{"id":"https://openalex.org/W4399344395","doi":"https://doi.org/10.1587/elex.21.20240247","title":"Frequency dependence of soft error rates induced by alpha-particle and heavy ion","display_name":"Frequency dependence of soft error rates induced by alpha-particle and heavy ion","publication_year":2024,"publication_date":"2024-06-04","ids":{"openalex":"https://openalex.org/W4399344395","doi":"https://doi.org/10.1587/elex.21.20240247"},"language":"en","primary_location":{"id":"doi:10.1587/elex.21.20240247","is_oa":true,"landing_page_url":"http://dx.doi.org/10.1587/elex.21.20240247","pdf_url":"https://www.jstage.jst.go.jp/article/elex/advpub/0/advpub_21.20240247/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/advpub/0/advpub_21.20240247/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5093431332","display_name":"Haruto Sugisaki","orcid":null},"institutions":[{"id":"https://openalex.org/I27429435","display_name":"Kyoto Institute of Technology","ror":"https://ror.org/00965ax52","country_code":"JP","type":"education","lineage":["https://openalex.org/I27429435"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Haruto Sugisaki","raw_affiliation_strings":["Graduate School of Science and Technology, Kyoto Institute of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Science and Technology, Kyoto Institute of Technology","institution_ids":["https://openalex.org/I27429435"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051559347","display_name":"Ryuichi Nakajima","orcid":"https://orcid.org/0000-0003-3121-4098"},"institutions":[{"id":"https://openalex.org/I27429435","display_name":"Kyoto Institute of Technology","ror":"https://ror.org/00965ax52","country_code":"JP","type":"education","lineage":["https://openalex.org/I27429435"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ryuichi Nakajima","raw_affiliation_strings":["Graduate School of Science and Technology, Kyoto Institute of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Science and Technology, Kyoto Institute of Technology","institution_ids":["https://openalex.org/I27429435"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111116120","display_name":"Shotaro Sugitani","orcid":null},"institutions":[{"id":"https://openalex.org/I27429435","display_name":"Kyoto Institute of Technology","ror":"https://ror.org/00965ax52","country_code":"JP","type":"education","lineage":["https://openalex.org/I27429435"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shotaro Sugitani","raw_affiliation_strings":["Graduate School of Science and Technology, Kyoto Institute of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Science and Technology, Kyoto Institute of Technology","institution_ids":["https://openalex.org/I27429435"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050140256","display_name":"Jun Furuta","orcid":"https://orcid.org/0000-0003-0146-3077"},"institutions":[{"id":"https://openalex.org/I193620225","display_name":"Okayama Prefectural University","ror":"https://ror.org/038bgk418","country_code":"JP","type":"education","lineage":["https://openalex.org/I193620225"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Jun Furuta","raw_affiliation_strings":["Graduate School of Computer Science and Systems Engineering, Okayama Prefectural University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Computer Science and Systems Engineering, Okayama Prefectural University","institution_ids":["https://openalex.org/I193620225"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049656449","display_name":"Kazutoshi Kobayashi","orcid":"https://orcid.org/0000-0002-7139-7274"},"institutions":[{"id":"https://openalex.org/I27429435","display_name":"Kyoto Institute of Technology","ror":"https://ror.org/00965ax52","country_code":"JP","type":"education","lineage":["https://openalex.org/I27429435"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kazutoshi Kobayashi","raw_affiliation_strings":["Graduate School of Science and Technology, Kyoto Institute of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Science and Technology, Kyoto Institute of Technology","institution_ids":["https://openalex.org/I27429435"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.052411,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"21","issue":"13","first_page":"20240247","last_page":"20240247"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9927999973297119,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.9026994705200195},{"id":"https://openalex.org/keywords/alpha-particle","display_name":"Alpha particle","score":0.6662633419036865},{"id":"https://openalex.org/keywords/irradiation","display_name":"Irradiation","score":0.5925208330154419},{"id":"https://openalex.org/keywords/alpha","display_name":"Alpha (finance)","score":0.5522642731666565},{"id":"https://openalex.org/keywords/ion","display_name":"Ion","score":0.5271434783935547},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4510672092437744},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.450530081987381},{"id":"https://openalex.org/keywords/atomic-physics","display_name":"Atomic