{"id":"https://openalex.org/W3047139630","doi":"https://doi.org/10.1587/elex.17.20200211","title":"Optimization of spacer and source/channel junction to improve TFET characteristics","display_name":"Optimization of spacer and source/channel junction to improve TFET characteristics","publication_year":2020,"publication_date":"2020-08-05","ids":{"openalex":"https://openalex.org/W3047139630","doi":"https://doi.org/10.1587/elex.17.20200211","mag":"3047139630"},"language":"en","primary_location":{"id":"doi:10.1587/elex.17.20200211","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.17.20200211","pdf_url":"https://www.jstage.jst.go.jp/article/elex/17/17/17_17.20200211/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/17/17/17_17.20200211/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101886657","display_name":"Garam Kim","orcid":"https://orcid.org/0000-0001-6517-7120"},"institutions":[{"id":"https://openalex.org/I89440247","display_name":"Myongji University","ror":"https://ror.org/00s9dpb54","country_code":"KR","type":"education","lineage":["https://openalex.org/I89440247"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Garam Kim","raw_affiliation_strings":["Dept. of Electronic Engineering, Myongji University"],"affiliations":[{"raw_affiliation_string":"Dept. of Electronic Engineering, Myongji University","institution_ids":["https://openalex.org/I89440247"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002184891","display_name":"Jang-Hyun Kim","orcid":"https://orcid.org/0000-0001-5222-4004"},"institutions":[{"id":"https://openalex.org/I8991828","display_name":"Pukyong National University","ror":"https://ror.org/0433kqc49","country_code":"KR","type":"education","lineage":["https://openalex.org/I8991828"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"JangHyun Kim","raw_affiliation_strings":["School of Electrical Engineering, Pukyong National University"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Pukyong National University","institution_ids":["https://openalex.org/I8991828"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063522085","display_name":"Sangwan Kim","orcid":"https://orcid.org/0000-0002-6492-7740"},"institutions":[{"id":"https://openalex.org/I57664883","display_name":"Ajou University","ror":"https://ror.org/03tzb2h73","country_code":"KR","type":"education","lineage":["https://openalex.org/I57664883"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sangwan Kim","raw_affiliation_strings":["Dept. of Electrical and Computer Engineering, Ajou University"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, Ajou University","institution_ids":["https://openalex.org/I57664883"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5101886657"],"corresponding_institution_ids":["https://openalex.org/I89440247"],"apc_list":null,"apc_paid":null,"fwci":0.104,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.42684749,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"17","issue":"17","first_page":"20200211","last_page":"20200211"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.6522091627120972},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5504603385925293},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5249649882316589},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41258472204208374},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.37972694635391235},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3321087956428528},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23546358942985535},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.22833910584449768}],"concepts":[{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.6522091627120972},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5504603385925293},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5249649882316589},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41258472204208374},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37972694635391235},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3321087956428528},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23546358942985535},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.22833910584449768}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.17.20200211","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.17.20200211","pdf_url":"https://www.jstage.jst.go.jp/article/elex/17/17/17_17.20200211/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.17.20200211","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.17.20200211","pdf_url":"https://www.jstage.jst.go.jp/article/elex/17/17/17_17.20200211/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6399999856948853}],"awards":[{"id":"https://openalex.org/G1097130685","display_name":null,"funder_award_id":"NRF-2019M3F3A1A02072091","funder_id":"https://openalex.org/F4320328359","funder_display_name":"Ministry