{"id":"https://openalex.org/W2913577767","doi":"https://doi.org/10.1587/elex.16.20190005","title":"A charge pump system with new regulation and clocking scheme","display_name":"A charge pump system with new regulation and clocking scheme","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2913577767","doi":"https://doi.org/10.1587/elex.16.20190005","mag":"2913577767"},"language":"en","primary_location":{"id":"doi:10.1587/elex.16.20190005","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.16.20190005","pdf_url":"https://www.jstage.jst.go.jp/article/elex/16/4/16_16.20190005/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/16/4/16_16.20190005/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103274862","display_name":"Wenyi Zhu","orcid":"https://orcid.org/0000-0002-7792-8785"},"institutions":[{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I169912796","display_name":"Grace (United States)","ror":"https://ror.org/03k4vk194","country_code":"US","type":"company","lineage":["https://openalex.org/I169912796"]},{"id":"https://openalex.org/I4210147322","display_name":"Shanghai Institute of Microsystem and Information Technology","ror":"https://ror.org/04nytyj38","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210147322"]}],"countries":["CN","US"],"is_corresponding":true,"raw_author_name":"Wenyi Zhu","raw_affiliation_strings":["Shanghai Huahong Grace Semiconductor Manufacturing Corporation","State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences","University of Chinese Academy of Sciences"],"affiliations":[{"raw_affiliation_string":"Shanghai Huahong Grace Semiconductor Manufacturing Corporation","institution_ids":["https://openalex.org/I169912796"]},{"raw_affiliation_string":"State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210147322","https://openalex.org/I19820366"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057556916","display_name":"Jianwei Jiang","orcid":"https://orcid.org/0000-0002-0071-413X"},"institutions":[{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]},{"id":"https://openalex.org/I169912796","display_name":"Grace (United States)","ror":"https://ror.org/03k4vk194","country_code":"US","type":"company","lineage":["https://openalex.org/I169912796"]},{"id":"https://openalex.org/I4210147322","display_name":"Shanghai Institute of Microsystem and Information Technology","ror":"https://ror.org/04nytyj38","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210147322"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN","US"],"is_corresponding":false,"raw_author_name":"Jianwei Jiang","raw_affiliation_strings":["Shanghai Huahong Grace Semiconductor Manufacturing Corporation","State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences","University of Chinese Academy of Sciences"],"affiliations":[{"raw_affiliation_string":"Shanghai Huahong Grace Semiconductor Manufacturing Corporation","institution_ids":["https://openalex.org/I169912796"]},{"raw_affiliation_string":"State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210147322","https://openalex.org/I19820366"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057164232","display_name":"Dianpeng Lin","orcid":null},"institutions":[{"id":"https://openalex.org/I4210147322","display_name":"Shanghai Institute of Microsystem and Information Technology","ror":"https://ror.org/04nytyj38","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210147322"]},{"id":"https://openalex.org/I169912796","display_name":"Grace (United States)","ror":"https://ror.org/03k4vk194","country_code":"US","type":"company","lineage":["https://openalex.org/I169912796"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN","US"],"is_corresponding":false,"raw_author_name":"Dianpeng Lin","raw_affiliation_strings":["Shanghai Huahong Grace Semiconductor Manufacturing Corporation","State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences","University of Chinese Academy of Sciences"],"affiliations":[{"raw_affiliation_string":"Shanghai Huahong Grace Semiconductor Manufacturing Corporation","institution_ids":["https://openalex.org/I169912796"]},{"raw_affiliation_string":"State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210147322","https://openalex.org/I19820366"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101852787","display_name":"Jun Xiao","orcid":"https://orcid.org/0009-0005-2767-3218"},"institutions":[{"id":"https://openalex.org/I169912796","display_name":"Grace (United States)","ror":"https://ror.org/03k4vk194","country_code":"US","type":"company","lineage":["https://openalex.org/I169912796"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jun Xiao","raw_affiliation_strings":["Shanghai Huahong Grace Semiconductor Manufacturing Corporation"],"affiliations":[{"raw_affiliation_string":"Shanghai Huahong Grace Semiconductor Manufacturing Corporation","institution_ids":["https://openalex.org/I169912796"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101920137","display_name":"Guangjun