{"id":"https://openalex.org/W2885214181","doi":"https://doi.org/10.1587/elex.15.20180660","title":"A 4 GS/s 6-bit 4-2 segmented current-steering DAC with compact current cells","display_name":"A 4 GS/s 6-bit 4-2 segmented current-steering DAC with compact current cells","publication_year":2018,"publication_date":"2018-01-01","ids":{"openalex":"https://openalex.org/W2885214181","doi":"https://doi.org/10.1587/elex.15.20180660","mag":"2885214181"},"language":"en","primary_location":{"id":"doi:10.1587/elex.15.20180660","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.15.20180660","pdf_url":"https://www.jstage.jst.go.jp/article/elex/15/16/15_15.20180660/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/15/16/15_15.20180660/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100717157","display_name":"Li Bao","orcid":"https://orcid.org/0000-0002-6436-1492"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Bao Li","raw_affiliation_strings":["School of Electronics Engineering and Computer Science, Peking University","Shanghai Research Institute of Microelectronics, Peking University"],"affiliations":[{"raw_affiliation_string":"School of Electronics Engineering and Computer Science, Peking University","institution_ids":["https://openalex.org/I20231570"]},{"raw_affiliation_string":"Shanghai Research Institute of Microelectronics, Peking University","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101855662","display_name":"Long Zhao","orcid":"https://orcid.org/0000-0003-0590-2938"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Long Zhao","raw_affiliation_strings":["School of Electronics Engineering and Computer Science, Peking University","Shanghai Research Institute of Microelectronics, Peking University"],"affiliations":[{"raw_affiliation_string":"School of Electronics Engineering and Computer Science, Peking University","institution_ids":["https://openalex.org/I20231570"]},{"raw_affiliation_string":"Shanghai Research Institute of Microelectronics, Peking University","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103524382","display_name":"Yuhua Cheng","orcid":"https://orcid.org/0009-0007-1973-3481"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuhua Cheng","raw_affiliation_strings":["School of Electronics Engineering and Computer Science, Peking University","Shanghai Research Institute of Microelectronics, Peking University"],"affiliations":[{"raw_affiliation_string":"School of Electronics Engineering and Computer Science, Peking University","institution_ids":["https://openalex.org/I20231570"]},{"raw_affiliation_string":"Shanghai Research Institute of Microelectronics, Peking University","institution_ids":["https://openalex.org/I20231570"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5100717157"],"corresponding_institution_ids":["https://openalex.org/I20231570"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.08018159,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"15","issue":"16","first_page":"20180660","last_page":"20180660"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spurious-free-dynamic-range","display_name":"Spurious-free dynamic range","score":0.9693950414657593},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6326452493667603},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.6257108449935913},{"id":"https://openalex.org/keywords/current-mirror","display_name":"Current mirror","score":0.5821101665496826},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.5429825782775879},{"id":"https://openalex.org/keywords/digital-to-analog-converter","display_name":"Digital-to-analog converter","score":0.5129036903381348},{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.49970316886901855},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4926312565803528},{"id":"https://openalex.org/keywords/wideband","display_name":"Wideband","score":0.47197896242141724},{"id":"https://openalex.org/keywords/high-dynamic-range","display_name":"High dynamic range","score":0.4715927839279175},{"id":"https://openalex.org/keywords/nyquist-rate","display_name":"Nyquist rate","score":0.4583425521850586},{"id":"https://openalex.org/keywords/glitch","display_name":"Glitch","score":0.45475733280181885},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.43975651264190674},{"id":"https://openalex.org/keywords/current-source","display_name":"Current source","score":0.43368563055992126},{"id":"https://openalex.org/keywords/12-bit","display_name":"12-bit","score":0.41797497868537903},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4177534580230713},{"id":"https://openalex.org/keywords/nyquist\u2013shannon-sampling-theorem","display_name":"Nyquist\u2013Shannon sampling theorem","score":0.41280776262283325},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.41147804260253906},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.3529038429260254},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3158779740333557},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2715032696723938},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.1880863606929779},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.09115839004516602}],"concepts":[{"id":"https://openalex.org/C119293636","wikidata":"https://www.wikidata.org/wiki/Q657480","display_name":"Spurious-free dynamic