{"id":"https://openalex.org/W4226017795","doi":"https://doi.org/10.1587/elex.19.20220009","title":"Two novel PSRR enhancement techniques for voltage reference of depletion NMOS","display_name":"Two novel PSRR enhancement techniques for voltage reference of depletion NMOS","publication_year":2022,"publication_date":"2022-03-27","ids":{"openalex":"https://openalex.org/W4226017795","doi":"https://doi.org/10.1587/elex.19.20220009"},"language":"en","primary_location":{"id":"doi:10.1587/elex.19.20220009","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.19.20220009","pdf_url":null,"source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://doi.org/10.1587/elex.19.20220009","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101154565","display_name":"Boqi Song","orcid":null},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Boqi Song","raw_affiliation_strings":["Key Laboratory of Ministry of Education for Wide BandGap Semiconductor Materials and Devices, School of Microelectronics, Xidian University"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Ministry of Education for Wide BandGap Semiconductor Materials and Devices, School of Microelectronics, Xidian University","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101574115","display_name":"Changchun Chai","orcid":"https://orcid.org/0000-0003-0612-7777"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Changchun Chai","raw_affiliation_strings":["Key Laboratory of Ministry of Education for Wide BandGap Semiconductor Materials and Devices, School of Microelectronics, Xidian University"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Ministry of Education for Wide BandGap Semiconductor Materials and Devices, School of Microelectronics, Xidian University","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101449089","display_name":"Fuxing Li","orcid":"https://orcid.org/0000-0003-4727-0107"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fuxing Li","raw_affiliation_strings":["Key Laboratory of Ministry of Education for Wide BandGap Semiconductor Materials and Devices, School of Microelectronics, Xidian University"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Ministry of Education for Wide BandGap Semiconductor Materials and Devices, School of Microelectronics, Xidian University","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082493286","display_name":"Chanrong Jiang","orcid":null},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chanrong Jiang","raw_affiliation_strings":["Key Laboratory of Ministry of Education for Wide BandGap Semiconductor Materials and Devices, School of Microelectronics, Xidian University"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Ministry of Education for Wide BandGap Semiconductor Materials and Devices, School of Microelectronics, Xidian University","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100402361","display_name":"Yintang Yang","orcid":"https://orcid.org/0000-0001-9745-5404"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yintang Yang","raw_affiliation_strings":["Key Laboratory of Ministry of Education for Wide BandGap Semiconductor Materials and Devices, School of Microelectronics, Xidian University"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Ministry of Education for Wide BandGap Semiconductor Materials and Devices, School of Microelectronics, Xidian University","institution_ids":["https://openalex.org/I149594827"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5101154565"],"corresponding_institution_ids":["https://openalex.org/I149594827"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0320999,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"19","issue":"8","first_page":"20220009","last_page":"20220009"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/power-supply-rejection-ratio","display_name":"Power supply rejection ratio","score":0.9412397146224976},{"id":"https://openalex.org/keywords/nmos-logic","display_name":"NMOS logic","score":0.7653341293334961},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5706250667572021},{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.5426841378211975},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.47873517870903015},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.4497032165527344},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.37593063712120056},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34313642978668213},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.322736918926239},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2351076900959015},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.06488260626792908},{"id":"https://openalex.org/keywords/switched-mode-power-supply","display_name":"Switched-mode power supply","score":0.05302727222442627}],"concepts":[{"id":"https://openalex.org/C15892472","wikidata":"https://www.wikidata.org/wiki/Q1482413","display_name":"Power supply rejection ratio","level":4,"score":0.9412397146224976},{"id":"https://openalex.org/C197162436","wikidata":"https://www.wikidata.org/wiki/Q83908","display_name":"NMOS logic","level":4,"score":0.7653341293334961},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5706250667572021},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.5426841378211975},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.47873517870903015},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.4497032165527344},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.37593063712120056},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34313642978668213},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.322736918926239},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2351076900959015},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.06488260626792908},{"id":"https://openalex.org/C151799858","wikidata":"https://www.wikidata.org/wiki/Q587008","display_name":"Switched-mode power supply","level":3,"score":0.05302727222442627}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.19.20220009","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.19.20220009","pdf_url":null,"source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.19.20220009","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.19.20220009","pdf_url":null,"source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.5299999713897705,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1860368624","https://openalex.org/W1967680924","https://openalex.org/W1970992322","https://openalex.org/W1988206802","https://openalex.org/W2037385350","https://openalex.org/W2055167838","https://openalex.org/W2055315449","https://openalex.org/W2071500172","https://openalex.org/W2081098752","https://openalex.org/W2083569565","https://openalex.org/W2139801901","https://openalex.org/W2146324717","https://openalex.org/W2197404263","https://openalex.org/W2259742656","https://openalex.org/W2527089532","https://openalex.org/W2590863056","https://openalex.org/W2592861018","https://openalex.org/W2736853361","https://openalex.org/W2744687811","https://openalex.org/W2781806237","https://openalex.org/W2791127224","https://openalex.org/W2802612629","https://openalex.org/W2907678209","https://openalex.org/W2912587933","https://openalex.org/W3010229613"],"related_works":["https://openalex.org/W1970618459","https://openalex.org/W2347289947","https://openalex.org/W2348927557","https://openalex.org/W2388657413","https://openalex.org/W2372624045","https://openalex.org/W2089439291","https://openalex.org/W2487240096","https://openalex.org/W4383335051","https://openalex.org/W2393887177","https://openalex.org/W2366264921"],"abstract_inverted_index":{"Two":[0],"novel":[1,26],"PSRR":[2,15,99,122],"characteristic":[3],"enhancement":[4,47],"technologies":[5,27],"based":[6],"on":[7],"the":[8,55,62,93,98,112,117,124],"voltage":[9,33,37],"reference":[10,34,38,83,95],"(VR)":[11],"is":[12,39,96,106,127],"presented:":[13],"Double-reference":[14],"stacking":[16],"technology":[17,21,58,74],"(DRPST)":[18],"and":[19,45,71],"Pre-regulated-current":[20],"(PRCT).":[22],"The":[23,36,79,121],"above":[24,80],"two":[25,32,81],"are":[28,85],"explained":[29],"by":[30,41],"designing":[31],"structures.":[35],"obtained":[40,102],"a":[42],"depletion":[43],"NMOS":[44],"an":[46],"NMOS.":[48],"Structure":[49,64,104,125],"I":[50,105],"employs":[51],"DRPST":[52,70],"compared":[53],"with":[54,111,132],"traditional":[56],"Pre-regulated-voltage":[57,73],"(PRVT)":[59],"to":[60,76],"improve":[61,77],"PSRR.":[63,78],"II":[65,126],"uses":[66],"PRCT":[67],"composed":[68],"of":[69,100,123],"improved":[72],"(IPRVT)":[75],"structural":[82],"sources":[84],"simulated":[86],"in":[87,103],"standard":[88],"0.18\u00b5m":[89],"CMOS":[90],"process.":[91],"When":[92],"output":[94],"810mV,":[97],"VR":[101],"-140dB@1KHz":[107],"at":[108,129],"TT":[109,130],"corner":[110,131],"line":[113],"sensitivity:":[114],"LS":[115,133],"=0.023%/V,":[116],"temperature":[118],"coefficients:":[119],"TC=4.2ppm/\u00b0C;":[120],"-114dB@1KHz":[128],"=0.013%/V,":[134],"TC":[135],"=7.5ppm/\u00b0C.":[136]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}