{"id":"https://openalex.org/W2980573225","doi":"https://doi.org/10.1587/elex.16.20190602","title":"Design of a 35\u201395 GHz fundamental monolithic mixer based on a novel IF extraction structure","display_name":"Design of a 35\u201395 GHz fundamental monolithic mixer based on a novel IF extraction structure","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2980573225","doi":"https://doi.org/10.1587/elex.16.20190602","mag":"2980573225"},"language":"en","primary_location":{"id":"doi:10.1587/elex.16.20190602","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.16.20190602","pdf_url":"https://www.jstage.jst.go.jp/article/elex/16/21/16_16.20190602/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/16/21/16_16.20190602/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102801953","display_name":"Zhen Lin","orcid":"https://orcid.org/0009-0008-7527-9428"},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhen Lin","raw_affiliation_strings":["School of Instrument and Electronics, North University of China","Technology on Electronic Test & Measurement Laboratory"],"affiliations":[{"raw_affiliation_string":"School of Instrument and Electronics, North University of China","institution_ids":["https://openalex.org/I135714990"]},{"raw_affiliation_string":"Technology on Electronic Test & Measurement Laboratory","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103148264","display_name":"Shengzhou Zhang","orcid":"https://orcid.org/0000-0002-9772-7008"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Shengzhou Zhang","raw_affiliation_strings":["China Electronics Technology Instruments Co. Ltd","Technology on Electronic Test & Measurement Laboratory"],"affiliations":[{"raw_affiliation_string":"China Electronics Technology Instruments Co. Ltd","institution_ids":[]},{"raw_affiliation_string":"Technology on Electronic Test & Measurement Laboratory","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018349888","display_name":"Dinghong Jia","orcid":"https://orcid.org/0000-0002-4880-5858"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Dinghong Jia","raw_affiliation_strings":["China Electronics Technology Instruments Co. Ltd","Technology on Electronic Test & Measurement Laboratory"],"affiliations":[{"raw_affiliation_string":"China Electronics Technology Instruments Co. Ltd","institution_ids":[]},{"raw_affiliation_string":"Technology on Electronic Test & Measurement Laboratory","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032965646","display_name":"Xiaolin Liang","orcid":"https://orcid.org/0000-0002-8807-6661"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Xiaolin Liang","raw_affiliation_strings":["China Electronics Technology Instruments Co. Ltd","Technology on Electronic Test & Measurement Laboratory"],"affiliations":[{"raw_affiliation_string":"China Electronics Technology Instruments Co. Ltd","institution_ids":[]},{"raw_affiliation_string":"Technology on Electronic Test & Measurement Laboratory","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075441127","display_name":"Jianqin Deng","orcid":"https://orcid.org/0000-0003-0052-6101"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jianqin Deng","raw_affiliation_strings":["China Electronics Technology Instruments Co. Ltd","Technology on Electronic Test & Measurement Laboratory"],"affiliations":[{"raw_affiliation_string":"China Electronics Technology Instruments Co. Ltd","institution_ids":[]},{"raw_affiliation_string":"Technology on Electronic Test & Measurement Laboratory","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075921867","display_name":"Fushun Nian","orcid":"https://orcid.org/0000-0002-5161-5414"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Fushun Nian","raw_affiliation_strings":["China Electronics Technology Instruments Co. Ltd","Technology on Electronic Test & Measurement Laboratory"],"affiliations":[{"raw_affiliation_string":"China Electronics Technology Instruments Co. Ltd","institution_ids":[]},{"raw_affiliation_string":"Technology on Electronic Test & Measurement Laboratory","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5102801953"],"corresponding_institution_ids":["https://openalex.org/I135714990"],"apc_list":null,"apc_paid":null,"fwci":0.2385,"has_fulltext":true,"cited_by_count":3,"citation_normalized_percentile":{"value":0.55750538,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"16","issue":"21","first_page":"20190602","last_page":"20190602"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11803","display_name":"Superconducting and THz Device Technology","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/3103","display_name":"Astronomy and Astrophysics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/extraction","display_name":"Extraction (chemistry)","score":0.5505400896072388},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.47509968280792236},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.417083203792572},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.39583757519721985},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3525870144367218},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.324429988861084},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25620508193969727},{"id":"https://openalex.org/keywords/chromatography","display_name":"Chromatography","score":0.13664832711219788},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.07997074723243713}],"concepts":[{"id":"https://openalex.org/C4725764","wikidata":"https://www.wikidata.org/wiki/Q844704","display_name":"Extraction (chemistry)","level":2,"score":0.5505400896072388},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.47509968280792236},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.417083203792572},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.39583757519721985},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3525870144367218},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.324429988861084},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25620508193969727},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.13664832711219788},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.07997074723243713}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.16.20190602","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.16.20190602","pdf_url":"https://www.jstage.jst.go.jp/article/elex/16/21/16_16.20190602/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.16.20190602","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.16.20190602","pdf_url":"https://www.jstage.jst.go.jp/article/elex/16/21/16_16.20190602/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320328844","display_name":"China Electronics Technology Group Corporation","ror":"https://ror.org/0098hst83"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2980573225.pdf","grobid_xml":"https://content.openalex.org/works/W2980573225.grobid-xml"},"referenced_works_count":31,"referenced_works":["https://openalex.org/W1489050617","https://openalex.org/W1569702378","https://openalex.org/W1739393858","https://openalex.org/W2006310445","https://openalex.org/W2027519486","https://openalex.org/W2069907611","https://openalex.org/W2074363496","https://openalex.org/W2101747492","https://openalex.org/W2112098616","https://openalex.org/W2120385495","https://openalex.org/W2121986394","https://openalex.org/W2127196441","https://openalex.org/W2134576766","https://openalex.org/W2134870857","https://openalex.org/W2137772868","https://openalex.org/W2141638076","https://openalex.org/W2153575345","https://openalex.org/W2158511021","https://openalex.org/W2161489724","https://openalex.org/W2169171446","https://openalex.org/W2290213274","https://openalex.org/W2316480333","https://openalex.org/W2326427049","https://openalex.org/W2545610615","https://openalex.org/W2549328846","https://openalex.org/W2554042174","https://openalex.org/W2564693936","https://openalex.org/W2740814347","https://openalex.org/W2773329302","https://openalex.org/W2795493768","https://openalex.org/W2885516516"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W4246450666","https://openalex.org/W4388998267","https://openalex.org/W2898370298","https://openalex.org/W4390401159","https://openalex.org/W2744391499","https://openalex.org/W3120461830","https://openalex.org/W4230250635","https://openalex.org/W3041790586","https://openalex.org/W2018879842"],"abstract_inverted_index":{"The":[0,74,90],"letter":[1],"presents":[2],"a":[3,12,118,146],"high-performance":[4],"doubly":[5],"balanced":[6],"ring":[7],"mixer":[8],"(DBRM)":[9],"fabricated":[10],"by":[11],"0.1":[13],"\u00b5m":[14],"GaAs":[15],"pHEMT":[16],"process":[17],"that":[18,94],"achieves":[19],"ultrawide":[20],"radio-frequency":[21],"(RF)":[22],"and":[23,117],"intermediate":[24],"frequency":[25,104,121,138],"(IF)":[26],"bandwidths.":[27],"A":[28,39],"multiple-coupled-line":[29],"Marchand":[30],"balun":[31,53],"is":[32,42,69,85,98,130],"optimized":[33],"to":[34,44,60,142],"extend":[35],"the":[36,47,51,61,66,77,81,95,102,127,136],"RF":[37,52,103],"bandwidth.":[38],"novel":[40],"structure":[41],"designed":[43],"directly":[45],"extract":[46],"IF":[48,57,63,67,120,137],"current":[49],"from":[50,140],"without":[54],"an":[55,110],"additional":[56],"coupler.":[58],"Due":[59],"proposed":[62],"extraction":[64],"structure,":[65],"bandwidth":[68],"broadened":[70],"with":[71,109],"decreased":[72],"complexity.":[73],"size":[75],"of":[76,106,114,122],"whole":[78],"chip":[79],"including":[80],"probe":[82],"GSG":[83],"pads":[84],"0.95":[86],"\u00d7":[87],"0.65":[88],"mm2.":[89],"measured":[91],"results":[92],"show":[93],"conversion":[96,128],"loss":[97,129],"7.2\u201311.9":[99],"dB":[100,134],"for":[101,135],"range":[105,139],"35\u201395":[107],"GHz":[108,144],"LO":[111,148],"power":[112],"level":[113],"14":[115],"dBm":[116],"fixed":[119,147],"1":[123],"GHz.":[124],"In":[125],"addition,":[126],"better":[131],"than":[132],"12":[133],"DC":[141],"30":[143],"under":[145],"frequency.":[149]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2021,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}