{"id":"https://openalex.org/W2971535304","doi":"https://doi.org/10.1587/elex.16.20190445","title":"A snapback-free RC-LIGBT with separated LDMOS and LIGBT by the L-shaped SiO2 layer","display_name":"A snapback-free RC-LIGBT with separated LDMOS and LIGBT by the L-shaped SiO2 layer","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2971535304","doi":"https://doi.org/10.1587/elex.16.20190445","mag":"2971535304"},"language":"en","primary_location":{"id":"doi:10.1587/elex.16.20190445","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.16.20190445","pdf_url":"https://www.jstage.jst.go.jp/article/elex/16/19/16_16.20190445/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/16/19/16_16.20190445/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101568691","display_name":"Weizhong Chen","orcid":"https://orcid.org/0000-0001-8431-8988"},"institutions":[{"id":"https://openalex.org/I10535382","display_name":"Chongqing University of Posts and Telecommunications","ror":"https://ror.org/03dgaqz26","country_code":"CN","type":"education","lineage":["https://openalex.org/I10535382"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weizhong Chen","raw_affiliation_strings":["College of Electronics Engineering, Chongqing University of Posts and Telecommunications","Institute of Microelectronics of Chinese Academy of Sciences","College of Electronics Engineering, Chongqing University of Posts and Telecommunications, Chongqing, 400065, China","Institute of Microelectronics of Chinese Academy of Sciences, Beijing, 100029, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electronics Engineering, Chongqing University of Posts and Telecommunications","institution_ids":["https://openalex.org/I10535382"]},{"raw_affiliation_string":"Institute of Microelectronics of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I19820366"]},{"raw_affiliation_string":"College of Electronics Engineering, Chongqing University of Posts and Telecommunications, Chongqing, 400065, China","institution_ids":["https://openalex.org/I10535382"]},{"raw_affiliation_string":"Institute of Microelectronics of Chinese Academy of Sciences, Beijing, 100029, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048169744","display_name":"Yao Huang","orcid":"https://orcid.org/0000-0003-4517-3610"},"institutions":[{"id":"https://openalex.org/I10535382","display_name":"Chongqing University of Posts and Telecommunications","ror":"https://ror.org/03dgaqz26","country_code":"CN","type":"education","lineage":["https://openalex.org/I10535382"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yao Huang","raw_affiliation_strings":["College of Electronics Engineering, Chongqing University of Posts and Telecommunications","College of Electronics Engineering, Chongqing University of Posts and Telecommunications, Chongqing, 400065, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electronics Engineering, Chongqing University of Posts and Telecommunications","institution_ids":["https://openalex.org/I10535382"]},{"raw_affiliation_string":"College of Electronics Engineering, Chongqing University of Posts and Telecommunications, Chongqing, 400065, China","institution_ids":["https://openalex.org/I10535382"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100442628","display_name":"Shun Li","orcid":"https://orcid.org/0000-0001-9439-8379"},"institutions":[{"id":"https://openalex.org/I10535382","display_name":"Chongqing University of Posts and Telecommunications","ror":"https://ror.org/03dgaqz26","country_code":"CN","type":"education","lineage":["https://openalex.org/I10535382"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shun Li","raw_affiliation_strings":["College of Electronics Engineering, Chongqing University of Posts and Telecommunications","College of Electronics Engineering, Chongqing University of Posts and Telecommunications, Chongqing, 400065, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electronics Engineering, Chongqing University of Posts and Telecommunications","institution_ids":["https://openalex.org/I10535382"]},{"raw_affiliation_string":"College of Electronics Engineering, Chongqing University of Posts and Telecommunications, Chongqing, 400065, China","institution_ids":["https://openalex.org/I10535382"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002732486","display_name":"Lingli Wang","orcid":"https://orcid.org/0000-0002-0579-3527"},"institutions":[{"id":"https://openalex.org/I4210116144","display_name":"Chongqing University of Education","ror":"https://ror.org/02d06s578","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210116144"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"LingLi Wang","raw_affiliation_strings":["School of Mathematics and Information Engineering, Chongqing University of Education","School of Mathematics and Information Engineering, Chongqing University of Education, Chongqing, 400065, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mathematics and Information Engineering, Chongqing University of Education","institution_ids":["https://openalex.org/I4210116144"]},{"raw_affiliation_string":"School of Mathematics and Information Engineering, Chongqing University of Education, Chongqing, 400065, China","institution_ids":["https://openalex.org/I4210116144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015702237","display_name":"Lijun He","orcid":"https://orcid.org/0000-0002-8255-6103"},"institutions":[{"id":"https://openalex.org/I10535382","display_name":"Chongqing University of Posts and Telecommunications","ror":"https://ror.org/03dgaqz26","country_code":"CN","type":"education","lineage":["https://openalex.org/I10535382"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lijun He","raw_affiliation_strings":["College of Electronics Engineering, Chongqing University of Posts and Telecommunications","College of Electronics Engineering, Chongqing University of Posts and Telecommunications, Chongqing, 400065, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electronics Engineering, Chongqing University of Posts and Telecommunications","institution_ids":["https://openalex.org/I10535382"]},{"raw_affiliation_string":"College of Electronics Engineering, Chongqing University of Posts and Telecommunications, Chongqing, 400065, China","institution_ids":["https://openalex.org/I10535382"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101553200","display_name":"Yi Huang","orcid":"https://orcid.org/0000-0002-2924-2324"},"institutions":[{"id":"https://openalex.org/I10535382","display_name":"Chongqing University of Posts and Telecommunications","ror":"https://ror.org/03dgaqz26","country_code":"CN","type":"education","lineage":["https://openalex.org/I10535382"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yi Huang","raw_affiliation_strings":["College of Electronics Engineering, Chongqing