range","level":3,"score":0.9693950414657593},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6326452493667603},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.6257108449935913},{"id":"https://openalex.org/C173966970","wikidata":"https://www.wikidata.org/wiki/Q786012","display_name":"Current mirror","level":4,"score":0.5821101665496826},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.5429825782775879},{"id":"https://openalex.org/C2779879419","wikidata":"https://www.wikidata.org/wiki/Q210863","display_name":"Digital-to-analog converter","level":3,"score":0.5129036903381348},{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.49970316886901855},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4926312565803528},{"id":"https://openalex.org/C2780202535","wikidata":"https://www.wikidata.org/wiki/Q4524457","display_name":"Wideband","level":2,"score":0.47197896242141724},{"id":"https://openalex.org/C2780056265","wikidata":"https://www.wikidata.org/wiki/Q106239881","display_name":"High dynamic range","level":3,"score":0.4715927839279175},{"id":"https://openalex.org/C65914096","wikidata":"https://www.wikidata.org/wiki/Q6273772","display_name":"Nyquist rate","level":4,"score":0.4583425521850586},{"id":"https://openalex.org/C191287063","wikidata":"https://www.wikidata.org/wiki/Q543281","display_name":"Glitch","level":3,"score":0.45475733280181885},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.43975651264190674},{"id":"https://openalex.org/C2781331714","wikidata":"https://www.wikidata.org/wiki/Q1163768","display_name":"Current source","level":3,"score":0.43368563055992126},{"id":"https://openalex.org/C2776310492","wikidata":"https://www.wikidata.org/wiki/Q3271420","display_name":"12-bit","level":3,"score":0.41797497868537903},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4177534580230713},{"id":"https://openalex.org/C288623","wikidata":"https://www.wikidata.org/wiki/Q679800","display_name":"Nyquist\u2013Shannon sampling theorem","level":2,"score":0.41280776262283325},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.41147804260253906},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.3529038429260254},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3158779740333557},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2715032696723938},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.1880863606929779},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.09115839004516602},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.15.20180660","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.15.20180660","pdf_url":"https://www.jstage.jst.go.jp/article/elex/15/16/15_15.20180660/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.15.20180660","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.15.20180660","pdf_url":"https://www.jstage.jst.go.jp/article/elex/15/16/15_15.20180660/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8999999761581421}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2885214181.pdf","grobid_xml":"https://content.openalex.org/works/W2885214181.grobid-xml"},"referenced_works_count":14,"referenced_works":["https://openalex.org/W1548526397","https://openalex.org/W1982572745","https://openalex.org/W1984062143","https://openalex.org/W2002579833","https://openalex.org/W2021714653","https://openalex.org/W2029461083","https://openalex.org/W2117843175","https://openalex.org/W2124912300","https://openalex.org/W2138134203","https://openalex.org/W2140823559","https://openalex.org/W2158426860","https://openalex.org/W2334464124","https://openalex.org/W3158527347","https://openalex.org/W4245979535"],"related_works":["https://openalex.org/W2157176638","https://openalex.org/W2168087740","https://openalex.org/W1547559405","https://openalex.org/W1510886156","https://openalex.org/W3139787692","https://openalex.org/W1994796450","https://openalex.org/W2271597448","https://openalex.org/W1974580482","https://openalex.org/W2076001147","https://openalex.org/W2099679337"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,24,56,96],"6-bit":[4],"4":[5,114],"GS/s":[6,107],"current-steering":[7],"digital-to-analog":[8],"converter":[9],"(DAC)":[10],"for":[11,20],"wideband":[12],"systems.":[13],"The":[14,71,117],"4-2":[15],"segmented":[16],"structure":[17],"is":[18,27,48,63,73],"adopted":[19],"glitch":[21],"reduction,":[22],"and":[23,34,55,80,110],"dynamic":[25,43,99],"decoder":[26],"proposed":[28],"to":[29,39,50,65],"maintain":[30],"low":[31],"power":[32,122],"consumption":[33],"small":[35],"area.":[36],"In":[37],"order":[38],"improve":[40],"the":[41,45,52,68,82,89],"high-frequency":[42],"linearity,":[44],"forward-bias":[46],"technique":[47],"employed":[49],"reduce":[51],"device":[53],"sizes,":[54],"compact":[57],"one-dimensional":[58],"(1-D)":[59],"current":[60],"source":[61],"unit":[62],"used":[64],"further":[66],"minimize":[67],"parasitic":[69],"capacitance.":[70],"DAC":[72,118],"fabricated":[74],"in":[75],"40-nm":[76],"low-leakage":[77],"CMOS":[78],"process":[79],"occupies":[81],"active":[83],"area":[84],"of":[85,102],"0.036":[86],"mm2.":[87],"Over":[88],"entire":[90],"Nyquist":[91],"range,":[92],"measurement":[93],"results":[94],"show":[95],"spurious":[97],"free":[98],"range":[100],"(SFDR)":[101],">39":[103],"dB":[104,112],"at":[105,113],"2":[106],"sampling":[108],"rate":[109],">29":[111],"GS/s,":[115],"respectively.":[116],"consumes":[119],"28":[120],"mW":[121],"from":[123],"1.1":[124],"V":[125],"supply":[126],"voltage.":[127]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}