{"id":"https://openalex.org/W2683428535","doi":"https://doi.org/10.1587/elex.14.20170502","title":"A novel test data compression approach based on bit reversion","display_name":"A novel test data compression approach based on bit reversion","publication_year":2017,"publication_date":"2017-01-01","ids":{"openalex":"https://openalex.org/W2683428535","doi":"https://doi.org/10.1587/elex.14.20170502","mag":"2683428535"},"language":"en","primary_location":{"id":"doi:10.1587/elex.14.20170502","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.14.20170502","pdf_url":"https://www.jstage.jst.go.jp/article/elex/14/13/14_14.20170502/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/14/13/14_14.20170502/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037772300","display_name":"Shuo Cai","orcid":"https://orcid.org/0000-0003-4375-3187"},"institutions":[{"id":"https://openalex.org/I56934997","display_name":"Changsha University of Science and Technology","ror":"https://ror.org/03yph8055","country_code":"CN","type":"education","lineage":["https://openalex.org/I56934997"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuo Cai","raw_affiliation_strings":["Hunan Provincial Key Laboratory of Intelligent Processing of Big Data on Transportation & College of Computer and Communication Engineering, Changsha University of Science and Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hunan Provincial Key Laboratory of Intelligent Processing of Big Data on Transportation & College of Computer and Communication Engineering, Changsha University of Science and Technology","institution_ids":["https://openalex.org/I56934997"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064681608","display_name":"Yinbo Zhou","orcid":null},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yinbo Zhou","raw_affiliation_strings":["College of Information Science & Engineering, Hunan University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Information Science & Engineering, Hunan University","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047351206","display_name":"Peng Liu","orcid":"https://orcid.org/0000-0001-9107-6673"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peng Liu","raw_affiliation_strings":["College of Information Science & Engineering, Hunan University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Information Science & Engineering, Hunan University","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003996424","display_name":"Fei Yu","orcid":"https://orcid.org/0000-0002-3091-7640"},"institutions":[{"id":"https://openalex.org/I56934997","display_name":"Changsha University of Science and Technology","ror":"https://ror.org/03yph8055","country_code":"CN","type":"education","lineage":["https://openalex.org/I56934997"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fei Yu","raw_affiliation_strings":["Hunan Provincial Key Laboratory of Intelligent Processing of Big Data on Transportation & College of Computer and Communication Engineering, Changsha University of Science and Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hunan Provincial Key Laboratory of Intelligent Processing of Big Data on Transportation & College of Computer and Communication Engineering, Changsha University of Science and Technology","institution_ids":["https://openalex.org/I56934997"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100776068","display_name":"Wei Wang","orcid":"https://orcid.org/0000-0002-2298-3429"},"institutions":[{"id":"https://openalex.org/I56934997","display_name":"Changsha University of Science and Technology","ror":"https://ror.org/03yph8055","country_code":"CN","type":"education","lineage":["https://openalex.org/I56934997"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Wang","raw_affiliation_strings":["Hunan Provincial Key Laboratory of Intelligent Processing of Big Data on Transportation & College of Computer and Communication Engineering, Changsha University of Science and Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hunan Provincial Key Laboratory of Intelligent Processing of Big Data on Transportation & College of Computer and Communication Engineering, Changsha University of Science and Technology","institution_ids":["https://openalex.org/I56934997"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4624,"has_fulltext":true,"cited_by_count":4,"citation_normalized_percentile":{"value":0.6123906,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"14","issue":"13","first_page":"20170502","last_page":"20170502"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9824000000953674,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7224225997924805},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.6273714900016785},{"id":"https://openalex.org/keywords/data-compression","display_name":"Data compression","score":0.581458568572998},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.5760512948036194},{"id":"https://openalex.org/keywords/compression","display_name":"Compression (physics)","score":0.5617722272872925},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.5355026721954346},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5206698179244995},{"id":"https://openalex.org/keywords/compression-ratio","display_name":"Compression ratio","score":0.5190578103065491},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5166438221931458},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5095770359039307},{"id":"https://openalex.org/keywords/volume","display_name":"Volume (thermodynamics)","score":0.48174548149108887},{"id":"https://openalex.org/keywords/code","display_name":"Code (set theory)","score":0.45988285541534424},{"id":"https://openalex.org/keywords/data-set","display_name":"Data set","score":0.4289212226867676},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.42088502645492554},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1185058057308197},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10796469449996948},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.0722309947013855},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.06429153680801392}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7224225997924805},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.6273714900016785},{"id":"https://openalex.org/C78548338","wikidata":"https://www.wikidata.org/wiki/Q2493","display_name":"Data compression","level":2,"score":0.581458568572998},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.5760512948036194},{"id":"https://openalex.org/C180016635","wikidata":"https://www.wikidata.org/wiki/Q2712821","display_name":"Compression (physics)","level":2,"score":0.5617722272872925},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.5355026721954346},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5206698179244995},{"id":"https://openalex.org/C25797200","wikidata":"https://www.wikidata.org/wiki/Q828137","display_name":"Compression ratio","level":3,"score":0.5190578103065491},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5166438221931458},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5095770359039307},{"id":"https://openalex.org/C20556612","wikidata":"https://www.wikidata.org/wiki/Q4469374","display_name":"Volume (thermodynamics)","level":2,"score":0.48174548149108887},{"id":"https://openalex.org/C2776760102","wikidata":"https://www.wikidata.org/wiki/Q5139990","display_name":"Code (set theory)","level":3,"score":0.45988285541534424},{"id":"https://openalex.org/C58489278","wikidata":"https://www.wikidata.org/wiki/Q1172284","display_name":"Data set","level":2,"score":0.4289212226867676},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.42088502645492554},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1185058057308197},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10796469449996948},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0722309947013855},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.06429153680801392},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C511840579","wikidata":"https://www.wikidata.org/wiki/Q12757","display_name":"Internal combustion engine","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.14.20170502","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.14.20170502","pdf_url":"https://www.jstage.jst.go.jp/article/elex/14/13/14_14.20170502/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.14.20170502","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.14.20170502","pdf_url":"https://www.jstage.jst.go.jp/article/elex/14/13/14_14.20170502/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.4300000071525574,"id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G7993185223","display_name":null,"funder_award_id":"61504013","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2683428535.pdf","grobid_xml":"https://content.openalex.org/works/W2683428535.grobid-xml"},"referenced_works_count":18,"referenced_works":["https://openalex.org/W1971286545","https://openalex.org/W1974318184","https://openalex.org/W1999039453","https://openalex.org/W2080179726","https://openalex.org/W2105028194","https://openalex.org/W2118968259","https://openalex.org/W2122955150","https://openalex.org/W2131803874","https://openalex.org/W2134411380","https://openalex.org/W2134702967","https://openalex.org/W2135547345","https://openalex.org/W2143404021","https://openalex.org/W2146594632","https://openalex.org/W2148218783","https://openalex.org/W2157198810","https://openalex.org/W2160621850","https://openalex.org/W4243061192","https://openalex.org/W4254102020"],"related_works":["https://openalex.org/W2466438608","https://openalex.org/W1991935474","https://openalex.org/W2091533492","https://openalex.org/W2408214455","https://openalex.org/W152642345","https://openalex.org/W2028462208","https://openalex.org/W2982831492","https://openalex.org/W4313175581","https://openalex.org/W1953724919","https://openalex.org/W2187963660"],"abstract_inverted_index":{"Test":[0],"data":[1,10,21,30,37],"compression":[2,22,93],"is":[3],"an":[4],"effective":[5],"methodology":[6],"for":[7],"reducing":[8],"test":[9,20,36,52,74],"volume":[11],"and":[12],"testing":[13],"time.":[14],"This":[15],"paper":[16],"presents":[17],"a":[18,68],"new":[19],"approach":[23],"based":[24],"on":[25],"bit":[26],"reversion,":[27],"which":[28],"compresses":[29],"more":[31],"easier":[32],"by":[33,98],"reversing":[34],"some":[35,47],"bits":[38,50,71],"without":[39,79],"changing":[40],"the":[41,73,81,88],"fault":[42,82],"coverage.":[43,83],"As":[44],"there":[45],"are":[46,56],"don\u2019t":[48],"care":[49],"in":[51,72],"set,":[53],"when":[54],"they":[55],"filled,":[57],"many":[58],"faults":[59],"will":[60],"be":[61,77],"repeatedly":[62],"detected":[63],"with":[64],"multiple":[65],"vectors.":[66],"Correspondingly,":[67],"lot":[69],"of":[70,95],"set":[75],"can":[76,91],"modified":[78],"affecting":[80],"Experimental":[84],"results":[85],"show":[86],"that":[87],"proposed":[89],"method":[90],"increase":[92],"ratio":[94],"code-based":[96],"schemes":[97],"around":[99],"10%.":[100]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}