{"id":"https://openalex.org/W3015873353","doi":"https://doi.org/10.1587/elex.17.20200102","title":"Study on the single-event upset sensitivity of 65-nm CMOS sequential logic circuit","display_name":"Study on the single-event upset sensitivity of 65-nm CMOS sequential logic circuit","publication_year":2020,"publication_date":"2020-04-09","ids":{"openalex":"https://openalex.org/W3015873353","doi":"https://doi.org/10.1587/elex.17.20200102","mag":"3015873353"},"language":"en","primary_location":{"id":"doi:10.1587/elex.17.20200102","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.17.20200102","pdf_url":"https://www.jstage.jst.go.jp/article/elex/17/10/17_17.20200102/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/17/10/17_17.20200102/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102707439","display_name":"Sai Li","orcid":"https://orcid.org/0009-0007-4704-8254"},"institutions":[{"id":"https://openalex.org/I4210115570","display_name":"National Space Science Center","ror":"https://ror.org/02nnjtm50","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210115570"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Sai LI","raw_affiliation_strings":["National Space Science Center, Chinese Academy of Sciences","University of Chinese Academy of Sciences"],"affiliations":[{"raw_affiliation_string":"National Space Science Center, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210115570","https://openalex.org/I19820366"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101681481","display_name":"Jianwei Han","orcid":"https://orcid.org/0000-0003-3312-3827"},"institutions":[{"id":"https://openalex.org/I4210115570","display_name":"National Space Science Center","ror":"https://ror.org/02nnjtm50","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210115570"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianwei HAN","raw_affiliation_strings":["National Space Science Center, Chinese Academy of Sciences"],"affiliations":[{"raw_affiliation_string":"National Space Science Center, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210115570","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009905577","display_name":"Rui Chen","orcid":"https://orcid.org/0000-0002-3327-5129"},"institutions":[{"id":"https://openalex.org/I4210115570","display_name":"National Space Science Center","ror":"https://ror.org/02nnjtm50","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210115570"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Rui CHEN","raw_affiliation_strings":["National Space Science Center, Chinese Academy of Sciences"],"affiliations":[{"raw_affiliation_string":"National Space Science Center, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210115570","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023387811","display_name":"Shipeng Shangguan","orcid":"https://orcid.org/0000-0002-5463-4944"},"institutions":[{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]},{"id":"https://openalex.org/I4210115570","display_name":"National Space Science Center","ror":"https://ror.org/02nnjtm50","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210115570"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shipeng SHANGGUAN","raw_affiliation_strings":["National Space Science Center, Chinese Academy of Sciences","University of Chinese Academy of Sciences"],"affiliations":[{"raw_affiliation_string":"National Space Science Center, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210115570","https://openalex.org/I19820366"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101150032","display_name":"Yingqi Ma","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210115570","display_name":"National Space Science Center","ror":"https://ror.org/02nnjtm50","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210115570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yingqi MA","raw_affiliation_strings":["National Space Science Center, Chinese Academy of Sciences"],"affiliations":[{"raw_affiliation_string":"National Space Science Center, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210115570","https://openalex.org/I19820366"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100329059","display_name":"Xuan Wang","orcid":"https://orcid.org/0009-0008-3242-5843"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210115570","display_name":"National Space Science Center","ror":"https://ror.org/02nnjtm50","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210115570"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuan WANG","raw_affiliation_strings":["National Space Science Center, Chinese Academy of Sciences","University of Chinese Academy of Sciences"],"affiliations":[{"raw_affiliation_string":"National Space Science Center, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210115570","https://openalex.org/I19820366"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210165038"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5102707439"],"corresponding_institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210115570","https://openalex.org/I4210165038"],"apc_list":null,"apc_paid":null,"fwci":0.312,"has_fulltext":true,"cited_by_count":3,"citation_normalized_percentile":{"value":0.55863056,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"17","issue":"10","first_page":"20200102","last_page":"20200102"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9922999739646912,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9879000186920166,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.729071855545044},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6871151924133301},{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.6723377704620361},{"id":"https://openalex.org/keywords/flip-flop","display_name":"Flip-flop","score":0.6414583325386047},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.6214486956596375},{"id":"https://openalex.org/keywords/reset","display_name":"Reset (finance)","score":0.5848526954650879},{"id":"https://openalex.org/keywords/sequential-logic","display_name":"Sequential logic","score":0.5423086881637573},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.5354084968566895},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.520560085773468},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5047847032546997},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5026919841766357},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49939560890197754},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.48519399762153625},{"id":"https://openalex.org/keywords/pass-transistor-logic","display_name":"Pass transistor logic","score":0.4845392107963562},{"id":"https://openalex.org/keywords/asynchronous-circuit","display_name":"Asynchronous circuit","score":0.4716809391975403},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.40410780906677246},{"id":"https://openalex.org/keywords/clock-signal","display_name":"Clock