{"id":"https://openalex.org/W2341586792","doi":"https://doi.org/10.1587/elex.13.20160238","title":"A novel SPICE circuit model of electrostatic discharge (ESD) generator","display_name":"A novel SPICE circuit model of electrostatic discharge (ESD) generator","publication_year":2016,"publication_date":"2016-01-01","ids":{"openalex":"https://openalex.org/W2341586792","doi":"https://doi.org/10.1587/elex.13.20160238","mag":"2341586792"},"language":"en","primary_location":{"id":"doi:10.1587/elex.13.20160238","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.13.20160238","pdf_url":null,"source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://doi.org/10.1587/elex.13.20160238","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100648777","display_name":"Jian Cao","orcid":"https://orcid.org/0000-0002-3508-1395"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jian Cao","raw_affiliation_strings":["Key Laboratory of Microelectronic Devices and Circuits (MoE), Institute of Microelectronics, Peking University"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Microelectronic Devices and Circuits (MoE), Institute of Microelectronics, Peking University","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101490329","display_name":"Yize Wang","orcid":"https://orcid.org/0000-0002-8176-3055"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yize Wang","raw_affiliation_strings":["Key Laboratory of Microelectronic Devices and Circuits (MoE), Institute of Microelectronics, Peking University"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Microelectronic Devices and Circuits (MoE), Institute of Microelectronics, Peking University","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002438548","display_name":"Yuan Wang","orcid":"https://orcid.org/0000-0002-4951-4286"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuan Wang","raw_affiliation_strings":["Key Laboratory of Microelectronic Devices and Circuits (MoE), Institute of Microelectronics, Peking University"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Microelectronic Devices and Circuits (MoE), Institute of Microelectronics, Peking University","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004853920","display_name":"Guangyi Lu","orcid":"https://orcid.org/0000-0003-1978-4485"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guangyi Lu","raw_affiliation_strings":["Key Laboratory of Microelectronic Devices and Circuits (MoE), Institute of Microelectronics, Peking University"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Microelectronic Devices and Circuits (MoE), Institute of Microelectronics, Peking University","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5116225786","display_name":"Xing Zhang","orcid":"https://orcid.org/0009-0001-7388-819X"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xing Zhang","raw_affiliation_strings":["Key Laboratory of Microelectronic Devices and Circuits (MoE), Institute of Microelectronics, Peking University"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Microelectronic Devices and Circuits (MoE), Institute of Microelectronics, Peking University","institution_ids":["https://openalex.org/I20231570"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100648777"],"corresponding_institution_ids":["https://openalex.org/I20231570"],"apc_list":null,"apc_paid":null,"fwci":0.5623,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.69801309,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"13","issue":"9","first_page":"20160238","last_page":"20160238"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.9156501293182373},{"id":"https://openalex.org/keywords/electrostatic-discharge","display_name":"Electrostatic discharge","score":0.8569175004959106},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.8421412110328674},{"id":"https://openalex.org/keywords/generator","display_name":"Generator (circuit theory)","score":0.5726109743118286},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5358273983001709},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5019237995147705},{"id":"https://openalex.org/keywords/electronic-circuit-simulation","display_name":"Electronic circuit simulation","score":0.4333256483078003},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.41637295484542847},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.397115021944046},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3627227246761322},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.31337934732437134},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29462409019470215},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.0894104540348053},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08547943830490112}],"concepts":[{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.9156501293182373},{"id":"https://openalex.org/C205483674","wikidata":"https://www.wikidata.org/wiki/Q3574961","display_name":"Electrostatic discharge","level":3,"score":0.8569175004959106},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.8421412110328674},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.5726109743118286},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5358273983001709},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5019237995147705},{"id":"https://openalex.org/C46205389","wikidata":"https://www.wikidata.org/wiki/Q1270401","display_name":"Electronic circuit simulation","level":3,"score":0.4333256483078003},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.41637295484542847},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.397115021944046},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3627227246761322},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.31337934732437134},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29462409019470215},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0894104540348053},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08547943830490112},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.13.20160238","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.13.20160238","pdf_url":null,"source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.13.20160238","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.13.20160238","pdf_url":null,"source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1576389808","https://openalex.org/W1954603000","https://openalex.org/W2022031979","https://openalex.org/W2154454406","https://openalex.org/W2159844142","https://openalex.org/W2488854639","https://openalex.org/W3113457107"],"related_works":["https://openalex.org/W2029074961","https://openalex.org/W2734507476","https://openalex.org/W2257740830","https://openalex.org/W2908026729","https://openalex.org/W1629312120","https://openalex.org/W2134827725","https://openalex.org/W2922342296","https://openalex.org/W2907493518","https://openalex.org/W2074497518","https://openalex.org/W2493943245"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3],"novel":[4],"circuit":[5,17,30,78],"model":[6,31,79],"of":[7,24,44,75],"electrostatic":[8],"discharge":[9],"(ESD)":[10],"generator":[11],"for":[12],"simulation":[13,58],"program":[14],"with":[15,41],"integrated":[16],"emphasis":[18],"(SPICE)":[19],"simulation.":[20],"Calculation":[21],"and":[22,48,60,88],"derivation":[23],"the":[25,29,42,45,55,76,82],"waveform":[26],"generated":[27,35,63],"by":[28,64],"are":[32,37],"demonstrated.":[33],"The":[34,73],"waveforms":[36,59,62],"fully":[38,86],"in":[39,70],"compliance":[40],"specifications":[43],"IEC":[46],"61000-4-2":[47],"Human":[49],"Metal":[50],"Model":[51],"(HMM)":[52],"standards.":[53],"Meanwhile,":[54],"comparison":[56],"between":[57],"real":[61],"an":[65],"ESD":[66],"gun":[67],"is":[68,85],"shown":[69],"this":[71],"work.":[72],"ability":[74],"proposed":[77],"to":[80],"predict":[81],"measured":[83],"data":[84],"explored":[87],"clearly":[89],"summarized.":[90]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}