University of Posts and Telecommunications","College of Electronics Engineering, Chongqing University of Posts and Telecommunications, Chongqing, 400065, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electronics Engineering, Chongqing University of Posts and Telecommunications","institution_ids":["https://openalex.org/I10535382"]},{"raw_affiliation_string":"College of Electronics Engineering, Chongqing University of Posts and Telecommunications, Chongqing, 400065, China","institution_ids":["https://openalex.org/I10535382"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101639945","display_name":"Zhengsheng Han","orcid":"https://orcid.org/0000-0002-4691-9683"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhengsheng Han","raw_affiliation_strings":["Institute of Microelectronics of Chinese Academy of Sciences","University of Chinese Academy of Sciences","Institute of Microelectronics of Chinese Academy of Sciences, Beijing, 100029, China","University of Chinese Academy of Sciences, Beijing, 100049, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I19820366"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"Institute of Microelectronics of Chinese Academy of Sciences, Beijing, 100029, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences, Beijing, 100049, China","institution_ids":["https://openalex.org/I4210165038"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2789,"has_fulltext":true,"cited_by_count":3,"citation_normalized_percentile":{"value":0.55372187,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"16","issue":"19","first_page":"20190445","last_page":"20190445"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12898","display_name":"Induction Heating and Inverter Technology","score":0.9794999957084656,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9790999889373779,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/snapback","display_name":"Snapback","score":0.9926064610481262},{"id":"https://openalex.org/keywords/ldmos","display_name":"LDMOS","score":0.8143433332443237},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6666038036346436},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5583218336105347},{"id":"https://openalex.org/keywords/electrostatic-discharge","display_name":"Electrostatic discharge","score":0.3408118486404419},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2931421995162964},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17928528785705566},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.11511683464050293},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.06099244952201843}],"concepts":[{"id":"https://openalex.org/C2779888857","wikidata":"https://www.wikidata.org/wiki/Q18378810","display_name":"Snapback","level":4,"score":0.9926064610481262},{"id":"https://openalex.org/C31672976","wikidata":"https://www.wikidata.org/wiki/Q4042432","display_name":"LDMOS","level":4,"score":0.8143433332443237},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6666038036346436},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5583218336105347},{"id":"https://openalex.org/C205483674","wikidata":"https://www.wikidata.org/wiki/Q3574961","display_name":"Electrostatic discharge","level":3,"score":0.3408118486404419},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2931421995162964},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17928528785705566},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.11511683464050293},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.06099244952201843}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.16.20190445","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.16.20190445","pdf_url":"https://www.jstage.jst.go.jp/article/elex/16/19/16_16.20190445/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.16.20190445","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.16.20190445","pdf_url":"https://www.jstage.jst.go.jp/article/elex/16/19/16_16.20190445/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G367044322","display_name":null,"funder_award_id":"61604027 and 61704016","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4456837855","display_name":null,"funder_award_id":"61704016","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7870848524","display_name":null,"funder_award_id":"61604027","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2971535304.pdf","grobid_xml":"https://content.openalex.org/works/W2971535304.grobid-xml"},"referenced_works_count":17,"referenced_works":["https://openalex.org/W781479534","https://openalex.org/W1548582976","https://openalex.org/W1859306658","https://openalex.org/W1983978058","https://openalex.org/W1990763823","https://openalex.org/W1992728167","https://openalex.org/W2012171854","https://openalex.org/W2106312433","https://openalex.org/W2144210446","https://openalex.org/W2170103189","https://openalex.org/W2315196185","https://openalex.org/W2498970398","https://openalex.org/W2586349225","https://openalex.org/W2737896645","https://openalex.org/W2810304080","https://openalex.org/W2885640199","https://openalex.org/W2901141918"],"related_works":["https://openalex.org/W1936266116","https://openalex.org/W2110615434","https://openalex.org/W2737719579","https://openalex.org/W2140836512","https://openalex.org/W2085435212","https://openalex.org/W2103190859","https://openalex.org/W2107000020","https://openalex.org/W2944851804","https://openalex.org/W1579480661","https://openalex.org/W2109148991"],"abstract_inverted_index":{"A":[0,54,68],"RC-LIGBT":[1],"with":[2,97],"separated":[3],"LDMOS":[4,90],"and":[5,15,28,55,69,107],"LIGBT":[6,80],"by":[7,47,88,112],"the":[8,23,30,36,40,43,48,62,73,79,89,98,101,110,115],"Lshaped":[9],"SiO":[10,19],"2":[11,20],"layer":[12,21],"is":[13,45,64,76,86],"proposed":[14,102],"investigated.":[16],"The":[17,82],"L-shaped":[18],"enhances":[22],"bulk":[24],"electric":[25,32],"field":[26,33],"remarkably":[27],"decreases":[29],"surface":[31],"substantially":[34],"in":[35],"breakdown":[37],"state.":[38,95],"At":[39],"forward":[41],"conduction,":[42],"current":[44],"dominated":[46],"unipolar":[49],"mode":[50,57],"(LDMOS)":[51],"before":[52],"point":[53,60,67],"bipolar":[56],"(LIGBT)":[58],"after":[59],"B,":[61],"snapback":[63],"eliminated":[65],"between":[66],"B":[70],"due":[71],"to":[72],"conductivity":[74],"modulation":[75],"restricted":[77],"at":[78,92,114],"region.":[81],"Free-Wheeling":[83],"diode":[84],"(FWD)":[85],"realized":[87],"region":[91],"reverse":[93],"conduction":[94],"Compared":[96],"conventional":[99],"RC-LIGBT,":[100],"device":[103],"shows":[104],"snapbackfree":[105],"property":[106],"it":[108],"increases":[109],"BV":[111],"107%":[113],"same":[116],"time.":[117]},"counts_by_year":[{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":1}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}