{"id":"https://openalex.org/W2786195064","doi":"https://doi.org/10.1587/elex.15.20171235","title":"A 10-bit 1.2 GS/s 45 mW time-interleaved SAR ADC with background calibration","display_name":"A 10-bit 1.2 GS/s 45 mW time-interleaved SAR ADC with background calibration","publication_year":2018,"publication_date":"2018-01-01","ids":{"openalex":"https://openalex.org/W2786195064","doi":"https://doi.org/10.1587/elex.15.20171235","mag":"2786195064"},"language":"en","primary_location":{"id":"doi:10.1587/elex.15.20171235","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.15.20171235","pdf_url":"https://www.jstage.jst.go.jp/article/elex/15/3/15_15.20171235/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/15/3/15_15.20171235/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083101939","display_name":"Daiguo Xu","orcid":"https://orcid.org/0000-0003-1461-599X"},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]},{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN","US"],"is_corresponding":false,"raw_author_name":"Xu Dai-guo","raw_affiliation_strings":["School of Microelectronics and Solid-State Electronics, University of Electronic Science and Technology of China","Science and Technology on Analog Integrated Circuit Laboratory"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics and Solid-State Electronics, University of Electronic Science and Technology of China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"Science and Technology on Analog Integrated Circuit Laboratory","institution_ids":["https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013828062","display_name":"Pu-Jie","orcid":null},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Pu-Jie","raw_affiliation_strings":["Science and Technology on Analog Integrated Circuit Laboratory"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Science and Technology on Analog Integrated Circuit Laboratory","institution_ids":["https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103805459","display_name":"Shiliu Xu","orcid":null},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xu Shi-liu","raw_affiliation_strings":["Science and Technology on Analog Integrated Circuit Laboratory"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Science and Technology on Analog Integrated Circuit Laboratory","institution_ids":["https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085462947","display_name":"Zhengping Zhang","orcid":"https://orcid.org/0000-0002-2841-4868"},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zhang Zheng-ping","raw_affiliation_strings":["Science and Technology on Analog Integrated Circuit Laboratory"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Science and Technology on Analog Integrated Circuit Laboratory","institution_ids":["https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Chen Kai-rang","orcid":null},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chen Kai-rang","raw_affiliation_strings":["Science and Technology on Analog Integrated Circuit Laboratory"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Science and Technology on Analog Integrated Circuit Laboratory","institution_ids":["https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Cheng Yi-yi","orcid":null},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Cheng Yi-yi","raw_affiliation_strings":["Science and Technology on Analog Integrated Circuit Laboratory"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Science and Technology on Analog Integrated Circuit Laboratory","institution_ids":["https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085713638","display_name":"Junan Zhang","orcid":"https://orcid.org/0000-0002-0357-3539"},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zhang Jun-an","raw_affiliation_strings":["Science and Technology on Analog Integrated Circuit Laboratory"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Science and Technology on Analog Integrated Circuit Laboratory","institution_ids":["https://openalex.org/I117023288"]}]},{"author_position":"last","author":{"id":null,"display_name":"Wang Jian-an","orcid":null},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Wang Jian-an","raw_affiliation_strings":["Science and Technology on Analog Integrated Circuit Laboratory"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Science and Technology on Analog Integrated Circuit Laboratory","institution_ids":["https://openalex.org/I117023288"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4614,"has_fulltext":true,"cited_by_count":9,"citation_normalized_percentile":{"value":0.56745912,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":97},"biblio":{"volume":"15","issue":"3","first_page":"20171235","last_page":"20171235"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.8991401195526123},{"id":"https://openalex.org/keywords/spurious-free-dynamic-range","display_name":"Spurious-free dynamic range","score":0.8762928247451782},{"id":"https://openalex.org/keywords/effective-number-of-bits","display_name":"Effective number of bits","score":0.87362140417099},{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.7694365382194519},{"id":"https://openalex.org/keywords/skew","display_name":"Skew","score":0.6033394932746887},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5750628113746643},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5657601356506348},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.4910025894641876},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.42153415083885193},{"id":"https://openalex.org/keywords/nyquist-rate","display_name":"Nyquist