{"id":"https://openalex.org/W2949429288","doi":"https://doi.org/10.1587/elex.16.20190296","title":"Power-up control techniques for reliable SRAM PUF","display_name":"Power-up control techniques for reliable SRAM PUF","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2949429288","doi":"https://doi.org/10.1587/elex.16.20190296","mag":"2949429288"},"language":"en","primary_location":{"id":"doi:10.1587/elex.16.20190296","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.16.20190296","pdf_url":"https://www.jstage.jst.go.jp/article/elex/16/13/16_16.20190296/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/16/13/16_16.20190296/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023267581","display_name":"Juyun Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I4210147194","display_name":"Convergence","ror":"https://ror.org/03kcznq08","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210147194"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Juyun Lee","raw_affiliation_strings":["Graduate School of Convergence and Science Technology, Seoul National University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Convergence and Science Technology, Seoul National University","institution_ids":["https://openalex.org/I4210147194"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085025738","display_name":"Dong\u2010Woo Jee","orcid":"https://orcid.org/0000-0002-9273-9069"},"institutions":[{"id":"https://openalex.org/I57664883","display_name":"Ajou University","ror":"https://ror.org/03tzb2h73","country_code":"KR","type":"education","lineage":["https://openalex.org/I57664883"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dong-Woo Jee","raw_affiliation_strings":["Dept. of Electrical and Computer Engineering, Ajou University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, Ajou University","institution_ids":["https://openalex.org/I57664883"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053248335","display_name":"Dongsuk Jeon","orcid":"https://orcid.org/0000-0002-0395-8076"},"institutions":[{"id":"https://openalex.org/I4210147194","display_name":"Convergence","ror":"https://ror.org/03kcznq08","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210147194"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dongsuk Jeon","raw_affiliation_strings":["Graduate School of Convergence and Science Technology, Seoul National University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Convergence and Science Technology, Seoul National University","institution_ids":["https://openalex.org/I4210147194"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9576,"has_fulltext":true,"cited_by_count":8,"citation_normalized_percentile":{"value":0.72685062,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"16","issue":"13","first_page":"20190296","last_page":"20190296"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9876000285148621,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8083542585372925},{"id":"https://openalex.org/keywords/reproducibility","display_name":"Reproducibility","score":0.7052266597747803},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5839794874191284},{"id":"https://openalex.org/keywords/physical-unclonable-function","display_name":"Physical unclonable function","score":0.5785902738571167},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.517036497592926},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4875916838645935},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4859570264816284},{"id":"https://openalex.org/keywords/hardware-security-module","display_name":"Hardware security module","score":0.47138625383377075},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4109758138656616},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3616619408130646},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29756879806518555},{"id":"https://openalex.org/keywords/cryptography","display_name":"Cryptography","score":0.18620356917381287},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.14654994010925293},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11035987734794617},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08925259113311768},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.0631723701953888}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8083542585372925},{"id":"https://openalex.org/C9893847","wikidata":"https://www.wikidata.org/wiki/Q1425625","display_name":"Reproducibility","level":2,"score":0.7052266597747803},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5839794874191284},{"id":"https://openalex.org/C8643368","wikidata":"https://www.wikidata.org/wiki/Q4046262","display_name":"Physical unclonable function","level":3,"score":0.5785902738571167},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.517036497592926},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4875916838645935},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4859570264816284},{"id":"https://openalex.org/C39217717","wikidata":"https://www.wikidata.org/wiki/Q1432354","display_name":"Hardware security