{"id":"https://openalex.org/W2984040500","doi":"https://doi.org/10.1587/elex.16.20190616","title":"A 1.8 V 0.918 ppm/\u00b0C CMOS bandgap voltage reference with curvature-compensated","display_name":"A 1.8 V 0.918 ppm/\u00b0C CMOS bandgap voltage reference with curvature-compensated","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2984040500","doi":"https://doi.org/10.1587/elex.16.20190616","mag":"2984040500"},"language":"en","primary_location":{"id":"doi:10.1587/elex.16.20190616","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.16.20190616","pdf_url":"https://www.jstage.jst.go.jp/article/elex/16/23/16_16.20190616/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/16/23/16_16.20190616/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109450364","display_name":"Gao Pan","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Gao Pan","raw_affiliation_strings":["State Key Laboratory of Electronic Thin films and Integrated Devices, University of Electronic Science and Technology of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electronic Thin films and Integrated Devices, University of Electronic Science and Technology of China","institution_ids":["https://openalex.org/I150229711","https://openalex.org/I4210124847"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104669310","display_name":"Qing Hua","orcid":"https://orcid.org/0009-0000-0175-5059"},"institutions":[{"id":"https://openalex.org/I28006308","display_name":"Shandong Normal University","ror":"https://ror.org/01wy3h363","country_code":"CN","type":"education","lineage":["https://openalex.org/I28006308"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qing Hua","raw_affiliation_strings":["School of Physics Electronics, Shandong Normal University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Physics Electronics, Shandong Normal University","institution_ids":["https://openalex.org/I28006308"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100320398","display_name":"Bo Zhang","orcid":"https://orcid.org/0000-0003-1288-1549"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bo Zhang","raw_affiliation_strings":["State Key Laboratory of Electronic Thin films and Integrated Devices, University of Electronic Science and Technology of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electronic Thin films and Integrated Devices, University of Electronic Science and Technology of China","institution_ids":["https://openalex.org/I150229711","https://openalex.org/I4210124847"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.5777,"has_fulltext":true,"cited_by_count":23,"citation_normalized_percentile":{"value":0.62162824,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"16","issue":"23","first_page":"20190616","last_page":"20190616"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bandgap-voltage-reference","display_name":"Bandgap voltage reference","score":0.8999332189559937},{"id":"https://openalex.org/keywords/line-regulation","display_name":"Line regulation","score":0.8319299221038818},{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.6954165697097778},{"id":"https://openalex.org/keywords/temperature-coefficient","display_name":"Temperature coefficient","score":0.6161893010139465},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6115176677703857},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.5878920555114746},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5577620267868042},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5381781458854675},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4415528476238251},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.435865193605423},{"id":"https://openalex.org/keywords/silicon-bandgap-temperature-sensor","display_name":"Silicon bandgap temperature sensor","score":0.4344446659088135},{"id":"https://openalex.org/keywords/dropout-voltage","display_name":"Dropout voltage","score":0.21018296480178833},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18364736437797546}],"concepts":[{"id":"https://openalex.org/C127033052","wikidata":"https://www.wikidata.org/wiki/Q48635","display_name":"Bandgap voltage reference","level":5,"score":0.8999332189559937},{"id":"https://openalex.org/C2777901765","wikidata":"https://www.wikidata.org/wiki/Q6553328","display_name":"Line regulation","level":5,"score":0.8319299221038818},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.6954165697097778},{"id":"https://openalex.org/C16643434","wikidata":"https://www.wikidata.org/wiki/Q898642","display_name":"Temperature coefficient","level":2,"score":0.6161893010139465},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6115176677703857},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.5878920555114746},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5577620267868042},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5381781458854675},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4415528476238251},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.435865193605423},{"id":"https://openalex.org/C168032602","wikidata":"https://www.wikidata.org/wiki/Q7515014","display_name":"Silicon bandgap temperature sensor","level":5,"score":0.4344446659088135},{"id":"https://openalex.org/C15032970","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Dropout voltage","level":4,"score":0.21018296480178833},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18364736437797546},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.16.20190616","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.16.20190616","pdf_url":"https://www.jstage.jst.go.jp/article/elex/16/23/16_16.20190616/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.16.20190616","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.16.20190616","pdf_url":"https://www.jstage.jst.go.jp/article/elex/16/23/16_16.20190616/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8600000143051147,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2984040500.pdf","grobid_xml":"https://content.openalex.org/works/W2984040500.grobid-xml"},"referenced_works_count":28,"referenced_works":["https://openalex.org/W1504370941","https://openalex.org/W1967909621","https://openalex.org/W1983958868","https://openalex.org/W1994057142","https://openalex.org/W1997811146","https://openalex.org/W2002682182","https://openalex.org/W2043168606","https://openalex.org/W2063976541","https://openalex.org/W2065330290","https://openalex.org/W2100463091","https://openalex.org/W2128134737","https://openalex.org/W2128241892","https://openalex.org/W2142665709","https://openalex.org/W2144483778","https://openalex.org/W2203831731","https://openalex.org/W2211711576","https://openalex.org/W2553669822","https://openalex.org/W2589037223","https://openalex.org/W2594012889","https://openalex.org/W2750306173","https://openalex.org/W2771537100","https://openalex.org/W2783056541","https://openalex.org/W2802612629","https://openalex.org/W2891699929","https://openalex.org/W2901059969","https://openalex.org/W2906397544","https://openalex.org/W2907364695","https://openalex.org/W2969058106"],"related_works":["https://openalex.org/W2347289947","https://openalex.org/W3085521269","https://openalex.org/W2372270451","https://openalex.org/W2589037223","https://openalex.org/W2370820504","https://openalex.org/W1575870214","https://openalex.org/W2251517804","https://openalex.org/W2356644724","https://openalex.org/W2349078291","https://openalex.org/W2358926260"],"abstract_inverted_index":{"A":[0],"new":[1],"precise":[2],"current":[3,27,89],"mode":[4],"bandgap":[5],"voltage":[6,19,45,83,110],"reference":[7,44],"with":[8,58,107],"TlnT":[9,34],"compensation":[10,31],"of":[11,21,33,53,70,112],"non-linear":[12],"temperature":[13,67],"is":[14,35,47,63,84,91,102],"proposed.":[15],"By":[16],"using":[17,50],"the":[18,29,38,41,51,88,98],"difference":[20],"two":[22],"transistors":[23],"working":[24],"in":[25],"different":[26],"states,":[28],"nonlinear":[30],"term":[32],"generated.":[36],"At":[37],"same":[39],"time,":[40],"optimal":[42],"high-precision":[43],"source":[46],"obtained":[48],"by":[49],"method":[52],"piecewise":[54],"compensation.":[55],"This":[56],"design":[57],"0.18":[59],"\u00b5m":[60],"CMOS":[61],"process":[62],"achieved":[64],"an":[65],"ultra-low":[66],"coefficient":[68],"(TC)":[69],"0.918":[71],"ppm/\u00b0C":[72],"from":[73],"\u221240":[74],"\u00b0C":[75,106],"to":[76,115],"125":[77],"\u00b0C.":[78,96],"The":[79],"minimum":[80],"required":[81],"supply":[82,109],"1.8":[85,113],"V":[86,114],"and":[87],"consumption":[90],"23":[92],"\u00b5A":[93],"at":[94,104],"25":[95,105],"And":[97],"line":[99],"regulation":[100],"performance":[101],"0.0055%/V":[103],"a":[108],"range":[111],"3.6":[116],"V.":[117]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":7},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":3}],"updated_date":"2026-08-10T07:06:39.071514","created_date":"2025-10-10T00:00:00"}