,135,143],"with":[19,68,123],"low-conversion-gain":[20],"(LCG)":[21],"signal.":[22],"However,":[23],"LOFIC":[24,66],"CISs":[25],"require":[26],"an":[27],"analog-to-digital":[28],"converter":[29],"(ADC)":[30],"and":[31,36,44,72,136,151],"SRAM":[32,100],"for":[33,64,70],"both":[34],"HCG":[35,71,77,134],"LCG":[37,73,86,142],"signals,":[38],"leading":[39],"to":[40,50,147,155],"higher":[41],"power":[42,92],"consumption":[43,93],"a":[45,60,124,156],"larger":[46],"circuit":[47,63,109,120],"area":[48,110],"compared":[49],"standard-dynamic-range":[51],"(SDR)":[52],"CISs.":[53],"To":[54],"address":[55],"this":[56],"issue,":[57],"we":[58],"propose":[59],"single-channel":[61],"readout":[62,108,119],"the":[65,76,81,85,91,103,107,118,133,137,141],"pixel":[67],"selector":[69],"signals.":[74],"When":[75],"is":[79,88],"selected,":[80],"A/D":[82],"conversion":[83],"of":[84,117,132,140,159],"halted,":[89],"reducing":[90,106],"11.3":[95],"%":[96],"on":[97],"average.":[98],"Furthermore,":[99],"stores":[101],"only":[102],"selected":[104],"signal,":[105],"7.9":[112],"%.":[113],"A":[114],"test":[115],"chip":[116],"was":[121],"fabricated":[122],"0.18":[125],"\u00b5m":[126],"process.":[128],"The":[129],"dark":[130],"noise":[131],"maximum":[138],"charge":[139],"were":[144],"respectively":[145],"estimated":[146],"be":[148],"4.0":[149],"e-rms":[150],"130":[152],"ke-,":[153],"corresponding":[154],"dynamic":[157],"range":[158],"90.2":[160],"dB.":[161]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}