module","level":3,"score":0.47138625383377075},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4109758138656616},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3616619408130646},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29756879806518555},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.18620356917381287},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.14654994010925293},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11035987734794617},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08925259113311768},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0631723701953888},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.16.20190296","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.16.20190296","pdf_url":"https://www.jstage.jst.go.jp/article/elex/16/13/16_16.20190296/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.16.20190296","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.16.20190296","pdf_url":"https://www.jstage.jst.go.jp/article/elex/16/13/16_16.20190296/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8799999952316284,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G1300324739","display_name":null,"funder_award_id":"IITP-2019-2018-0-01421","funder_id":"https://openalex.org/F4320335489","funder_display_name":"Institute for Information and Communications Technology Promotion"},{"id":"https://openalex.org/G2272568779","display_name":null,"funder_award_id":"NRF-2016R1C1B2016072","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G2351560784","display_name":null,"funder_award_id":"NRF-2019R1C1C1004927","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G3460013564","display_name":null,"funder_award_id":"10074267","funder_id":"https://openalex.org/F4320321681","funder_display_name":"Ministry of Trade, Industry and Energy"},{"id":"https://openalex.org/G5925855199","display_name":null,"funder_award_id":"2016R1C1B2016072","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"},{"id":"https://openalex.org/F4320321681","display_name":"Ministry of Trade, Industry and Energy","ror":"https://ror.org/008nkqk13"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320335489","display_name":"Institute for Information and Communications Technology Promotion","ror":"https://ror.org/01g0hqq23"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2949429288.pdf","grobid_xml":"https://content.openalex.org/works/W2949429288.grobid-xml"},"referenced_works_count":32,"referenced_works":["https://openalex.org/W1515439914","https://openalex.org/W1899618153","https://openalex.org/W1984463050","https://openalex.org/W2001067488","https://openalex.org/W2002612140","https://openalex.org/W2002734120","https://openalex.org/W2036471313","https://openalex.org/W2046467839","https://openalex.org/W2067907366","https://openalex.org/W2093322159","https://openalex.org/W2113322447","https://openalex.org/W2116359098","https://openalex.org/W2116374153","https://openalex.org/W2128111793","https://openalex.org/W2129004891","https://openalex.org/W2131833150","https://openalex.org/W2138874069","https://openalex.org/W2173256474","https://openalex.org/W2290692811","https://openalex.org/W2325849214","https://openalex.org/W2346824758","https://openalex.org/W2502734849","https://openalex.org/W2594214473","https://openalex.org/W2743452425","https://openalex.org/W2745051470","https://openalex.org/W2753654597","https://openalex.org/W2794177219","https://openalex.org/W2798461574","https://openalex.org/W2890844360","https://openalex.org/W2896680433","https://openalex.org/W3151293064","https://openalex.org/W4236170267"],"related_works":["https://openalex.org/W2775062502","https://openalex.org/W4292862360","https://openalex.org/W2302863414","https://openalex.org/W2896245892","https://openalex.org/W3083074270","https://openalex.org/W3094096662","https://openalex.org/W2910831494","https://openalex.org/W3081452067","https://openalex.org/W4386278306","https://openalex.org/W2325849214"],"abstract_inverted_index":{"Physically":[0],"unclonable":[1],"function":[2],"(PUF)":[3],"is":[4],"a":[5],"widely":[6],"used":[7],"hardware-level":[8],"identification":[9],"method.":[10],"SRAM":[11,50],"PUFs":[12],"are":[13,84],"the":[14,49,73],"most":[15],"well-known":[16],"PUF":[17],"topology,":[18],"but":[19],"they":[20],"typically":[21],"suffer":[22],"from":[23,72],"low":[24],"reproducibility":[25,47,97],"due":[26],"to":[27],"non-deterministic":[28],"behaviors":[29],"and":[30,88],"noise":[31],"during":[32,58],"power-up":[33,41],"process.":[34],"In":[35],"this":[36],"work,":[37],"we":[38],"propose":[39],"two":[40],"control":[42],"techniques":[43,53],"that":[44,79],"effectively":[45],"improve":[46],"of":[48],"PUFs.":[51],"The":[52],"reduce":[54],"undesirable":[55],"bit":[56,89],"flipping":[57],"evaluation":[59,63],"by":[60,86,94,99],"controlling":[61],"either":[62],"region":[64],"or":[65],"power":[66],"supply":[67],"ramp-up":[68],"speed.":[69],"Measurement":[70],"results":[71],"180":[74],"nm":[75],"test":[76],"chip":[77],"confirm":[78],"native":[80],"unstable":[81],"bits":[82],"(NUBs)":[83],"reduced":[85],"54.87%":[87],"error":[90],"rate":[91],"(BER)":[92],"decreases":[93],"55.05%":[95],"while":[96],"increases":[98],"2.2\u00d7.":[100]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}