{"id":"https://openalex.org/W3151398280","doi":"https://doi.org/10.1587/elex.18.20210022","title":"An optimization method for conformal shielding","display_name":"An optimization method for conformal shielding","publication_year":2021,"publication_date":"2021-04-01","ids":{"openalex":"https://openalex.org/W3151398280","doi":"https://doi.org/10.1587/elex.18.20210022","mag":"3151398280"},"language":"en","primary_location":{"id":"doi:10.1587/elex.18.20210022","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.18.20210022","pdf_url":null,"source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://doi.org/10.1587/elex.18.20210022","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5053885217","display_name":"Jian Yuan","orcid":"https://orcid.org/0000-0001-9787-3016"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jian Yuan","raw_affiliation_strings":["Department of Microelectronic, University of Science and Technology of China"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronic, University of Science and Technology of China","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100361950","display_name":"Jun Li","orcid":"https://orcid.org/0000-0002-8122-764X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jun Li","raw_affiliation_strings":["Microsystem Packaging Research Center, Institute of Microelectronics of Chinese Academy of Sciences"],"affiliations":[{"raw_affiliation_string":"Microsystem Packaging Research Center, Institute of Microelectronics of Chinese Academy of Sciences","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112118484","display_name":"Jia Cao","orcid":null},"institutions":[{"id":"https://openalex.org/I4387153688","display_name":"Beijing Institute of Radio Metrology and Measurement","ror":"https://ror.org/02c8ctc21","country_code":null,"type":"company","lineage":["https://openalex.org/I15089104","https://openalex.org/I4387153688"]},{"id":"https://openalex.org/I4210091171","display_name":"Beijing Zhenxing Metrology & Measurement Institute","ror":"https://ror.org/00cd12q64","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210091171"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jia Cao","raw_affiliation_strings":["Beijing Institute of Radio Measurement"],"affiliations":[{"raw_affiliation_string":"Beijing Institute of Radio Measurement","institution_ids":["https://openalex.org/I4210091171","https://openalex.org/I4387153688"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103003628","display_name":"Pengwei Chen","orcid":"https://orcid.org/0000-0003-4461-6192"},"institutions":[{"id":"https://openalex.org/I4387153688","display_name":"Beijing Institute of Radio Metrology and Measurement","ror":"https://ror.org/02c8ctc21","country_code":null,"type":"company","lineage":["https://openalex.org/I15089104","https://openalex.org/I4387153688"]},{"id":"https://openalex.org/I4210091171","display_name":"Beijing Zhenxing Metrology & Measurement Institute","ror":"https://ror.org/00cd12q64","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210091171"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pengwei Chen","raw_affiliation_strings":["Beijing Institute of Radio Measurement"],"affiliations":[{"raw_affiliation_string":"Beijing Institute of Radio Measurement","institution_ids":["https://openalex.org/I4210091171","https://openalex.org/I4387153688"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083314215","display_name":"Liqiang Cao","orcid":"https://orcid.org/0000-0002-0859-1437"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liqiang Cao","raw_affiliation_strings":["Institute of Microelectronics of Chinese Academy of Sciences"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I19820366"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008918891","display_name":"Tianchun Ye","orcid":"https://orcid.org/0000-0002-2384-9037"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianchun Ye","raw_affiliation_strings":["Institute of Microelectronics of Chinese Academy of Sciences"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I19820366"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5053885217"],"corresponding_institution_ids":["https://openalex.org/I126520041"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.0283202,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"18","issue":"9","first_page":"20210022","last_page":"20210022"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11383","display_name":"Advanced Antenna and Metasurface Technologies","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromagnetic-shielding","display_name":"Electromagnetic shielding","score":0.9568729400634766},{"id":"https://openalex.org/keywords/emi","display_name":"EMI","score":0.7735942602157593},{"id":"https://openalex.org/keywords/conformal-map","display_name":"Conformal map","score":0.7323135733604431},{"id":"https://openalex.org/keywords/taguchi-methods","display_name":"Taguchi methods","score":0.7081613540649414},{"id":"https://openalex.org/keywords/electromagnetic-interference","display_name":"Electromagnetic interference","score":0.5873933434486389},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4451608657836914},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.4333338439464569},{"id":"https://openalex.org/keywords/interference","display_name":"Interference (communication)","score":0.42835739254951477},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.42234572768211365},{"id":"https://openalex.org/keywords/shields","display_name":"Shields","score":0.4182884395122528},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3212640881538391},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.242020845413208},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24022486805915833},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.18374103307724},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10737937688827515},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10734376311302185},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.07305923104286194}],"concepts":[{"id":"https://openalex.org/C2265751","wikidata":"https://www.wikidata.org/wiki/Q332007","display_name":"Electromagnetic shielding","level":2,"score":0.9568729400634766},{"id":"https://openalex.org/C43461449","wikidata":"https://www.wikidata.org/wiki/Q2495531","display_name":"EMI","level":3,"score":0.7735942602157593},{"id":"https://openalex.org/C98214594","wikidata":"https://www.wikidata.org/wiki/Q850275","display_name":"Conformal map","level":2,"score":0.7323135733604431},{"id":"https://openalex.org/C83469408","wikidata":"https://www.wikidata.org/wiki/Q2036525","display_name":"Taguchi methods","level":2,"score":0.7081613540649414},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.5873933434486389},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4451608657836914},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.4333338439464569},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.42835739254951477},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42234572768211365},{"id":"https://openalex.org/C109589588","wikidata":"https://www.wikidata.org/wiki/Q2253638","display_name":"Shields","level":3,"score":0.4182884395122528},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3212640881538391},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.242020845413208},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24022486805915833},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.18374103307724},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10737937688827515},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10734376311302185},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.07305923104286194},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.18.20210022","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.18.20210022","pdf_url":null,"source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.18.20210022","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.18.20210022","pdf_url":null,"source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W1980603120","https://openalex.org/W1983781231","https://openalex.org/W2018647808","https://openalex.org/W2020369592","https://openalex.org/W2027920508","https://openalex.org/W2030499947","https://openalex.org/W2034133210","https://openalex.org/W2035974187","https://openalex.org/W2054754736","https://openalex.org/W2064866226","https://openalex.org/W2064992046","https://openalex.org/W2099399130","https://openalex.org/W2102424143","https://openalex.org/W2103410780","https://openalex.org/W2162765756","https://openalex.org/W2165850579","https://openalex.org/W2186487576","https://openalex.org/W2293740169","https://openalex.org/W2320203879","https://openalex.org/W2508069533","https://openalex.org/W2541776642","https://openalex.org/W2543221357","https://openalex.org/W2567092256","https://openalex.org/W2621288559","https://openalex.org/W2765924381","https://openalex.org/W2766103956","https://openalex.org/W2772796504","https://openalex.org/W2774550592","https://openalex.org/W2783237744","https://openalex.org/W2810442844","https://openalex.org/W2811415601","https://openalex.org/W2898924266","https://openalex.org/W2900238297","https://openalex.org/W2968886928"],"related_works":["https://openalex.org/W76001227","https://openalex.org/W2349537384","https://openalex.org/W1986241886","https://openalex.org/W2041511579","https://openalex.org/W3120066331","https://openalex.org/W2549052135","https://openalex.org/W4385545073","https://openalex.org/W1921091955","https://openalex.org/W2163032211","https://openalex.org/W3008464350"],"abstract_inverted_index":{"Conformal":[0],"shielding,":[1],"as":[2],"an":[3],"efficient":[4],"method":[5,22,76],"for":[6],"solving":[7],"the":[8,20,29,39,42,45,74,89,94],"electromagnetic":[9],"interference":[10],"(EMI)":[11],"problem,":[12],"is":[13,77],"becoming":[14],"increasingly":[15],"important.":[16],"In":[17],"this":[18],"Letter,":[19],"Taguchi":[21],"in":[23],"quality":[24],"engineering":[25],"was":[26,86,91],"introduced":[27],"into":[28],"design":[30],"optimization":[31,75],"of":[32,44,47,84],"conformal":[33],"shielding.":[34],"As":[35],"a":[36,100,113],"pilot":[37],"test,":[38],"authors":[40],"studied":[41],"order":[43],"effects":[46],"shielding":[48,51,61,106,110],"layer":[49,52],"material,":[50],"thickness,":[53],"and":[54,69,79,88,104,108],"distance":[55],"between":[56,66],"ground":[57],"vias":[58],"(D-via)":[59],"on":[60],"effectiveness":[62,107,111],"(SE).":[63],"The":[64,81],"comparison":[65],"simulated":[67,109],"results":[68,71],"predicted":[70],"proves":[72],"that":[73],"accurate":[78],"effective.":[80],"thin-film":[82],"conductivity":[83],"copper":[85],"measured,":[87],"model":[90],"revised":[92],"using":[93],"measurement":[95],"results.":[96],"For":[97],"validation,":[98],"built":[99],"near-field":[101],"scanning":[102],"platform,":[103],"measured":[105],"show":[112],"good":[114],"agreement":[115],"from":[116],"0.1":[117],"to":[118],"7.5":[119],"GHz.":[120]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}