Yang","orcid":"https://orcid.org/0000-0002-2489-8842"},"institutions":[{"id":"https://openalex.org/I169912796","display_name":"Grace (United States)","ror":"https://ror.org/03k4vk194","country_code":"US","type":"company","lineage":["https://openalex.org/I169912796"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Guangjun Yang","raw_affiliation_strings":["Shanghai Huahong Grace Semiconductor Manufacturing Corporation"],"affiliations":[{"raw_affiliation_string":"Shanghai Huahong Grace Semiconductor Manufacturing Corporation","institution_ids":["https://openalex.org/I169912796"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100781903","display_name":"Xiaoyun Li","orcid":"https://orcid.org/0000-0003-1976-6180"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210147322","display_name":"Shanghai Institute of Microsystem and Information Technology","ror":"https://ror.org/04nytyj38","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210147322"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoyun Li","raw_affiliation_strings":["State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences","University of Chinese Academy of Sciences"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210147322","https://openalex.org/I19820366"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108468717","display_name":"Shichang Zou","orcid":null},"institutions":[{"id":"https://openalex.org/I169912796","display_name":"Grace (United States)","ror":"https://ror.org/03k4vk194","country_code":"US","type":"company","lineage":["https://openalex.org/I169912796"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]},{"id":"https://openalex.org/I4210147322","display_name":"Shanghai Institute of Microsystem and Information Technology","ror":"https://ror.org/04nytyj38","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210147322"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN","US"],"is_corresponding":false,"raw_author_name":"Shichang Zou","raw_affiliation_strings":["Shanghai Huahong Grace Semiconductor Manufacturing Corporation","State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences","University of Chinese Academy of Sciences"],"affiliations":[{"raw_affiliation_string":"Shanghai Huahong Grace Semiconductor Manufacturing Corporation","institution_ids":["https://openalex.org/I169912796"]},{"raw_affiliation_string":"State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210147322","https://openalex.org/I19820366"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210165038"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5103274862"],"corresponding_institution_ids":["https://openalex.org/I169912796","https://openalex.org/I19820366","https://openalex.org/I4210147322","https://openalex.org/I4210165038"],"apc_list":null,"apc_paid":null,"fwci":0.7285,"has_fulltext":true,"cited_by_count":8,"citation_normalized_percentile":{"value":0.67457862,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"16","issue":"4","first_page":"20190005","last_page":"20190005"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11230","display_name":"Innovative Energy Harvesting Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11230","display_name":"Innovative Energy Harvesting Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11392","display_name":"Energy Harvesting in Wireless Networks","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/charge-pump","display_name":"Charge pump","score":0.7582595348358154},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5527566075325012},{"id":"https://openalex.org/keywords/ripple","display_name":"Ripple","score":0.522821307182312},{"id":"https://openalex.org/keywords/bandgap-voltage-reference","display_name":"Bandgap voltage reference","score":0.4804477393627167},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4443676769733429},{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.42269474267959595},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4191793203353882},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.412319153547287},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.40909790992736816},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.39514830708503723},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.33897340297698975},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3049052655696869},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.18084269762039185},{"id":"https://openalex.org/keywords/dropout-voltage","display_name":"Dropout voltage","score":0.17280730605125427},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.14715519547462463}],"concepts":[{"id":"https://openalex.org/C114825011","wikidata":"https://www.wikidata.org/wiki/Q440704","display_name":"Charge pump","level":4,"score":0.7582595348358154},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5527566075325012},{"id":"https://openalex.org/C2779599953","wikidata":"https://www.wikidata.org/wiki/Q1776117","display_name":"Ripple","level":3,"score":0.522821307182312},{"id":"https://openalex.org/C127033052","wikidata":"https://www.wikidata.org/wiki/Q48635","display_name":"Bandgap