{"id":"https://openalex.org/W2560138660","doi":"https://doi.org/10.1587/elex.13.20161116","title":"Built-in jitter measurement circuit for PLL based on variable vernier delay line","display_name":"Built-in jitter measurement circuit for PLL based on variable vernier delay line","publication_year":2016,"publication_date":"2016-12-07","ids":{"openalex":"https://openalex.org/W2560138660","doi":"https://doi.org/10.1587/elex.13.20161116","mag":"2560138660"},"language":"en","primary_location":{"id":"doi:10.1587/elex.13.20161116","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.13.20161116","pdf_url":"https://www.jstage.jst.go.jp/article/elex/14/3/14_13.20161116/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/14/3/14_13.20161116/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062180403","display_name":"Zhikuang Cai","orcid":"https://orcid.org/0000-0002-0264-3849"},"institutions":[{"id":"https://openalex.org/I4210090971","display_name":"Southeast University","ror":"https://ror.org/00cf0ab87","country_code":"BD","type":"education","lineage":["https://openalex.org/I4210090971"]},{"id":"https://openalex.org/I41198531","display_name":"Nanjing University of Posts and Telecommunications","ror":"https://ror.org/043bpky34","country_code":"CN","type":"education","lineage":["https://openalex.org/I41198531"]}],"countries":["BD","CN"],"is_corresponding":true,"raw_author_name":"Zhikuang Cai","raw_affiliation_strings":["College of Electronic Science and Engineering, Nanjing University of Posts and Telecommunications","National ASIC System Engineering Research Center, Southeast University"],"affiliations":[{"raw_affiliation_string":"College of Electronic Science and Engineering, Nanjing University of Posts and Telecommunications","institution_ids":["https://openalex.org/I41198531"]},{"raw_affiliation_string":"National ASIC System Engineering Research Center, Southeast University","institution_ids":["https://openalex.org/I4210090971"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049597899","display_name":"Haobo Xu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210090971","display_name":"Southeast University","ror":"https://ror.org/00cf0ab87","country_code":"BD","type":"education","lineage":["https://openalex.org/I4210090971"]}],"countries":["BD"],"is_corresponding":false,"raw_author_name":"Haobo Xu","raw_affiliation_strings":["National ASIC System Engineering Research Center, Southeast University"],"affiliations":[{"raw_affiliation_string":"National ASIC System Engineering Research Center, Southeast University","institution_ids":["https://openalex.org/I4210090971"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033751695","display_name":"Shanwen Hu","orcid":"https://orcid.org/0000-0002-8774-1877"},"institutions":[{"id":"https://openalex.org/I41198531","display_name":"Nanjing University of Posts and Telecommunications","ror":"https://ror.org/043bpky34","country_code":"CN","type":"education","lineage":["https://openalex.org/I41198531"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shanwen Hu","raw_affiliation_strings":["College of Electronic Science and Engineering, Nanjing University of Posts and Telecommunications"],"affiliations":[{"raw_affiliation_string":"College of Electronic Science and Engineering, Nanjing University of Posts and Telecommunications","institution_ids":["https://openalex.org/I41198531"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030384645","display_name":"Jun Yang","orcid":"https://orcid.org/0000-0002-8379-0321"},"institutions":[{"id":"https://openalex.org/I4210090971","display_name":"Southeast University","ror":"https://ror.org/00cf0ab87","country_code":"BD","type":"education","lineage":["https://openalex.org/I4210090971"]}],"countries":["BD"],"is_corresponding":false,"raw_author_name":"Jun Yang","raw_affiliation_strings":["National ASIC System Engineering Research Center, Southeast University"],"affiliations":[{"raw_affiliation_string":"National ASIC System Engineering Research Center, Southeast University","institution_ids":["https://openalex.org/I4210090971"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5062180403"],"corresponding_institution_ids":["https://openalex.org/I41198531","https://openalex.org/I4210090971"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.13647942,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"14","issue":"3","first_page":"20161116","last_page":"20161116"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/vernier-scale","display_name":"Vernier