rate","score":0.416534960269928},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4086940884590149},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.25477397441864014},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22273826599121094},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1914893090724945},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.13215404748916626},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11657059192657471}],"concepts":[{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.8991401195526123},{"id":"https://openalex.org/C119293636","wikidata":"https://www.wikidata.org/wiki/Q657480","display_name":"Spurious-free dynamic range","level":3,"score":0.8762928247451782},{"id":"https://openalex.org/C16671190","wikidata":"https://www.wikidata.org/wiki/Q505579","display_name":"Effective number of bits","level":3,"score":0.87362140417099},{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.7694365382194519},{"id":"https://openalex.org/C43711488","wikidata":"https://www.wikidata.org/wiki/Q7534783","display_name":"Skew","level":2,"score":0.6033394932746887},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5750628113746643},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5657601356506348},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.4910025894641876},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.42153415083885193},{"id":"https://openalex.org/C65914096","wikidata":"https://www.wikidata.org/wiki/Q6273772","display_name":"Nyquist rate","level":4,"score":0.416534960269928},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4086940884590149},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.25477397441864014},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22273826599121094},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1914893090724945},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.13215404748916626},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11657059192657471},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.15.20171235","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.15.20171235","pdf_url":"https://www.jstage.jst.go.jp/article/elex/15/3/15_15.20171235/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.15.20171235","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.15.20171235","pdf_url":"https://www.jstage.jst.go.jp/article/elex/15/3/15_15.20171235/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.8700000047683716,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2786195064.pdf","grobid_xml":"https://content.openalex.org/works/W2786195064.grobid-xml"},"referenced_works_count":14,"referenced_works":["https://openalex.org/W1979509961","https://openalex.org/W1981215785","https://openalex.org/W1990536608","https://openalex.org/W2001773162","https://openalex.org/W2014759009","https://openalex.org/W2054931442","https://openalex.org/W2073537459","https://openalex.org/W2155589054","https://openalex.org/W2175390874","https://openalex.org/W2469737602","https://openalex.org/W2490203154","https://openalex.org/W2575550858","https://openalex.org/W2587931883","https://openalex.org/W4244619305"],"related_works":["https://openalex.org/W4206356469","https://openalex.org/W2783221760","https://openalex.org/W2759515872","https://openalex.org/W2904640696","https://openalex.org/W2341231357","https://openalex.org/W2942561789","https://openalex.org/W2511822798","https://openalex.org/W2054018984","https://openalex.org/W2082979872","https://openalex.org/W2542593952"],"abstract_inverted_index":{"A":[0],"10-bit":[1],"1.2":[2,92],"GS/s":[3],"power":[4,94],"efficient":[5],"time-interleaved":[6,79],"successive-approximation-register":[7],"(SAR)":[8],"analog-to-digital":[9],"converter":[10],"(ADC)":[11],"is":[12,40,59,82,122],"present":[13],"in":[14,84],"this":[15],"paper.":[16],"Substrate":[17],"bias":[18],"effect":[19],"depression":[20],"and":[21,67,102,118],"output":[22],"resistance":[23],"stabilization":[24],"techniques":[25],"are":[26],"provided":[27],"to":[28,42,61],"enhance":[29,43],"the":[30,44,63,73,119],"linearity":[31],"of":[32,48,50,78,99,104,115],"input":[33],"buffer.":[34],"Further,":[35],"meta-stability":[36],"restrained":[37],"trigger":[38],"comparator":[39],"used":[41],"ENOB":[45],"(effective":[46],"number":[47],"bits)":[49],"SAR":[51,80],"ADC.":[52],"Additionally,":[53],"a":[54,76,97],"digital":[55],"background":[56],"calibration":[57],"technique":[58],"proposed":[60,74,108],"suppress":[62],"inter-channel":[64],"gain,":[65],"offset":[66],"timing":[68],"skew":[69],"mismatches.":[70],"To":[71],"demonstrate":[72],"techniques,":[75],"design":[77],"ADC":[81,109],"fabricated":[83],"55-nm":[85],"CMOS":[86],"technology,":[87],"consuming":[88],"45":[89],"mW":[90],"from":[91],"V":[93],"supply":[95],"with":[96,125],"SNDR":[98],"50":[100],"dB":[101],"SFDR":[103],"60":[105],"dB.":[106],"The":[107],"core":[110],"occupies":[111],"an":[112],"active":[113],"area":[114],"0.84":[116],"mm2,":[117],"corresponding":[120],"FoM":[121],"145":[123],"fJ/conversion-step":[124],"Nyquist":[126],"rate.":[127]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":3}],"updated_date":"2026-08-04T08:18:43.703281","created_date":"2025-10-10T00:00:00"}