{"id":"https://openalex.org/W4285302039","doi":"https://doi.org/10.1587/elex.19.20220113","title":"Cable fault and assessment using multiple frequency autoencoder regression-based reflectometry","display_name":"Cable fault and assessment using multiple frequency autoencoder regression-based reflectometry","publication_year":2022,"publication_date":"2022-05-15","ids":{"openalex":"https://openalex.org/W4285302039","doi":"https://doi.org/10.1587/elex.19.20220113"},"language":"en","primary_location":{"id":"doi:10.1587/elex.19.20220113","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.19.20220113","pdf_url":"https://www.jstage.jst.go.jp/article/elex/19/17/19_19.20220113/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/19/17/19_19.20220113/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065303972","display_name":"Si-Shik Jeon","orcid":null},"institutions":[{"id":"https://openalex.org/I198972184","display_name":"Korea Electric Power Corporation (South Korea)","ror":"https://ror.org/04fperw70","country_code":"KR","type":"company","lineage":["https://openalex.org/I198972184"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Si-Shik Jeon","raw_affiliation_strings":["Distribution Department, Korea Electric Power Corporation"],"affiliations":[{"raw_affiliation_string":"Distribution Department, Korea Electric Power Corporation","institution_ids":["https://openalex.org/I198972184"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071919688","display_name":"Jong Man Joung","orcid":null},"institutions":[{"id":"https://openalex.org/I198972184","display_name":"Korea Electric Power Corporation (South Korea)","ror":"https://ror.org/04fperw70","country_code":"KR","type":"company","lineage":["https://openalex.org/I198972184"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jong Man Joung","raw_affiliation_strings":["Smart Distribution Laboratory, Korea Electric Power Corporation Research Institute"],"affiliations":[{"raw_affiliation_string":"Smart Distribution Laboratory, Korea Electric Power Corporation Research Institute","institution_ids":["https://openalex.org/I198972184"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011452143","display_name":"Chun-Kwon Lee","orcid":"https://orcid.org/0000-0002-6711-4817"},"institutions":[{"id":"https://openalex.org/I8991828","display_name":"Pukyong National University","ror":"https://ror.org/0433kqc49","country_code":"KR","type":"education","lineage":["https://openalex.org/I8991828"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Chun-Kwon Lee","raw_affiliation_strings":["Department of Control and Instrumentation Engineering, Pukyong National Univesrity"],"affiliations":[{"raw_affiliation_string":"Department of Control and Instrumentation Engineering, Pukyong National Univesrity","institution_ids":["https://openalex.org/I8991828"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5073894548","display_name":"Young-Dal Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I145808223","display_name":"Hanbat National University","ror":"https://ror.org/00x514t95","country_code":"KR","type":"education","lineage":["https://openalex.org/I145808223"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Young-Dal Kim","raw_affiliation_strings":["Department of Electrical Engineering, Hanbat National University"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Hanbat National University","institution_ids":["https://openalex.org/I145808223"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5065303972"],"corresponding_institution_ids":["https://openalex.org/I198972184"],"apc_list":null,"apc_paid":null,"fwci":0.3659,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.56507648,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"19","issue":"17","first_page":"20220113","last_page":"20220113"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11850","display_name":"Concrete Corrosion and Durability","score":0.9897000193595886,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.7131643891334534},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6999925374984741},{"id":"https://openalex.org/keywords/reflectometry","display_name":"Reflectometry","score":0.6261663436889648},{"id":"https://openalex.org/keywords/power-cable","display_name":"Power cable","score":0.5081355571746826},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4710937440395355},{"id":"https://openalex.org/keywords/transmission","display_name":"Transmission (telecommunications)","score":0.46345967054367065},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.461515873670578},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4582054615020752},{"id":"https://openalex.org/keywords/autoencoder","display_name":"Autoencoder","score":0.4516432285308838},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.44758716225624084},{"id":"https://openalex.org/keywords/artifact","display_name":"Artifact (error)","score":0.4335092604160309},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.22155329585075378},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.2073272168636322},{"id":"https://openalex.org/keywords/time-domain","display_name":"Time