signal","score":0.37883222103118896},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.37529969215393066},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.34086453914642334},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2929345369338989},{"id":"https://openalex.org/keywords/synchronous-circuit","display_name":"Synchronous circuit","score":0.2544758915901184},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.15723031759262085}],"concepts":[{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.729071855545044},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6871151924133301},{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.6723377704620361},{"id":"https://openalex.org/C2781007278","wikidata":"https://www.wikidata.org/wiki/Q183406","display_name":"Flip-flop","level":3,"score":0.6414583325386047},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.6214486956596375},{"id":"https://openalex.org/C2779795794","wikidata":"https://www.wikidata.org/wiki/Q7315343","display_name":"Reset (finance)","level":2,"score":0.5848526954650879},{"id":"https://openalex.org/C187075797","wikidata":"https://www.wikidata.org/wiki/Q173245","display_name":"Sequential logic","level":3,"score":0.5423086881637573},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.5354084968566895},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.520560085773468},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5047847032546997},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5026919841766357},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49939560890197754},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.48519399762153625},{"id":"https://openalex.org/C198521697","wikidata":"https://www.wikidata.org/wiki/Q7142438","display_name":"Pass transistor logic","level":4,"score":0.4845392107963562},{"id":"https://openalex.org/C87695204","wikidata":"https://www.wikidata.org/wiki/Q629971","display_name":"Asynchronous circuit","level":5,"score":0.4716809391975403},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.40410780906677246},{"id":"https://openalex.org/C137059387","wikidata":"https://www.wikidata.org/wiki/Q426882","display_name":"Clock signal","level":3,"score":0.37883222103118896},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.37529969215393066},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.34086453914642334},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2929345369338989},{"id":"https://openalex.org/C42196554","wikidata":"https://www.wikidata.org/wiki/Q1186179","display_name":"Synchronous circuit","level":4,"score":0.2544758915901184},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.15723031759262085},{"id":"https://openalex.org/C106159729","wikidata":"https://www.wikidata.org/wiki/Q2294553","display_name":"Financial economics","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.17.20200102","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.17.20200102","pdf_url":"https://www.jstage.jst.go.jp/article/elex/17/10/17_17.20200102/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.17.20200102","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.17.20200102","pdf_url":"https://www.jstage.jst.go.jp/article/elex/17/10/17_17.20200102/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1899497602","display_name":null,"funder_award_id":"11705228","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2522998853","display_name":null,"funder_award_id":"11705","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4050251356","display_name":null,"funder_award_id":"11875060","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5750351953","display_name":null,"funder_award_id":"81100002","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6155111189","display_name":null,"funder_award_id":"Z181100002918004","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320324150","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11"}],"has_content":{"grobid_xml":false,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3015873353.pdf"},"referenced_works_count":29,"referenced_works":["https://openalex.org/W1819167510","https://openalex.org/W1964582992","https://openalex.org/W2026546398","https://openalex.org/W2030501553","https://openalex.org/W2062980181","https://openalex.org/W2090290079","https://openalex.org/W2098014430","https://openalex.org/W2117391934","https://openalex.org/W2134490163","https://openalex.org/W2140594265","https://openalex.org/W2141068710","https://openalex.org/W2141374144","https://openalex.org/W2144309898","https://openalex.org/W2151691428","https://openalex.org/W2156937100","https://openalex.org/W2159544924","https://openalex.org/W2161251808","https://openalex.org/W2161890495","https://openalex.org/W2165911142","https://openalex.org/W2167123894","https://openalex.org/W2213956287","https://openalex.org/W2225082889","https://openalex.org/W2322902720","https://openalex.org/W2542668855","https://openalex.org/W2620728949","https://openalex.org/W2744409550","https://openalex.org/W2969523181","https://openalex.org/W2985145334","https://openalex.org/W4247573167"],"related_works":["https://openalex.org/W2102538861","https://openalex.org/W2765704306","https://openalex.org/W2123934961","https://openalex.org/W1540420234","https://openalex.org/W2161646799","https://openalex.org/W2359969304","https://openalex.org/W2086616086","https://openalex.org/W764628369","https://openalex.org/W1502430142","https://openalex.org/W2954273405"],"abstract_inverted_index":{"This":[0],"study":[1],"uses":[2],"a":[3,11,16,34],"pulsed":[4],"laser":[5],"to":[6,15,86,110,124],"investigate":[7],"the":[8,49,52,56,70,76,79,87,104,113,118,127,133],"sensitivity":[9,77],"of":[10,55,72,78,89,136],"sequential":[12,30,80],"logic":[13,31,81,97],"circuit":[14,26,32,57,82,106,120],"Single-Event-Upset":[17],"(SEU)":[18],"under":[19],"different":[20],"supply":[21],"voltages,":[22],"clock":[23,73],"frequencies,":[24],"and":[25,59,141],"architectures.":[27],"The":[28,44],"experimented":[29],"is":[33,83,107,121],"D":[35],"flip-flop":[36],"chain":[37],"manufactured":[38],"in":[39,60,95],"65-nm":[40],"bulk":[41],"CMOS":[42],"technology.":[43],"results":[45],"indicate":[46],"that":[47,92],"as":[48],"voltage":[50,64],"decreases,":[51],"SEU":[53,137],"sensibility":[54],"increases,":[58],"particular":[61],"at":[62],"low":[63],"ranges,":[65],"it":[66],"increases":[67],"significantly.":[68],"Additionally,":[69],"effect":[71],"frequency":[74],"on":[75],"mainly":[84],"related":[85],"propagation":[88],"Single-Event-Transients":[90],"(SETs)":[91],"are":[93,143],"generated":[94],"combinational":[96],"circuits.":[98],"It":[99],"was":[100],"also":[101],"found":[102],"that,":[103],"Set-architecture":[105],"more":[108,122],"sensitive":[109,123],"SEUs":[111,125],"during":[112,126],"data":[114,128],"\u201c0\u201d":[115],"test,":[116],"while":[117],"Reset-architecture":[119],"\u201c1\u201d":[129],"test.":[130],"In":[131],"addition,":[132],"failure":[134],"mechanisms":[135],"induced":[138],"by":[139],"Set-structure":[140],"Reset-structure":[142],"revealed":[144],"using":[145],"SPICE":[146],"simulations.":[147]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-04-21T08:09:41.155169","created_date":"2025-10-10T00:00:00"}