{"id":"https://openalex.org/W3203477332","doi":"https://doi.org/10.1587/elex.18.20210345","title":"A short circuit protection circuit for SiC MOSFET with self-adjustive blanking time","display_name":"A short circuit protection circuit for SiC MOSFET with self-adjustive blanking time","publication_year":2021,"publication_date":"2021-09-30","ids":{"openalex":"https://openalex.org/W3203477332","doi":"https://doi.org/10.1587/elex.18.20210345","mag":"3203477332"},"language":"en","primary_location":{"id":"doi:10.1587/elex.18.20210345","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.18.20210345","pdf_url":"https://www.jstage.jst.go.jp/article/elex/18/21/18_18.20210345/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/18/21/18_18.20210345/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100381092","display_name":"Tiantian Liu","orcid":"https://orcid.org/0009-0000-9958-7486"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210147322","display_name":"Shanghai Institute of Microsystem and Information Technology","ror":"https://ror.org/04nytyj38","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210147322"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tiantian Liu","raw_affiliation_strings":["The Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences","The State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"The State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210147322"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069409293","display_name":"Yuhua Quan","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210147322","display_name":"Shanghai Institute of Microsystem and Information Technology","ror":"https://ror.org/04nytyj38","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210147322"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuhua Quan","raw_affiliation_strings":["The Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences","The State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"The State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210147322"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027619016","display_name":"Xuetong Zhou","orcid":"https://orcid.org/0000-0001-9261-5974"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210147322","display_name":"Shanghai Institute of Microsystem and Information Technology","ror":"https://ror.org/04nytyj38","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210147322"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuetong Zhou","raw_affiliation_strings":["The Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences","The State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"The State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210147322"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024072725","display_name":"Yufei Tian","orcid":"https://orcid.org/0009-0009-6145-697X"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210147322","display_name":"Shanghai Institute of Microsystem and Information Technology","ror":"https://ror.org/04nytyj38","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210147322"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yufei Tian","raw_affiliation_strings":["The Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences","The State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"The State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210147322"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046582878","display_name":"Xinhong Cheng","orcid":"https://orcid.org/0000-0001-6235-1728"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210147322","display_name":"Shanghai Institute of Microsystem and Information Technology","ror":"https://ror.org/04nytyj38","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210147322"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinhong Cheng","raw_affiliation_strings":["The Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences","The State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"The State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210147322"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5083547543","display_name":"Xiaoyi Huang","orcid":"https://orcid.org/0000-0003-2209-3052"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210147322","display_name":"Shanghai Institute of Microsystem and Information Technology","ror":"https://ror.org/04nytyj38","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210147322"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoyi Huang","raw_affiliation_strings":["The Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences","The State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"The State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210147322"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2411,"has_fulltext":true,"cited_by_count":6,"citation_normalized_percentile":{"value":0.49576282,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"18","issue":"21","first_page":"20210345","last_page":"20210345"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9927999973297119,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/blanking","display_name":"Blanking","score":0.9029076099395752},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.6485943794250488},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.48194169998168945},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4575388431549072},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4508868157863617},{"id":"https://openalex.org/keywords/switching-time","display_name":"Switching time","score":0.42979976534843445},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4049386978149414},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.38838785886764526},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2983162999153137},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.14926639199256897},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08853352069854736}],"concepts":[{"id":"https://openalex.org/C108710744","wikidata":"https://www.wikidata.org/wiki/Q4134329","display_name":"Blanking","level":2,"score":0.9029076099395752},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.6485943794250488},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.48194169998168945},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4575388431549072},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4508868157863617},{"id":"https://openalex.org/C199310435","wikidata":"https://www.wikidata.org/wiki/Q7659121","display_name":"Switching