domain","score":0.16964322328567505},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1542089879512787},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.08558717370033264}],"concepts":[{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.7131643891334534},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6999925374984741},{"id":"https://openalex.org/C2778925768","wikidata":"https://www.wikidata.org/wiki/Q3454718","display_name":"Reflectometry","level":3,"score":0.6261663436889648},{"id":"https://openalex.org/C2777772068","wikidata":"https://www.wikidata.org/wiki/Q1939150","display_name":"Power cable","level":3,"score":0.5081355571746826},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4710937440395355},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.46345967054367065},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.461515873670578},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4582054615020752},{"id":"https://openalex.org/C101738243","wikidata":"https://www.wikidata.org/wiki/Q786435","display_name":"Autoencoder","level":3,"score":0.4516432285308838},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.44758716225624084},{"id":"https://openalex.org/C2779010991","wikidata":"https://www.wikidata.org/wiki/Q2720909","display_name":"Artifact (error)","level":2,"score":0.4335092604160309},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.22155329585075378},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.2073272168636322},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.16964322328567505},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1542089879512787},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.08558717370033264},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.19.20220113","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.19.20220113","pdf_url":"https://www.jstage.jst.go.jp/article/elex/19/17/19_19.20220113/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.19.20220113","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.19.20220113","pdf_url":"https://www.jstage.jst.go.jp/article/elex/19/17/19_19.20220113/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Climate action","score":0.7900000214576721,"id":"https://metadata.un.org/sdg/13"}],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4285302039.pdf","grobid_xml":"https://content.openalex.org/works/W4285302039.grobid-xml"},"referenced_works_count":29,"referenced_works":["https://openalex.org/W201896007","https://openalex.org/W1969892365","https://openalex.org/W1973276170","https://openalex.org/W1988810190","https://openalex.org/W2020880205","https://openalex.org/W2021863574","https://openalex.org/W2056292031","https://openalex.org/W2100462968","https://openalex.org/W2110338474","https://openalex.org/W2117713441","https://openalex.org/W2134356156","https://openalex.org/W2138613835","https://openalex.org/W2157060392","https://openalex.org/W2166252671","https://openalex.org/W2608539858","https://openalex.org/W2809370667","https://openalex.org/W2885511465","https://openalex.org/W2885912413","https://openalex.org/W2950444251","https://openalex.org/W2963438157","https://openalex.org/W2964432446","https://openalex.org/W2976288931","https://openalex.org/W3007548312","https://openalex.org/W3029307258","https://openalex.org/W3059260488","https://openalex.org/W3102146154","https://openalex.org/W3141301379","https://openalex.org/W3196005134","https://openalex.org/W4293775970"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2003734918","https://openalex.org/W4381889175","https://openalex.org/W2789183689","https://openalex.org/W2369065823","https://openalex.org/W2388820610","https://openalex.org/W2001927016","https://openalex.org/W2362535443","https://openalex.org/W2549099514","https://openalex.org/W4323644115"],"abstract_inverted_index":{"The":[0],"distribution":[1],"cable":[2,34,63,87,125,134],"may":[3],"be":[4,53],"considered":[5],"the":[6,15,77,92,100,127,137,140],"most":[7],"critical":[8],"element":[9],"for":[10,33,61],"power":[11],"system":[12],"operation":[13],"through":[14],"key":[16],"functions":[17],"of":[18,76,84,139],"electricity":[19],"supplement":[20],"and":[21,23,42,80,96,107,126],"control":[22],"instrumentation":[24],"signal":[25,79,94,106,129],"transmission.":[26],"Hence,":[27],"there":[28],"is":[29],"a":[30,59,85,103],"growing":[31],"need":[32],"diagnostic":[35],"techniques":[36],"that":[37],"enable":[38],"accurate":[39],"condition":[40],"monitoring":[41],"fault":[43,121],"detection":[44],"in":[45,123],"cables":[46],"where":[47],"external":[48],"artifact":[49],"signals":[50],"are":[51,88],"to":[52,90],"continuously":[54],"measured.":[55],"This":[56],"research":[57],"presents":[58],"technique":[60],"detecting":[62],"faults":[64],"based":[65],"on":[66,120,131],"autoencoder":[67],"regression-based":[68],"reflectometry":[69],"with":[70],"multiple":[71],"frequency":[72],"sinusoidal":[73],"signals.":[74],"Estimations":[75],"reflected":[78,105,128],"preliminary":[81],"test":[82],"results":[83,119],"non-faulty":[86],"used":[89],"train":[91],"time-series":[93],"reconstruction":[95],"anomaly":[97],"detection,":[98],"allowing":[99],"distinguishment":[101],"between":[102],"fault-induced":[104],"various":[108],"artifacts":[109],"resulting":[110],"from":[111],"noise,":[112],"input":[113],"mismatch,":[114],"or":[115],"other":[116],"factors.":[117],"Experiment":[118],"location":[122],"bypass":[124],"discrimination":[130],"branched":[132],"network":[133],"have":[135],"validated":[136],"usefulness":[138],"proposed":[141],"algorithm.":[142]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2}],"updated_date":"2026-02-25T23:00:34.991745","created_date":"2025-10-10T00:00:00"}