{"id":"https://openalex.org/W4226332131","doi":"https://doi.org/10.1587/elex.19.20220089","title":"A bit-interleaving 12T bitcell with built-in write-assist for sub-threshold SRAM","display_name":"A bit-interleaving 12T bitcell with built-in write-assist for sub-threshold SRAM","publication_year":2022,"publication_date":"2022-04-11","ids":{"openalex":"https://openalex.org/W4226332131","doi":"https://doi.org/10.1587/elex.19.20220089"},"language":"en","primary_location":{"id":"doi:10.1587/elex.19.20220089","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.19.20220089","pdf_url":"https://www.jstage.jst.go.jp/article/elex/19/10/19_19.20220089/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/19/10/19_19.20220089/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033654208","display_name":"Dashan Shi","orcid":"https://orcid.org/0009-0005-7897-1995"},"institutions":[{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Dashan Shi","raw_affiliation_strings":["Institute of Microelectronics of Chinese Academy of Sciences","University of Chinese Academy of Sciences"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I19820366"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027132081","display_name":"Jia Yuan","orcid":"https://orcid.org/0000-0001-7960-9297"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jia Yuan","raw_affiliation_strings":["Institute of Microelectronics of Chinese Academy of Sciences"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022975289","display_name":"Jialu Yin","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jialu Yin","raw_affiliation_strings":["Institute of Microelectronics of Chinese Academy of Sciences","University of Chinese Academy of Sciences"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I19820366"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024308277","display_name":"Yulian Wang","orcid":"https://orcid.org/0000-0003-2328-4766"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yulian Wang","raw_affiliation_strings":["Institute of Microelectronics of Chinese Academy of Sciences","University of Chinese Academy of Sciences"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I19820366"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026870474","display_name":"Shushan Qiao","orcid":"https://orcid.org/0000-0002-9102-2111"},"institutions":[{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shushan Qiao","raw_affiliation_strings":["Institute of Microelectronics of Chinese Academy of Sciences","University of Chinese Academy of Sciences"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I19820366"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210165038"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5033654208"],"corresponding_institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210165038"],"apc_list":null,"apc_paid":null,"fwci":0.3659,"has_fulltext":true,"cited_by_count":4,"citation_normalized_percentile":{"value":0.55797645,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"19","issue":"10","first_page":"20220089","last_page":"20220089"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interleaving","display_name":"Interleaving","score":0.7698513269424438},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7197859883308411},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.6519107818603516},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.559908390045166},{"id":"https://openalex.org/keywords/noise-immunity","display_name":"Noise immunity","score":0.5473194718360901},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.5285034775733948},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4349799156188965},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.4335823357105255},{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.4313088655471802},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.41344940662384033},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13939377665519714},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.11811640858650208},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.07737013697624207}],"concepts":[{"id":"https://openalex.org/C28034677","wikidata":"https://www.wikidata.org/wiki/Q17092530","display_name":"Interleaving","level":2,"score":0.7698513269424438},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7197859883308411},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6519107818603516},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.559908390045166},{"id":"https://openalex.org/C2988494973","wikidata":"https://www.wikidata.org/wiki/Q179448","display_name":"Noise immunity","level":3,"score":0.5473194718360901},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.5285034775733948},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4349799156188965},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.4335823357105255},{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.4313088655471802},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41344940662384033},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13939377665519714},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.11811640858650208},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07737013697624207},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.19.20220089","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.19.20220089","pdf_url":"https://www.jstage.jst.go.jp/article/elex/19/10/19_19.20220089/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.19.20220089","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.19.20220089","pdf_url":"https://www.jstage.jst.go.jp/article/elex/19/10/19_19.20220089/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.7099999785423279,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4226332131.pdf","grobid_xml":"https://content.openalex.org/works/W4226332131.grobid-xml"},"referenced_works_count":36,"referenced_works":["https://openalex.org/W1607087355","https://openalex.org/W1972121063","https://openalex.org/W1979611762","https://openalex.org/W2013638008","https://openalex.org/W2049520384","https://openalex.org/W2067168777","https://openalex.org/W2069909337","https://openalex.org/W2094648661","https://openalex.org/W2095913060","https://openalex.org/W2099087448","https://openalex.org/W2099231065","https://openalex.org/W2101512185","https://openalex.org/W2106339466","https://openalex.org/W2118016286","https://openalex.org/W2132357267","https://openalex.org/W2133614817","https://openalex.org/W2136393784","https://openalex.org/W2144289559","https://openalex.org/W2155323253","https://openalex.org/W2164330002","https://openalex.org/W2167210005","https://openalex.org/W2292603002","https://openalex.org/W2405338193","https://openalex.org/W2544676522","https://openalex.org/W2549127863","https://openalex.org/W2764168195","https://openalex.org/W2789659455","https://openalex.org/W2797104545","https://openalex.org/W2804691385","https://openalex.org/W2892109978","https://openalex.org/W2910883166","https://openalex.org/W2977558241","https://openalex.org/W2996327265","https://openalex.org/W3015213341","https://openalex.org/W3143732588","https://openalex.org/W3151434794"],"related_works":["https://openalex.org/W2461159052","https://openalex.org/W2564993462","https://openalex.org/W1820430086","https://openalex.org/W2119025037","https://openalex.org/W2112208503","https://openalex.org/W2087215413","https://openalex.org/W2534897901","https://openalex.org/W3122096049","https://openalex.org/W2167435539","https://openalex.org/W4226332131"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,70],"half-selected":[4],"robust":[5,19],"12T":[6,16],"bitcell":[7,17,39,85],"with":[8,29,115],"built-in":[9],"write-assist":[10],"for":[11],"sub-threshold":[12,101],"SRAM.":[13],"The":[14,33,45],"proposed":[15,38,84],"is":[18,40,47,86,103,110],"enough":[20],"in":[21,99],"bit-interleaving":[22],"architecture":[23],"to":[24],"enhance":[25],"soft-error":[26],"immunity":[27],"combined":[28],"error":[30],"correction":[31],"code.":[32],"read":[34,43,78],"stability":[35],"of":[36,82,90],"the":[37,77,83,91,96,100,107],"improved":[41,48,111],"by":[42,49,112],"decoupled.":[44],"writability":[46],"data-dependent":[50],"supply-cutoff":[51],"write-assist.":[52],"Both":[53],"row":[54],"and":[55],"column":[56],"f-selected":[57],"bitcells":[58],"can":[59],"hold":[60],"data":[61],"stably":[62],"during":[63],"write":[64,97],"operations.":[65],"Simulation":[66],"results":[67],"based":[68],"on":[69],"standard":[71],"55nm":[72],"CMOS":[73],"technology":[74],"show":[75],"that":[76,89],"static":[79],"noise":[80],"margin":[81],"16.13x":[87],"as":[88],"conventional":[92],"6T":[93,116],"bitcell.":[94,117],"Moreover,":[95],"failure":[98],"region":[102],"eliminated.":[104],"In":[105],"addition,":[106],"leakage":[108],"consumption":[109],"15.7%":[113],"compared":[114]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}