{"id":"https://openalex.org/W2997023064","doi":"https://doi.org/10.1587/elex.16.20190669","title":"Test method of pulse response characteristics for conductive switching materials induced by electromagnetic pulse field","display_name":"Test method of pulse response characteristics for conductive switching materials induced by electromagnetic pulse field","publication_year":2019,"publication_date":"2019-12-26","ids":{"openalex":"https://openalex.org/W2997023064","doi":"https://doi.org/10.1587/elex.16.20190669","mag":"2997023064"},"language":"en","primary_location":{"id":"doi:10.1587/elex.16.20190669","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.16.20190669","pdf_url":"https://www.jstage.jst.go.jp/article/elex/17/3/17_16.20190669/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"standard","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/17/3/17_16.20190669/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084418377","display_name":"Min Zhao","orcid":"https://orcid.org/0000-0002-9602-1935"},"institutions":[{"id":"https://openalex.org/I4210163363","display_name":"PLA Army Engineering University","ror":"https://ror.org/05mgp8x93","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210163363"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Min Zhao","raw_affiliation_strings":["National Key Laboratory on Electromagnetic Environment Effects, Army Engineering University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Key Laboratory on Electromagnetic Environment Effects, Army Engineering University","institution_ids":["https://openalex.org/I4210163363"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029720132","display_name":"Zhaoming Qu","orcid":"https://orcid.org/0000-0002-9902-2108"},"institutions":[{"id":"https://openalex.org/I4210163363","display_name":"PLA Army Engineering University","ror":"https://ror.org/05mgp8x93","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210163363"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhaoming Qu","raw_affiliation_strings":["National Key Laboratory on Electromagnetic Environment Effects, Army Engineering University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Key Laboratory on Electromagnetic Environment Effects, Army Engineering University","institution_ids":["https://openalex.org/I4210163363"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101878892","display_name":"Qingxi Yang","orcid":"https://orcid.org/0000-0003-4671-7165"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Qingxi Yang","raw_affiliation_strings":["Dept. of Ammunition Engineering, Army Engineering University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Ammunition Engineering, Army Engineering University","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100377604","display_name":"Yun Wang","orcid":"https://orcid.org/0000-0001-8619-0455"},"institutions":[{"id":"https://openalex.org/I4210163363","display_name":"PLA Army Engineering University","ror":"https://ror.org/05mgp8x93","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210163363"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yun Wang","raw_affiliation_strings":["National Key Laboratory on Electromagnetic Environment Effects, Army Engineering University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Key Laboratory on Electromagnetic Environment Effects, Army Engineering University","institution_ids":["https://openalex.org/I4210163363"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101851240","display_name":"Zhou Xing","orcid":"https://orcid.org/0000-0002-3019-4243"},"institutions":[{"id":"https://openalex.org/I4210163363","display_name":"PLA Army Engineering University","ror":"https://ror.org/05mgp8x93","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210163363"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xing Zhou","raw_affiliation_strings":["National Key Laboratory on Electromagnetic Environment Effects, Army Engineering University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Key Laboratory on Electromagnetic Environment Effects, Army Engineering University","institution_ids":["https://openalex.org/I4210163363"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102967789","display_name":"Erwei Cheng","orcid":"https://orcid.org/0000-0002-5904-8661"},"institutions":[{"id":"https://openalex.org/I4210163363","display_name":"PLA Army Engineering University","ror":"https://ror.org/05mgp8x93","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210163363"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Erwei Cheng","raw_affiliation_strings":["National Key Laboratory on Electromagnetic Environment Effects, Army Engineering University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Key Laboratory on Electromagnetic Environment Effects, Army Engineering University","institution_ids":["https://openalex.org/I4210163363"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5034493440","display_name":"Yazhou Chen","orcid":"https://orcid.org/0000-0002-8372-2724"},"institutions":[{"id":"https://openalex.org/I4210163363","display_name":"PLA Army Engineering University","ror":"https://ror.org/05mgp8x93","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210163363"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yazhou Chen","raw_affiliation_strings":["National Key Laboratory on Electromagnetic Environment Effects, Army Engineering University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Key Laboratory on Electromagnetic Environment Effects, Army Engineering University","institution_ids":["https://openalex.org/I4210163363"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"17","issue":"3","first_page":"20190669","last_page":"20190669"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13440","display_name":"Electromagnetic Effects on Materials","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13440","display_name":"Electromagnetic Effects on Materials","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","score":0.9803000092506409,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12424","display_name":"Earthquake Detection and Analysis","score":0.9653000235557556,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-conductor","display_name":"Electrical