physics","score":0.3595663905143738},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.3551967442035675},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2509187161922455},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.24691727757453918},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.22906869649887085},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20037806034088135},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.19792377948760986},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.19687306880950928},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.06390368938446045}],"concepts":[{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.9026994705200195},{"id":"https://openalex.org/C66385817","wikidata":"https://www.wikidata.org/wiki/Q103517","display_name":"Alpha particle","level":2,"score":0.6662633419036865},{"id":"https://openalex.org/C111337013","wikidata":"https://www.wikidata.org/wiki/Q2737837","display_name":"Irradiation","level":2,"score":0.5925208330154419},{"id":"https://openalex.org/C64943373","wikidata":"https://www.wikidata.org/wiki/Q2651003","display_name":"Alpha (finance)","level":4,"score":0.5522642731666565},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.5271434783935547},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4510672092437744},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.450530081987381},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.3595663905143738},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.3551967442035675},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2509187161922455},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.24691727757453918},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.22906869649887085},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20037806034088135},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.19792377948760986},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.19687306880950928},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.06390368938446045},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C171606756","wikidata":"https://www.wikidata.org/wiki/Q506132","display_name":"Psychometrics","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C49453240","wikidata":"https://www.wikidata.org/wiki/Q1592163","display_name":"Construct validity","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.21.20240247","is_oa":true,"landing_page_url":"http://dx.doi.org/10.1587/elex.21.20240247","pdf_url":"https://www.jstage.jst.go.jp/article/elex/advpub/0/advpub_21.20240247/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.21.20240247","is_oa":true,"landing_page_url":"http://dx.doi.org/10.1587/elex.21.20240247","pdf_url":"https://www.jstage.jst.go.jp/article/elex/advpub/0/advpub_21.20240247/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":false},"content_urls":{"pdf":"https://content.openalex.org/works/W4399344395.pdf"},"referenced_works_count":30,"referenced_works":["https://openalex.org/W1564617507","https://openalex.org/W1968121555","https://openalex.org/W2005559063","https://openalex.org/W2033907418","https://openalex.org/W2036412341","https://openalex.org/W2050431855","https://openalex.org/W2067333289","https://openalex.org/W2098694303","https://openalex.org/W2099569658","https://openalex.org/W2113626924","https://openalex.org/W2117459888","https://openalex.org/W2145341246","https://openalex.org/W2152652532","https://openalex.org/W2153751624","https://openalex.org/W2159884881","https://openalex.org/W2160451204","https://openalex.org/W2165099194","https://openalex.org/W2167002145","https://openalex.org/W2613938152","https://openalex.org/W2769337393","https://openalex.org/W2923710620","https://openalex.org/W2945329967","https://openalex.org/W3036016205","https://openalex.org/W3143421848","https://openalex.org/W3157589653","https://openalex.org/W3208898872","https://openalex.org/W4210389905","https://openalex.org/W4231653049","https://openalex.org/W4376606714","https://openalex.org/W4389389315"],"related_works":["https://openalex.org/W2041615232","https://openalex.org/W975040225","https://openalex.org/W2149032943","https://openalex.org/W2154081718","https://openalex.org/W2167002145","https://openalex.org/W2106281713","https://openalex.org/W2740699258","https://openalex.org/W3207561606","https://openalex.org/W2370528915","https://openalex.org/W2258788639"],"abstract_inverted_index":{"We":[0],"conducted":[1],"a":[2],"study":[3],"on":[4],"the":[5,14,26,32,59,64,82,94],"frequency":[6,61],"dependence":[7],"analysis":[8],"of":[9,18],"soft":[10,36,44,70,85,97],"error":[11,37,71],"rates":[12,38],"using":[13],"test":[15],"circuit":[16,27],"composed":[17],"scan":[19],"flip-flops":[20],"(FFs)":[21],"and":[22],"inverters.":[23],"By":[24],"irradiating":[25],"with":[28,76],"alpha":[29],"particles":[30],"while":[31],"clock":[33],"was":[34,73,90],"running,":[35],"were":[39,49],"measured.":[40],"During":[41],"alpha-particle":[42,103],"irradiation,":[43,69],"errors":[45,53,86,98],"caused":[46,54,87,99],"by":[47,55,88,100],"inverters":[48,89],"almost":[50],"negligible.":[51],"Soft":[52],"FFs":[56,101],"decreases":[57],"as":[58],"operating":[60],"increases.":[62],"On":[63],"other":[65],"hand,":[66],"during":[67],"Ar":[68],"rate":[72],"nearly":[74],"constant":[75],"varying":[77],"frequency.":[78],"This":[79],"is":[80],"because,":[81],"increase":[83],"in":[84,96],"roughly":[91],"equal":[92],"to":[93],"decrease":[95],"unlike":[102],"irradiation.":[104]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}