{"id":"https://openalex.org/W2344109838","doi":"https://doi.org/10.1587/elex.13.20160314","title":"Time-multiplexed test access architecture for stacked integrated circuits","display_name":"Time-multiplexed test access architecture for stacked integrated circuits","publication_year":2016,"publication_date":"2016-01-01","ids":{"openalex":"https://openalex.org/W2344109838","doi":"https://doi.org/10.1587/elex.13.20160314","mag":"2344109838"},"language":"en","primary_location":{"id":"doi:10.1587/elex.13.20160314","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.13.20160314","pdf_url":"https://www.jstage.jst.go.jp/article/elex/13/14/13_13.20160314/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/13/14/13_13.20160314/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040056049","display_name":"Muhammad Adil Ansari","orcid":"https://orcid.org/0000-0002-4675-5535"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Muhammad Adil Ansari","raw_affiliation_strings":["Department of Computer Science & Engineering, Hanyang University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science & Engineering, Hanyang University","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101816256","display_name":"Jihun Jung","orcid":"https://orcid.org/0000-0003-1667-9305"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jihun Jung","raw_affiliation_strings":["Department of Computer Science & Engineering, Hanyang University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science & Engineering, Hanyang University","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101502454","display_name":"Dooyoung Kim","orcid":"https://orcid.org/0000-0002-5746-8486"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dooyoung Kim","raw_affiliation_strings":["Department of Computer Science & Engineering, Hanyang University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science & Engineering, Hanyang University","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5000375941","display_name":"Sungju Park","orcid":"https://orcid.org/0000-0003-2322-232X"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sungju Park","raw_affiliation_strings":["Department of Computer Science & Engineering, Hanyang University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science & Engineering, Hanyang University","institution_ids":["https://openalex.org/I4575257"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4575257"],"apc_list":null,"apc_paid":null,"fwci":0.8637,"has_fulltext":true,"cited_by_count":4,"citation_normalized_percentile":{"value":0.76901654,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":"13","issue":"14","first_page":"20160314","last_page":"20160314"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.719473123550415},{"id":"https://openalex.org/keywords/multiplexing","display_name":"Multiplexing","score":0.5842811465263367},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.518626868724823},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.5034777522087097},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.47027498483657837},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.46491438150405884},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45772773027420044},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.4298918843269348},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.41576218605041504},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.4149111211299896},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4071241617202759},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3409980535507202},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.32059672474861145},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2182897925376892},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.14910966157913208},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.14670681953430176}],"concepts":[{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.719473123550415},{"id":"https://openalex.org/C19275194","wikidata":"https://www.wikidata.org/wiki/Q222903","display_name":"Multiplexing","level":2,"score":0.5842811465263367},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.518626868724823},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.5034777522087097},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.47027498483657837},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.46491438150405884},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45772773027420044},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.4298918843269348},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.41576218605041504},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.4149111211299896},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4071241617202759},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3409980535507202},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.32059672474861145},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2182897925376892},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.14910966157913208},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.14670681953430176},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.13.20160314","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.13.20160314","pdf_url":"https://www.jstage.jst.go.jp/article/elex/13/14/13_13.20160314/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.13.20160314","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.13.20160314","pdf_url":"https://www.jstage.jst.go.jp/article/elex/13/14/13_13.20160314/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.6800000071525574}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321681","display_name":"Ministry of Trade, Industry and Energy","ror":"https://ror.org/008nkqk13"},{"id":"https://openalex.org/F4320330746","display_name":"Korea Semiconductor Research Consortium","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2344109838.pdf","grobid_xml":"https://content.openalex.org/works/W2344109838.grobid-xml"},"referenced_works_count":10,"referenced_works":["https://openalex.org/W1980347306","https://openalex.org/W2003272148","https://openalex.org/W2017255835","https://openalex.org/W2118898957","https://openalex.org/W2125982897","https://openalex.org/W2151243068","https://openalex.org/W2158277795","https://openalex.org/W2161277442","https://openalex.org/W3139679949","https://openalex.org/W4230995773"],"related_works":["https://openalex.org/W2890791469","https://openalex.org/W4251457771","https://openalex.org/W2078091825","https://openalex.org/W3008427980","https://openalex.org/W3023382193","https://openalex.org/W3215142653","https://openalex.org/W1487051936","https://openalex.org/W194748710","https://openalex.org/W4389045579","https://openalex.org/W2946024207"],"abstract_inverted_index":{"Due":[0],"to":[1],"ever-increasing":[2],"gap":[3],"between":[4],"(1)":[5],"the":[6,13,19],"tester-channel":[7,20],"and":[8,11,15,41],"scan-shift":[9],"frequencies,":[10,18],"(2)":[12],"wafer-level":[14],"package-level":[16],"test":[17,32,45],"frequency":[21],"is":[22,49],"underutilized":[23],"for":[24,35],"stacked-ICs.":[25],"Thus,":[26],"we":[27],"present":[28],"a":[29,52],"novel":[30],"time-multiplexed":[31],"access":[33],"architecture":[34],"SICs":[36],"that":[37],"complies":[38],"with":[39],"P1838":[40],"it":[42],"significant":[43],"reduces":[44],"time,":[46],"which":[47],"reduction":[48],"observed":[50],"on":[51,56],"synthetic":[53],"SIC":[54],"based":[55],"ITC\u201902":[57],"benchmark":[58],"SoCs.":[59]},"counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2026-08-05T07:39:15.569665","created_date":"2025-10-10T00:00:00"}