conductor","score":0.8240330219268799},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.662852942943573},{"id":"https://openalex.org/keywords/pulse","display_name":"Pulse (music)","score":0.6013023257255554},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.5967257618904114},{"id":"https://openalex.org/keywords/electrical-resistivity-and-conductivity","display_name":"Electrical resistivity and conductivity","score":0.551113486289978},{"id":"https://openalex.org/keywords/electromagnetic-field","display_name":"Electromagnetic field","score":0.47636768221855164},{"id":"https://openalex.org/keywords/electromagnetic-pulse","display_name":"Electromagnetic pulse","score":0.4346616566181183},{"id":"https://openalex.org/keywords/field-strength","display_name":"Field strength","score":0.4117131531238556},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3980245590209961},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3281637132167816},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.32394251227378845},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.30015188455581665},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19337815046310425},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.15527862310409546},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.14662432670593262},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1316172182559967},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.08164864778518677}],"concepts":[{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.8240330219268799},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.662852942943573},{"id":"https://openalex.org/C2780167933","wikidata":"https://www.wikidata.org/wiki/Q1550652","display_name":"Pulse (music)","level":3,"score":0.6013023257255554},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.5967257618904114},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.551113486289978},{"id":"https://openalex.org/C28843909","wikidata":"https://www.wikidata.org/wiki/Q177625","display_name":"Electromagnetic field","level":2,"score":0.47636768221855164},{"id":"https://openalex.org/C14589660","wikidata":"https://www.wikidata.org/wiki/Q64122","display_name":"Electromagnetic pulse","level":2,"score":0.4346616566181183},{"id":"https://openalex.org/C187309904","wikidata":"https://www.wikidata.org/wiki/Q1365197","display_name":"Field strength","level":3,"score":0.4117131531238556},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3980245590209961},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3281637132167816},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32394251227378845},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.30015188455581665},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19337815046310425},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.15527862310409546},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.14662432670593262},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1316172182559967},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08164864778518677},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.16.20190669","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.16.20190669","pdf_url":"https://www.jstage.jst.go.jp/article/elex/17/3/17_16.20190669/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.16.20190669","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.16.20190669","pdf_url":"https://www.jstage.jst.go.jp/article/elex/17/3/17_16.20190669/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.4699999988079071,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2997023064.pdf","grobid_xml":"https://content.openalex.org/works/W2997023064.grobid-xml"},"referenced_works_count":27,"referenced_works":["https://openalex.org/W1975218710","https://openalex.org/W1976832286","https://openalex.org/W1981591888","https://openalex.org/W2006594246","https://openalex.org/W2022262740","https://openalex.org/W2041418580","https://openalex.org/W2042970851","https://openalex.org/W2048991821","https://openalex.org/W2056397930","https://openalex.org/W2085551273","https://openalex.org/W2091121438","https://openalex.org/W2122385907","https://openalex.org/W2123973393","https://openalex.org/W2154060517","https://openalex.org/W2304872468","https://openalex.org/W2318249487","https://openalex.org/W2320164716","https://openalex.org/W2346460263","https://openalex.org/W2393175863","https://openalex.org/W2574130759","https://openalex.org/W2767978711","https://openalex.org/W2773360351","https://openalex.org/W2790275430","https://openalex.org/W2794105527","https://openalex.org/W2800259544","https://openalex.org/W3100561705","https://openalex.org/W3114820501"],"related_works":["https://openalex.org/W1992516876","https://openalex.org/W302157548","https://openalex.org/W4387714916","https://openalex.org/W2085792379","https://openalex.org/W2047408755","https://openalex.org/W2360260000","https://openalex.org/W1963667237","https://openalex.org/W1969918113","https://openalex.org/W2069652842","https://openalex.org/W2060321711"],"abstract_inverted_index":{"Electrical":[0],"field":[1,22,57,91],"induced":[2,53],"conductive":[3,37,50,109],"switching":[4,51,110],"materials":[5,30,52,97],"are":[6],"novel":[7,43],"nonlinear":[8],"materials.":[9],"They":[10],"can":[11],"show":[12],"an":[13],"abrupt":[14],"reduction":[15],"of":[16,49,86,95,106],"resistivity":[17],"when":[18],"the":[19,29,62,67,69,75,83,96,107,115],"external":[20],"electrical":[21],"strength":[23,92],"exceeds":[24],"a":[25,42],"predefined":[26],"threshold,":[27],"and":[28,79,82,90],"will":[31],"switch":[32],"from":[33],"insulated":[34],"state":[35],"to":[36],"state.":[38],"In":[39,66],"this":[40],"letter,":[41],"time-domain":[44],"response":[45,88],"characteristics":[46],"test":[47,70],"method":[48,85],"by":[54,74],"electromagnetic":[55],"pulse":[56],"was":[58,72,100],"proposed":[59],"based":[60],"on":[61],"parallel":[63],"micro-strip":[64,80],"principle.":[65],"experiments,":[68],"principle":[71],"analyzed":[73],"equivalent":[76],"circuit":[77],"model":[78],"principle,":[81],"evaluation":[84],"resistivity,":[87],"time":[89],"threshold":[93],"value":[94],"under":[98],"tested":[99],"also":[101],"given.":[102],"The":[103],"theoretical":[104],"results":[105],"typical":[108],"material":[111],"agree":[112],"well":[113],"with":[114],"experimental":[116],"data.":[117]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}