of Science and ICT, South Korea"},{"id":"https://openalex.org/G147736693","display_name":null,"funder_award_id":"10080575","funder_id":"https://openalex.org/F4320321681","funder_display_name":"Ministry of Trade, Industry and Energy"},{"id":"https://openalex.org/G2249671058","display_name":null,"funder_award_id":"NRF-2019M3F3A1A03079739","funder_id":"https://openalex.org/F4320328359","funder_display_name":"Ministry of Science and ICT, South Korea"},{"id":"https://openalex.org/G992484961","display_name":null,"funder_award_id":"Korea","funder_id":"https://openalex.org/F4320321681","funder_display_name":"Ministry of Trade, Industry and Energy"}],"funders":[{"id":"https://openalex.org/F4320321279","display_name":"Myongji University","ror":"https://ror.org/00s9dpb54"},{"id":"https://openalex.org/F4320321681","display_name":"Ministry of Trade, Industry and Energy","ror":"https://ror.org/008nkqk13"},{"id":"https://openalex.org/F4320322202","display_name":"IC Design Education Center","ror":"https://ror.org/005v57z85"},{"id":"https://openalex.org/F4320328359","display_name":"Ministry of Science and ICT, South Korea","ror":"https://ror.org/01wpjm123"},{"id":"https://openalex.org/F4320330746","display_name":"Korea Semiconductor Research Consortium","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3047139630.pdf","grobid_xml":"https://content.openalex.org/works/W3047139630.grobid-xml"},"referenced_works_count":29,"referenced_works":["https://openalex.org/W1540771715","https://openalex.org/W1921268005","https://openalex.org/W1987289463","https://openalex.org/W2014899760","https://openalex.org/W2026617335","https://openalex.org/W2032197740","https://openalex.org/W2040389404","https://openalex.org/W2073932165","https://openalex.org/W2082052072","https://openalex.org/W2082111293","https://openalex.org/W2101317125","https://openalex.org/W2110584581","https://openalex.org/W2126810113","https://openalex.org/W2132673123","https://openalex.org/W2142148560","https://openalex.org/W2156696223","https://openalex.org/W2163114807","https://openalex.org/W2165877808","https://openalex.org/W2167420110","https://openalex.org/W2290702954","https://openalex.org/W2305410567","https://openalex.org/W2337712486","https://openalex.org/W2512119884","https://openalex.org/W2542804323","https://openalex.org/W2543701182","https://openalex.org/W2546016377","https://openalex.org/W2606633796","https://openalex.org/W2914499274","https://openalex.org/W3007636942"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W4246450666","https://openalex.org/W4388998267","https://openalex.org/W2898370298","https://openalex.org/W2137437058","https://openalex.org/W4390401159","https://openalex.org/W2744391499","https://openalex.org/W3120461830","https://openalex.org/W4230250635","https://openalex.org/W3041790586"],"abstract_inverted_index":{"As":[0,32],"the":[1,13,17,20,50,58,64,67,81,101],"electrical":[2],"characteristics":[3,84],"of":[4,22,42,53,66,93,100],"tunnel":[5],"field-effect":[6],"transistors":[7],"(TFETs)":[8],"are":[9,25],"greatly":[10],"influenced":[11],"by":[12,27,47,88],"source":[14,59],"junction":[15,60],"and":[16],"gate":[18,95],"spacer,":[19,103],"effects":[21],"these":[23],"parameters":[24],"analyzed":[26],"technology":[28],"computer-aided":[29],"design":[30],"simulation.":[31],"a":[33,97],"result,":[34],"it":[35,71],"is":[36,72,85,104],"found":[37],"that":[38,74],"an":[39,54,75,91],"ON-state":[40],"current":[41],"TFETs":[43],"can":[44],"be":[45],"improved":[46],"+161.8%":[48],"through":[49],"high-\u03ba":[51,102],"spacer":[52],"appropriate":[55],"length":[56],"when":[57],"does":[61],"not":[62],"overlap":[63],"edge":[65],"spacer.":[68],"In":[69],"addition,":[70],"confirmed":[73],"intrinsic":[76],"delay":[77],"time":[78],"which":[79],"determines":[80],"high":[82],"frequency":[83],"also":[86],"reduced":[87],"-65.9%":[89],"because":[90],"increase":[92],"entire":[94],"capacitance,":[96],"side":[98],"effect":[99],"negligible.":[105]},"counts_by_year":[{"year":2022,"cited_by_count":1}],"updated_date":"2026-04-10T15:06:20.359241","created_date":"2025-10-10T00:00:00"}