{"id":"https://openalex.org/W2999082775","doi":"https://doi.org/10.1587/elex.17.20190708","title":"MSIFF: A radiation-hardened flip-flop via interleaving master-slave stage layout topology","display_name":"MSIFF: A radiation-hardened flip-flop via interleaving master-slave stage layout topology","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W2999082775","doi":"https://doi.org/10.1587/elex.17.20190708","mag":"2999082775"},"language":"en","primary_location":{"id":"doi:10.1587/elex.17.20190708","is_oa":true,"landing_page_url":"http://doi.org/10.1587/elex.17.20190708","pdf_url":"https://www.jstage.jst.go.jp/article/elex/17/4/17_17.20190708/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/17/4/17_17.20190708/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061502069","display_name":"Ruiqiang Song","orcid":"https://orcid.org/0000-0002-6171-343X"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ruiqiang Song","raw_affiliation_strings":["College of Computer, National University of Defense Technology","College of Computer, National University of Defense Technology, Changsha, Hunan 410073, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Computer, National University of Defense Technology","institution_ids":["https://openalex.org/I170215575"]},{"raw_affiliation_string":"College of Computer, National University of Defense Technology, Changsha, Hunan 410073, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051341393","display_name":"Jinjin Shao","orcid":"https://orcid.org/0000-0002-5169-5143"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jinjin Shao","raw_affiliation_strings":["College of Computer, National University of Defense Technology","College of Computer, National University of Defense Technology, Changsha, Hunan 410073, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Computer, National University of Defense Technology","institution_ids":["https://openalex.org/I170215575"]},{"raw_affiliation_string":"College of Computer, National University of Defense Technology, Changsha, Hunan 410073, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032898373","display_name":"Bin Liang","orcid":"https://orcid.org/0000-0003-2655-9024"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bin Liang","raw_affiliation_strings":["College of Computer, National University of Defense Technology","College of Computer, National University of Defense Technology, Changsha, Hunan 410073, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Computer, National University of Defense Technology","institution_ids":["https://openalex.org/I170215575"]},{"raw_affiliation_string":"College of Computer, National University of Defense Technology, Changsha, Hunan 410073, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073182850","display_name":"Yaqing Chi","orcid":"https://orcid.org/0000-0001-9299-963X"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yaqing Chi","raw_affiliation_strings":["College of Computer, National University of Defense Technology","College of Computer, National University of Defense Technology, Changsha, Hunan 410073, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Computer, National University of Defense Technology","institution_ids":["https://openalex.org/I170215575"]},{"raw_affiliation_string":"College of Computer, National University of Defense Technology, Changsha, Hunan 410073, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5072504836","display_name":"Jianjun Chen","orcid":"https://orcid.org/0000-0003-0734-1660"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianjun Chen","raw_affiliation_strings":["College of Computer, National University of Defense Technology","College of Computer, National University of Defense Technology, Changsha, Hunan 410073, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Computer, National University of Defense Technology","institution_ids":["https://openalex.org/I170215575"]},{"raw_affiliation_string":"College of Computer, National University of Defense Technology, Changsha, Hunan 410073, China","institution_ids":["https://openalex.org/I170215575"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5051341393"],"corresponding_institution_ids":["https://openalex.org/I170215575"],"apc_list":null,"apc_paid":null,"fwci":0.5047,"has_fulltext":true,"cited_by_count":6,"citation_normalized_percentile":{"value":0.62502604,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"17","issue":"4","first_page":"20190708","last_page":"20190708"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interleaving","display_name":"Interleaving","score":0.8412151336669922},{"id":"https://openalex.org/keywords/flip-flop","display_name":"Flip-flop","score":0.7889049053192139},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.566144585609436},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49927425384521484},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3934212327003479},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26583823561668396},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2447463870048523},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.13320854306221008}],"concepts":[{"id":"https://openalex.org/C28034677","wikidata":"https://www.wikidata.org/wiki/Q17092530","display_name":"Interleaving","level":2,"score":0.8412151336669922},{"id":"https://openalex.org/C2781007278","wikidata":"https://www.wikidata.org/wiki/Q183406","display_name":"Flip-flop","level":3,"score":0.7889049053192139},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.566144585609436},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49927425384521484},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3934212327003479},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26583823561668396},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2447463870048523},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.13320854306221008}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.17.20190708","is_oa":true,"landing_page_url":"http://doi.org/10.1587/elex.17.20190708","pdf_url":"https://www.jstage.jst.go.jp/article/elex/17/4/17_17.20190708/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.17.20190708","is_oa":true,"landing_page_url":"http://doi.org/10.1587/elex.17.20190708","pdf_url":"https://www.jstage.jst.go.jp/article/elex/17/4/17_17.20190708/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G966777091","display_name":null,"funder_award_id":"61804180","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2999082775.pdf","grobid_xml":"https://content.openalex.org/works/W2999082775.grobid-xml"},"referenced_works_count":31,"referenced_works":["https://openalex.org/W1806232489","https://openalex.org/W1964582992","https://openalex.org/W1971476921","https://openalex.org/W1989361845","https://openalex.org/W1990742079","https://openalex.org/W1991338198","https://openalex.org/W2009925007","https://openalex.org/W2023659251","https://openalex.org/W2038480737","https://openalex.org/W2050431855","https://openalex.org/W2067084020","https://openalex.org/W2083664225","https://openalex.org/W2087826268","https://openalex.org/W2090290079","https://openalex.org/W2103902557","https://openalex.org/W2117061601","https://openalex.org/W2118998611","https://openalex.org/W2125067114","https://openalex.org/W2127884935","https://openalex.org/W2131796616","https://openalex.org/W2141068710","https://openalex.org/W2159674660","https://openalex.org/W2164818635","https://openalex.org/W2182428120","https://openalex.org/W2253565765","https://openalex.org/W2262638933","https://openalex.org/W2271074167","https://openalex.org/W2277344369","https://openalex.org/W2295502751","https://openalex.org/W2592633366","https://openalex.org/W2624192893"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2389051085","https://openalex.org/W2330343234","https://openalex.org/W1901012776","https://openalex.org/W2463883322","https://openalex.org/W2814468324","https://openalex.org/W2229382548","https://openalex.org/W2391789612","https://openalex.org/W3037422193"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,23],"radiation-hardened":[4],"flip-flop":[5],"called":[6],"MSIFF.":[7,53],"The":[8],"sensitive":[9],"node-pairs":[10],"between":[11],"the":[12,39,47,51,60,63],"master":[13],"and":[14,30,41,66],"slave":[15],"latches":[16],"are":[17],"readjusted":[18],"at":[19],"layout-level.":[20],"It":[21],"obtains":[22],"high":[24],"SEU":[25,48],"tolerance":[26,49],"with":[27,38],"slight":[28],"area":[29],"performance":[31,58],"degradation.":[32],"A":[33],"test":[34,43],"chip":[35],"was":[36],"irradiated":[37],"static":[40],"dynamic":[42],"modes":[44],"to":[45],"validate":[46],"of":[50,59],"proposed":[52],"Experimental":[54],"results":[55],"demonstrate":[56],"superior":[57],"MSIFF":[61],"over":[62],"conventional":[64],"DICE":[65],"D":[67],"flip-flop.":[68]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}