scale","score":0.8667556047439575},{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.8361976146697998},{"id":"https://openalex.org/keywords/phase-locked-loop","display_name":"Phase-locked loop","score":0.7540857791900635},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5404490232467651},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5301070213317871},{"id":"https://openalex.org/keywords/pll-multibit","display_name":"PLL multibit","score":0.5154767632484436},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4884583055973053},{"id":"https://openalex.org/keywords/encoder","display_name":"Encoder","score":0.47626182436943054},{"id":"https://openalex.org/keywords/phase-detector","display_name":"Phase detector","score":0.4650128483772278},{"id":"https://openalex.org/keywords/delay-calculation","display_name":"Delay calculation","score":0.4222119450569153},{"id":"https://openalex.org/keywords/delay-locked-loop","display_name":"Delay-locked loop","score":0.4210861027240753},{"id":"https://openalex.org/keywords/propagation-delay","display_name":"Propagation delay","score":0.3273003101348877},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3028948903083801},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25185626745224},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.23360905051231384},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.17352330684661865},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.14183315634727478}],"concepts":[{"id":"https://openalex.org/C69710193","wikidata":"https://www.wikidata.org/wiki/Q14946576","display_name":"Vernier scale","level":2,"score":0.8667556047439575},{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.8361976146697998},{"id":"https://openalex.org/C12707504","wikidata":"https://www.wikidata.org/wiki/Q52637","display_name":"Phase-locked loop","level":3,"score":0.7540857791900635},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5404490232467651},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5301070213317871},{"id":"https://openalex.org/C77881186","wikidata":"https://www.wikidata.org/wiki/Q7119642","display_name":"PLL multibit","level":4,"score":0.5154767632484436},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4884583055973053},{"id":"https://openalex.org/C118505674","wikidata":"https://www.wikidata.org/wiki/Q42586063","display_name":"Encoder","level":2,"score":0.47626182436943054},{"id":"https://openalex.org/C110086884","wikidata":"https://www.wikidata.org/wiki/Q2085341","display_name":"Phase detector","level":3,"score":0.4650128483772278},{"id":"https://openalex.org/C174086752","wikidata":"https://www.wikidata.org/wiki/Q5253471","display_name":"Delay calculation","level":3,"score":0.4222119450569153},{"id":"https://openalex.org/C190462668","wikidata":"https://www.wikidata.org/wiki/Q492265","display_name":"Delay-locked loop","level":4,"score":0.4210861027240753},{"id":"https://openalex.org/C90806461","wikidata":"https://www.wikidata.org/wiki/Q1144416","display_name":"Propagation delay","level":2,"score":0.3273003101348877},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3028948903083801},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25185626745224},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.23360905051231384},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17352330684661865},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.14183315634727478},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.13.20161116","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.13.20161116","pdf_url":"https://www.jstage.jst.go.jp/article/elex/14/3/14_13.20161116/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.13.20161116","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.13.20161116","pdf_url":"https://www.jstage.jst.go.jp/article/elex/14/3/14_13.20161116/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.6700000166893005,"id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G1687241976","display_name":null,"funder_award_id":"201508","funder_id":"https://openalex.org/F4320321605","funder_display_name":"Government of Jiangsu Province"},{"id":"https://openalex.org/G2087396116","display_name":null,"funder_award_id":"China","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2271025714","display_name":null,"funder_award_id":"615012","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2530426327","display_name":null,"funder_award_id":"61504065","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3317480652","display_name":null,"funder_award_id":"Science","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3910829908","display_name":null,"funder_award_id":"China","funder_id":"https://openalex.org/F4320322769","funder_display_name":"Natural