voltage reference","level":5,"score":0.4804477393627167},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4443676769733429},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.42269474267959595},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4191793203353882},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.412319153547287},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.40909790992736816},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.39514830708503723},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.33897340297698975},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3049052655696869},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.18084269762039185},{"id":"https://openalex.org/C15032970","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Dropout voltage","level":4,"score":0.17280730605125427},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14715519547462463},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.16.20190005","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.16.20190005","pdf_url":"https://www.jstage.jst.go.jp/article/elex/16/4/16_16.20190005/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.16.20190005","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.16.20190005","pdf_url":"https://www.jstage.jst.go.jp/article/elex/16/4/16_16.20190005/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.9100000262260437,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2913577767.pdf","grobid_xml":"https://content.openalex.org/works/W2913577767.grobid-xml"},"referenced_works_count":31,"referenced_works":["https://openalex.org/W1759530066","https://openalex.org/W1933154361","https://openalex.org/W1966510747","https://openalex.org/W1972250968","https://openalex.org/W1994895020","https://openalex.org/W2010135074","https://openalex.org/W2024447422","https://openalex.org/W2030204473","https://openalex.org/W2044582152","https://openalex.org/W2071065569","https://openalex.org/W2072774679","https://openalex.org/W2086360173","https://openalex.org/W2092917845","https://openalex.org/W2097409161","https://openalex.org/W2104730113","https://openalex.org/W2110395205","https://openalex.org/W2119637544","https://openalex.org/W2161428934","https://openalex.org/W2163571879","https://openalex.org/W2206530139","https://openalex.org/W2511086077","https://openalex.org/W2527089532","https://openalex.org/W2564812472","https://openalex.org/W2576096922","https://openalex.org/W2590309679","https://openalex.org/W2594883689","https://openalex.org/W2741804178","https://openalex.org/W2763684994","https://openalex.org/W2766269045","https://openalex.org/W2766325655","https://openalex.org/W2770926386"],"related_works":["https://openalex.org/W2370820504","https://openalex.org/W2133199116","https://openalex.org/W4389955510","https://openalex.org/W2347289947","https://openalex.org/W2364640622","https://openalex.org/W2390376289","https://openalex.org/W2372270451","https://openalex.org/W1970992322","https://openalex.org/W2907906161","https://openalex.org/W2404318024"],"abstract_inverted_index":{"A":[0],"novel":[1],"charge":[2,67,151],"pump":[3,51,68,96,129,140,152],"system":[4,52,69,88,97,141],"with":[5,105,121],"new":[6,57],"regulation":[7],"and":[8,14,32,47,85,102,109,160],"clock":[9,64,75],"generating":[10,24],"techniques":[11],"is":[12,70,78,114,131,142,154],"proposed":[13,50,149],"verified":[15],"in":[16,40],"a":[17,100,106],"0.13":[18],"\u00b5m":[19],"CMOS":[20],"process.":[21],"Rather":[22],"than":[23],"the":[25,33,41,60,82,87,95,110,117,124,128,137,148,166],"reference":[26,30,46],"voltage":[27,35,38,45],"by":[28,36,55,133,144],"band-gap":[29],"(BGR)":[31],"detected":[34],"high":[37,111,161],"divider":[39],"conventional":[42,61,118],"regulation,":[43],"both":[44],"division":[48],"of":[49,66,127,139],"are":[53],"implemented":[54],"single":[56],"circuit.":[58],"Besides,":[59],"oscillator":[62],"for":[63,157,164],"input":[65],"removed":[71],"while":[72,136],"an":[73],"adaptive":[74],"generation":[76],"scheme":[77],"introduced":[79],"to":[80,116],"reduce":[81],"power":[83,125,159],"consumption":[84,126],"shrink":[86],"size.":[89],"The":[90],"experiment":[91],"results":[92],"show":[93],"that":[94],"can":[98],"produce":[99],"stable":[101],"smooth":[103],"output":[104,112],"small":[107],"ripple,":[108],"accuracy":[113],"comparable":[115],"solution":[119],"equipped":[120],"BGR.":[122],"Moreover,":[123],"controlling":[130],"reduced":[132],"about":[134,145],"80%":[135],"size":[138],"decreased":[143],"25%.":[146],"Therefore,":[147],"regulated":[150],"(RCP)":[153],"very":[155],"suitable":[156],"ultra-low":[158],"precision":[162],"applications,":[163],"example,":[165],"embedded":[167],"nonvolatile":[168],"memories":[169],"(eNVMs).":[170]},"counts_by_year":[{"year":2023,"cited_by_count":3},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}