{"id":"https://openalex.org/W2800482436","doi":"https://doi.org/10.1587/elex.15.20180144","title":"An efficient controlled LFSR hybrid BIST scheme","display_name":"An efficient controlled LFSR hybrid BIST scheme","publication_year":2018,"publication_date":"2018-01-01","ids":{"openalex":"https://openalex.org/W2800482436","doi":"https://doi.org/10.1587/elex.15.20180144","mag":"2800482436"},"language":"fr","primary_location":{"id":"doi:10.1587/elex.15.20180144","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.15.20180144","pdf_url":"https://www.jstage.jst.go.jp/article/elex/15/8/15_15.20180144/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/15/8/15_15.20180144/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102850068","display_name":"Tieqiao Liu","orcid":"https://orcid.org/0000-0001-5509-4540"},"institutions":[{"id":"https://openalex.org/I50760025","display_name":"Hangzhou Dianzi University","ror":"https://ror.org/0576gt767","country_code":"CN","type":"education","lineage":["https://openalex.org/I50760025"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tieqiao Liu","raw_affiliation_strings":["Hangzhou Dianzi University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hangzhou Dianzi University","institution_ids":["https://openalex.org/I50760025"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100346767","display_name":"Peng Liu","orcid":"https://orcid.org/0000-0001-8694-7091"},"institutions":[{"id":"https://openalex.org/I139024713","display_name":"Guangdong University of Technology","ror":"https://ror.org/04azbjn80","country_code":"CN","type":"education","lineage":["https://openalex.org/I139024713"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peng Liu","raw_affiliation_strings":["Guangdong University of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Guangdong University of Technology","institution_ids":["https://openalex.org/I139024713"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101987243","display_name":"Yi Liu","orcid":"https://orcid.org/0000-0003-1288-1071"},"institutions":[{"id":"https://openalex.org/I50760025","display_name":"Hangzhou Dianzi University","ror":"https://ror.org/0576gt767","country_code":"CN","type":"education","lineage":["https://openalex.org/I50760025"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yi Liu","raw_affiliation_strings":["Hangzhou Dianzi University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hangzhou Dianzi University","institution_ids":["https://openalex.org/I50760025"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4751,"has_fulltext":true,"cited_by_count":4,"citation_normalized_percentile":{"value":0.6138671,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"15","issue":"8","first_page":"20180144","last_page":"20180144"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/linear-feedback-shift-register","display_name":"Linear feedback shift register","score":0.7371483445167542},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.7265967130661011},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.6303976774215698},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5955501794815063},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5829193592071533},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.5738400220870972},{"id":"https://openalex.org/keywords/shift-register","display_name":"Shift register","score":0.5335832834243774},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4754740297794342},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4689336121082306},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.4614168107509613},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.4584396183490753},{"id":"https://openalex.org/keywords/sequence","display_name":"Sequence (biology)","score":0.4578077495098114},{"id":"https://openalex.org/keywords/bitstream","display_name":"Bitstream","score":0.4284977614879608},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.4184550642967224},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3418790102005005},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14985355734825134},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.14200711250305176},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.08745157718658447},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.07947972416877747},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.06674513220787048}],"concepts":[{"id":"https://openalex.org/C159862308","wikidata":"https://www.wikidata.org/wiki/Q681101","display_name":"Linear feedback shift register","level":4,"score":0.7371483445167542},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.7265967130661011},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.6303976774215698},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5955501794815063},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5829193592071533},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.5738400220870972},{"id":"https://openalex.org/C49654631","wikidata":"https://www.wikidata.org/wiki/Q746165","display_name":"Shift register","level":3,"score":0.5335832834243774},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4754740297794342},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4689336121082306},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.4614168107509613},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.4584396183490753},{"id":"https://openalex.org/C2778112365","wikidata":"https://www.wikidata.org/wiki/Q3511065","display_name":"Sequence (biology)","level":2,"score":0.4578077495098114},{"id":"https://openalex.org/C136695289","wikidata":"https://www.wikidata.org/wiki/Q415568","display_name":"Bitstream","level":3,"score":0.4284977614879608},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4184550642967224},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3418790102005005},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14985355734825134},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.14200711250305176},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.08745157718658447},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.07947972416877747},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.06674513220787048},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.15.20180144","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.15.20180144","pdf_url":"https://www.jstage.jst.go.jp/article/elex/15/8/15_15.20180144/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.15.20180144","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.15.20180144","pdf_url":"https://www.jstage.jst.go.jp/article/elex/15/8/15_15.20180144/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.41999998688697815}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320338464","display_name":"Natural Science Foundation of Zhejiang Province","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2800482436.pdf","grobid_xml":"https://content.openalex.org/works/W2800482436.grobid-xml"},"referenced_works_count":11,"referenced_works":["https://openalex.org/W1517866781","https://openalex.org/W1642078416","https://openalex.org/W1974318184","https://openalex.org/W2045982834","https://openalex.org/W2108500347","https://openalex.org/W2133884850","https://openalex.org/W2169754435","https://openalex.org/W2170203458","https://openalex.org/W2312034496","https://openalex.org/W2409186455","https://openalex.org/W2591296578"],"related_works":["https://openalex.org/W2101477403","https://openalex.org/W2119351822","https://openalex.org/W2104563825","https://openalex.org/W2761125259","https://openalex.org/W2184933991","https://openalex.org/W2152745368","https://openalex.org/W4288754393","https://openalex.org/W2766924081","https://openalex.org/W2188176208","https://openalex.org/W2761883387"],"abstract_inverted_index":{"A":[0],"new":[1],"hybrid":[2],"built-in":[3],"self-test":[4],"(BIST)":[5],"test":[6,11,35,39,44,61,75,82,100,120,124],"scheme":[7,12],"is":[8,47,53,70],"proposed.":[9,48],"The":[10],"consists":[13],"of":[14,37,65,94],"two":[15],"components:":[16],"the":[17,24,34,58,63,73,78,87,91,98,109],"free":[18],"LFSR":[19,26,81],"mode":[20,27],"(pseudo-random":[21],"test)":[22],"and":[23,62,123],"controlled":[25,80],"(deterministic":[28],"test).":[29],"In":[30],"order":[31],"to":[32,56],"improve":[33],"quality":[36],"pseudo-random":[38,43],"sequence,":[40],"a":[41],"forward-backward":[42],"generation":[45,83],"method":[46,84,111],"As":[49],"every":[50],"shifted-in":[51],"bit":[52],"fully":[54],"used":[55],"generate":[57],"most":[59],"efficient":[60],"ratio":[64],"do":[66],"not":[67],"care":[68],"bits":[69],"maximized":[71],"in":[72,119],"remaining":[74],"pattern":[76,89],"repository,":[77],"proposed":[79,110],"can":[85],"find":[86],"targeted":[88],"with":[90,128],"minimal":[92],"number":[93],"shift,":[95],"efficiently":[96],"embedding":[97],"deterministic":[99],"set":[101],"into":[102],"test-per-clock":[103],"stream.":[104],"Simulation":[105],"results":[106],"demonstrate":[107],"that":[108],"considering":[112],"for":[113],"layout":[114],"constraints":[115],"shows":[116],"great":[117],"advantages":[118],"data":[121],"storage":[122],"application":[125],"time":[126],"compared":[127],"previous":[129],"methods.":[130]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}