{"id":"https://openalex.org/W4410736234","doi":"https://doi.org/10.1587/elex.22.20250047","title":"Built-off self-calibration scheme for ADCs based on shifting transfer-characteristics","display_name":"Built-off self-calibration scheme for ADCs based on shifting transfer-characteristics","publication_year":2025,"publication_date":"2025-05-26","ids":{"openalex":"https://openalex.org/W4410736234","doi":"https://doi.org/10.1587/elex.22.20250047"},"language":"en","primary_location":{"id":"doi:10.1587/elex.22.20250047","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.22.20250047","pdf_url":"https://www.jstage.jst.go.jp/article/elex/advpub/0/advpub_22.20250047/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/advpub/0/advpub_22.20250047/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036554961","display_name":"M. Garc\u00eda Gil","orcid":null},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Myeonggu Gil","raw_affiliation_strings":["Division of Electrical Engineering, Hanyang University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electrical Engineering, Hanyang University","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100618956","display_name":"Jaehyun Park","orcid":"https://orcid.org/0000-0002-5264-6941"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaehyun Park","raw_affiliation_strings":["Division of Electrical Engineering, Hanyang University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electrical Engineering, Hanyang University","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068070739","display_name":"Jacob A. Abraham","orcid":"https://orcid.org/0000-0002-5336-5631"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jacob A. Abraham","raw_affiliation_strings":["Department of Electrical and Computer Engineering, The University of Texas at Austin"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, The University of Texas at Austin","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075157110","display_name":"Byoung\u2010Ho Kim","orcid":"https://orcid.org/0000-0001-8073-8109"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Byoungho Kim","raw_affiliation_strings":["Division of Electrical Engineering, Hanyang University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electrical Engineering, Hanyang University","institution_ids":["https://openalex.org/I4575257"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.09276875,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"22","issue":"14","first_page":"20250047","last_page":"20250047"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9868000149726868,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9868000149726868,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9861999750137329,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9829000234603882,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6464381814002991},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.5899823904037476},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.50928795337677},{"id":"https://openalex.org/keywords/transfer","display_name":"Transfer (computing)","score":0.4952785074710846},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.45849597454071045},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2049858272075653},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1516556441783905},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.10006842017173767},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.046642184257507324}],"concepts":[{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6464381814002991},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.5899823904037476},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.50928795337677},{"id":"https://openalex.org/C2776175482","wikidata":"https://www.wikidata.org/wiki/Q1195816","display_name":"Transfer (computing)","level":2,"score":0.4952785074710846},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.45849597454071045},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2049858272075653},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1516556441783905},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.10006842017173767},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.046642184257507324},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.22.20250047","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.22.20250047","pdf_url":"https://www.jstage.jst.go.jp/article/elex/advpub/0/advpub_22.20250047/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.22.20250047","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.22.20250047","pdf_url":"https://www.jstage.jst.go.jp/article/elex/advpub/0/advpub_22.20250047/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4410736234.pdf","grobid_xml":"https://content.openalex.org/works/W4410736234.grobid-xml"},"referenced_works_count":30,"referenced_works":["https://openalex.org/W2009356860","https://openalex.org/W2015817990","https://openalex.org/W2038370925","https://openalex.org/W2052276427","https://openalex.org/W2116555433","https://openalex.org/W2535745143","https://openalex.org/W2753557213","https://openalex.org/W2775598551","https://openalex.org/W2800110716","https://openalex.org/W2897815708","https://openalex.org/W2899603678","https://openalex.org/W2914014667","https://openalex.org/W2975781870","https://openalex.org/W2975938667","https://openalex.org/W2979561210","https://openalex.org/W2979729503","https://openalex.org/W2989858880","https://openalex.org/W3019516388","https://openalex.org/W3021273787","https://openalex.org/W3032723595","https://openalex.org/W3036425307","https://openalex.org/W3106996514","https://openalex.org/W3124733035","https://openalex.org/W3134133117","https://openalex.org/W3163077898","https://openalex.org/W3189841230","https://openalex.org/W4210583889","https://openalex.org/W4226075554","https://openalex.org/W4289950738","https://openalex.org/W4388819614"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052"],"abstract_inverted_index":{"Mismatched":[0],"circuit":[1],"components":[2],"in":[3,57],"analog-to-digital":[4],"converters":[5],"(ADCs)":[6],"caused":[7],"by":[8,26,55],"imperfect":[9],"fabrication":[10],"processes":[11],"significantly":[12],"degrade":[13],"the":[14,37,58],"ADC":[15,30],"performance,":[16],"and":[17],"there":[18],"have":[19],"been":[20],"various":[21],"attempts":[22],"to":[23,47],"address":[24],"this":[25],"carrying":[27],"out":[28],"on-chip":[29,40],"calibration.":[31],"However,":[32],"calibration":[33,50],"accuracy":[34],"suffers":[35],"from":[36],"defects":[38],"of":[39],"circuitry":[41],"(called":[42],"design-for-calibration":[43],"(DfC)":[44],"circuits)":[45],"designed":[46],"facilitate":[48],"those":[49],"processes,":[51],"which":[52],"are":[53],"introduced":[54],"variations":[56],"manufacturing":[59],"process.":[60]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}