Science Foundation of Jiangsu Province"},{"id":"https://openalex.org/G391238517","display_name":null,"funder_award_id":", and","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5158534996","display_name":null,"funder_award_id":"BK20150848","funder_id":"https://openalex.org/F4320322769","funder_display_name":"Natural Science Foundation of Jiangsu Province"},{"id":"https://openalex.org/G5422065363","display_name":null,"funder_award_id":"BK2015084","funder_id":"https://openalex.org/F4320322769","funder_display_name":"Natural Science Foundation of Jiangsu Province"},{"id":"https://openalex.org/G5994120800","display_name":null,"funder_award_id":"Natural","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6058138561","display_name":null,"funder_award_id":", No.","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7169986808","display_name":null,"funder_award_id":"BK201508","funder_id":"https://openalex.org/F4320322769","funder_display_name":"Natural Science Foundation of Jiangsu Province"},{"id":"https://openalex.org/G8284863759","display_name":null,"funder_award_id":"61501261","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321605","display_name":"Government of Jiangsu Province","ror":"https://ror.org/004svx814"},{"id":"https://openalex.org/F4320322769","display_name":"Natural Science Foundation of Jiangsu Province","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320323268","display_name":"Nanjing University of Posts and Telecommunications","ror":"https://ror.org/043bpky34"},{"id":"https://openalex.org/F4320324852","display_name":"Nanjing University","ror":"https://ror.org/01rxvg760"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2560138660.pdf","grobid_xml":"https://content.openalex.org/works/W2560138660.grobid-xml"},"referenced_works_count":15,"referenced_works":["https://openalex.org/W1604115488","https://openalex.org/W1691451471","https://openalex.org/W1969331325","https://openalex.org/W1995272805","https://openalex.org/W2045718689","https://openalex.org/W2105513396","https://openalex.org/W2110852606","https://openalex.org/W2119823365","https://openalex.org/W2126936678","https://openalex.org/W2151260797","https://openalex.org/W2153419022","https://openalex.org/W2159003280","https://openalex.org/W2172165581","https://openalex.org/W2176875671","https://openalex.org/W2533816287"],"related_works":["https://openalex.org/W2170174172","https://openalex.org/W2995571213","https://openalex.org/W2401743820","https://openalex.org/W2354050524","https://openalex.org/W766471173","https://openalex.org/W3005757405","https://openalex.org/W3047127208","https://openalex.org/W1990401855","https://openalex.org/W4385624389","https://openalex.org/W2124954209"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"a":[3,16,107],"novel":[4],"built-in":[5],"jitter":[6],"measurement":[7,140],"circuit":[8,79,105],"(BIJM)":[9],"for":[10],"Phase-Locked":[11],"Loops":[12],"(PLL)":[13],"based":[14],"on":[15],"variable":[17],"vernier":[18],"delay":[19,47,56],"line":[20],"(VVDL)":[21],"is":[22,75,101,115,142],"proposed.":[23],"Resolutions":[24],"of":[25,61,111,130,136],"the":[26,39,54,68,91,104,121],"two-level":[27],"VDLs":[28],"can":[29],"be":[30],"designed":[31,82],"flexibly":[32],"and":[33,88,103,133,139],"their":[34],"lengths":[35],"optimally":[36],"according":[37],"to":[38,120],"signal":[40],"under":[41],"test":[42],"(SUT).":[43],"A":[44],"digitally":[45],"controlled":[46],"element":[48,57],"(DCDE)":[49],"using":[50,83],"varactors":[51],"acts":[52],"as":[53],"basic":[55],"in":[58,67],"VVDL.":[59],"Instead":[60],"counters,":[62],"thermometer-to-binary":[63],"encoders":[64],"are":[65],"adopted":[66],"design.":[69],"An":[70],"improved":[71],"phase":[72],"detector":[73],"(PD)":[74],"also":[76],"introduced.":[77],"The":[78],"has":[80],"been":[81],"an":[84],"all-digital":[85],"design":[86],"methodology":[87],"verified":[89],"with":[90],"TSMC":[92],"130":[93],"nm":[94],"CMOS":[95],"process.":[96],"800":[97],"MHz":[98],"clock":[99],"frequency":[100],"chosen,":[102],"occupies":[106],"total":[108],"silicon":[109],"area":[110],"0.043":[112],"mm2,":[113],"which":[114],"reduced":[116],"by":[117],"60%":[118],"compared":[119],"traditional":[122],"VDL.":[123],"Simulation":[124],"results":[125],"indicate":[126],"coarse":[127],"timing":[128],"resolution":[129,135],"15.4":[131],"ps":[132],"fine":[134],"2.1":[137],"ps,":[138],"error":[141],"within":[143],"2.11%.":[144]},"counts_by_year":[],"updated_date":"2026-03-18T14:38:29.013473","created_date":"2025-10-10T00:00:00"}