time","level":2,"score":0.42979976534843445},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4049386978149414},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38838785886764526},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2983162999153137},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.14926639199256897},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08853352069854736}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.18.20210345","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.18.20210345","pdf_url":"https://www.jstage.jst.go.jp/article/elex/18/21/18_18.20210345/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.18.20210345","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.18.20210345","pdf_url":"https://www.jstage.jst.go.jp/article/elex/18/21/18_18.20210345/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.6100000143051147,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G1016576825","display_name":null,"funder_award_id":"No. 12075307","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5281266163","display_name":null,"funder_award_id":"20501110800","funder_id":"https://openalex.org/F4320321885","funder_display_name":"Science and Technology Commission of Shanghai Municipality"},{"id":"https://openalex.org/G6521520877","display_name":null,"funder_award_id":"19511107400","funder_id":"https://openalex.org/F4320321885","funder_display_name":"Science and Technology Commission of Shanghai Municipality"},{"id":"https://openalex.org/G8699232912","display_name":null,"funder_award_id":"12075307","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8842089916","display_name":null,"funder_award_id":"20501110900","funder_id":"https://openalex.org/F4320321885","funder_display_name":"Science and Technology Commission of Shanghai Municipality"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321133","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35"},{"id":"https://openalex.org/F4320321885","display_name":"Science and Technology Commission of Shanghai Municipality","ror":"https://ror.org/03kt66j61"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3203477332.pdf","grobid_xml":"https://content.openalex.org/works/W3203477332.grobid-xml"},"referenced_works_count":30,"referenced_works":["https://openalex.org/W1925960151","https://openalex.org/W1994023440","https://openalex.org/W2005192532","https://openalex.org/W2029699094","https://openalex.org/W2090500509","https://openalex.org/W2171886847","https://openalex.org/W2240237201","https://openalex.org/W2549032450","https://openalex.org/W2572224159","https://openalex.org/W2595546272","https://openalex.org/W2625566746","https://openalex.org/W2768661976","https://openalex.org/W2770856946","https://openalex.org/W2795631262","https://openalex.org/W2802486954","https://openalex.org/W2875668967","https://openalex.org/W2904422334","https://openalex.org/W2910525979","https://openalex.org/W2951050436","https://openalex.org/W2955101024","https://openalex.org/W2985738927","https://openalex.org/W2990232207","https://openalex.org/W2990481466","https://openalex.org/W3006055514","https://openalex.org/W3016428921","https://openalex.org/W3037871168","https://openalex.org/W3095271043","https://openalex.org/W3113537883","https://openalex.org/W3135162212","https://openalex.org/W4241070446"],"related_works":["https://openalex.org/W2769220108","https://openalex.org/W1561295432","https://openalex.org/W2361653788","https://openalex.org/W2382335154","https://openalex.org/W2305556281","https://openalex.org/W2014682279","https://openalex.org/W100176761","https://openalex.org/W1750677583","https://openalex.org/W2169700276","https://openalex.org/W3195233467"],"abstract_inverted_index":{"This":[0],"paper":[1],"proposed":[2,90,96,127],"a":[3,15,149],"desaturation":[4],"(DESAT)":[5],"short":[6],"circuit":[7,10,97,129],"(SC)":[8],"protection":[9,128],"for":[11,35,50,66,133,158,166,194],"SiC":[12,40,79],"MOSFET,":[13],"where":[14],"blanking":[16,48,111],"time":[17,29,49,112],"setting":[18],"module":[19,24],"and":[20,44,70,82,135],"an":[21],"SC":[22],"detection":[23,56,64,123,154,175,192],"are":[25,85],"designed.":[26],"The":[27,92,105,121],"fall":[28],"of":[30,39,78,94,118,125,185],"the":[31,47,51,58,63,75,89,95,101,110,116,126,140,146,153,161,170,174,182,186,191],"drain-source":[32],"voltage":[33],"(VDS)":[34],"each":[36],"switching":[37,53,60,142,163,172,188],"period":[38],"MOSFET":[41],"is":[42,68,98,130,156,177,199],"recorded":[43],"set":[45,131],"as":[46],"hard":[52],"fault":[54,195],"(HSF)":[55],"in":[57,145],"next":[59],"period.":[61,143,164,189],"Consequently,":[62],"delay":[65,124,155,176,193],"HSF":[67,134,159,167],"self-adjustive":[69],"can":[71,136],"respond":[72],"quickly":[73],"to":[74,87,181],"operating":[76,183],"state":[77,184],"MOSFET.":[80],"FPGA":[81],"discrete":[83],"components":[84],"used":[86],"implement":[88],"circuit.":[91],"function":[93],"verified":[99],"using":[100],"double":[102],"pulse":[103],"test.":[104],"experiment":[106],"results":[107],"show":[108],"that":[109],"automatically":[113],"increases":[114],"with":[115],"increase":[117],"load":[119,197],"current.":[120],"default":[122],"240ns":[132,157],"be":[137],"adjusted":[138,179],"during":[139],"subsequent":[141],"So":[144],"test":[147],"under":[148,196],"400V":[150],"bus":[151],"voltage,":[152],"at":[160,169],"first":[162,187],"And":[165],"occurs":[168],"second":[171],"period,":[173],"200ns":[178],"according":[180],"Meanwhile,":[190],"(FUL)":[198],"72ns.":[200]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2026-08-04T08:18:43.703281","created_date":"2025-10-10T00:00:00"}