{"id":"https://openalex.org/W2292675009","doi":"https://doi.org/10.1587/elex.12.20150991","title":"Noncoherency correction algorithm for removing spectral leakage in ADC spectral test","display_name":"Noncoherency correction algorithm for removing spectral leakage in ADC spectral test","publication_year":2015,"publication_date":"2015-12-24","ids":{"openalex":"https://openalex.org/W2292675009","doi":"https://doi.org/10.1587/elex.12.20150991","mag":"2292675009"},"language":"en","primary_location":{"id":"doi:10.1587/elex.12.20150991","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.12.20150991","pdf_url":"https://www.jstage.jst.go.jp/article/elex/13/2/13_12.20150991/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/13/2/13_12.20150991/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006276866","display_name":"Minshun Wu","orcid":"https://orcid.org/0000-0003-2918-5785"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Minshun Wu","raw_affiliation_strings":["Shool of Electronics and Information Engineering, Xi\u2019an Jiaotong University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shool of Electronics and Information Engineering, Xi\u2019an Jiaotong University","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101763778","display_name":"Zhiqiang Liu","orcid":"https://orcid.org/0000-0002-8189-0636"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zhiqiang Liu","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Iowa State University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University","institution_ids":["https://openalex.org/I173911158"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1607,"has_fulltext":true,"cited_by_count":3,"citation_normalized_percentile":{"value":0.61003842,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"13","issue":"2","first_page":"20150991","last_page":"20150991"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9934999942779541,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spectral-leakage","display_name":"Spectral leakage","score":0.8081015348434448},{"id":"https://openalex.org/keywords/fast-fourier-transform","display_name":"Fast Fourier transform","score":0.6974018812179565},{"id":"https://openalex.org/keywords/coherent-sampling","display_name":"Coherent sampling","score":0.6622433662414551},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6459857821464539},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.6305856108665466},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.5953163504600525},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5516930818557739},{"id":"https://openalex.org/keywords/spectral-density-estimation","display_name":"Spectral density estimation","score":0.41912081837654114},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.32818663120269775},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2923746705055237},{"id":"https://openalex.org/keywords/fourier-transform","display_name":"Fourier transform","score":0.15791812539100647},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11054277420043945},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08756142854690552},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.07507646083831787}],"concepts":[{"id":"https://openalex.org/C113407356","wikidata":"https://www.wikidata.org/wiki/Q1431214","display_name":"Spectral leakage","level":3,"score":0.8081015348434448},{"id":"https://openalex.org/C75172450","wikidata":"https://www.wikidata.org/wiki/Q623950","display_name":"Fast Fourier transform","level":2,"score":0.6974018812179565},{"id":"https://openalex.org/C31942786","wikidata":"https://www.wikidata.org/wiki/Q679800","display_name":"Coherent sampling","level":4,"score":0.6622433662414551},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6459857821464539},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.6305856108665466},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.5953163504600525},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5516930818557739},{"id":"https://openalex.org/C30049272","wikidata":"https://www.wikidata.org/wiki/Q6555326","display_name":"Spectral density estimation","level":3,"score":0.41912081837654114},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32818663120269775},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2923746705055237},{"id":"https://openalex.org/C102519508","wikidata":"https://www.wikidata.org/wiki/Q6520159","display_name":"Fourier transform","level":2,"score":0.15791812539100647},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11054277420043945},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08756142854690552},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.07507646083831787},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.12.20150991","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.12.20150991","pdf_url":"https://www.jstage.jst.go.jp/article/elex/13/2/13_12.20150991/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.12.20150991","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.12.20150991","pdf_url":"https://www.jstage.jst.go.jp/article/elex/13/2/13_12.20150991/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G7217965186","display_name":null,"funder_award_id":"61306048","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2292675009.pdf","grobid_xml":"https://content.openalex.org/works/W2292675009.grobid-xml"},"referenced_works_count":16,"referenced_works":["https://openalex.org/W1588457583","https://openalex.org/W1593073307","https://openalex.org/W1794977089","https://openalex.org/W1965392255","https://openalex.org/W2019457736","https://openalex.org/W2039080744","https://openalex.org/W2063141014","https://openalex.org/W2111460811","https://openalex.org/W2120958902","https://openalex.org/W2123572190","https://openalex.org/W2139957756","https://openalex.org/W2159450452","https://openalex.org/W2578010358","https://openalex.org/W2970906998","https://openalex.org/W4237464315","https://openalex.org/W4299830328"],"related_works":["https://openalex.org/W2348148757","https://openalex.org/W1974476917","https://openalex.org/W2243740808","https://openalex.org/W2351704810","https://openalex.org/W2134327484","https://openalex.org/W2382342197","https://openalex.org/W2182336527","https://openalex.org/W2765180763","https://openalex.org/W2126661367","https://openalex.org/W4388692558"],"abstract_inverted_index":{"A":[0],"noncoherency":[1],"correction":[2],"algorithm":[3],"is":[4,22],"proposed":[5,61],"to":[6,90],"remove":[7],"the":[8,25,53,60,81,86],"spectral":[9,17,42,66],"leakage":[10],"caused":[11],"by":[12,28,48],"noncoherent":[13],"sampling":[14,94],"in":[15],"ADC":[16],"test.":[18],"The":[19],"coherent":[20,93,99],"data":[21,27],"reconstructed":[23,54],"from":[24],"original":[26],"an":[29],"additional":[30],"FFT":[31,51],"and":[32,76],"only":[33],"a":[34],"few":[35],"simple":[36],"time":[37],"domain":[38],"operations.":[39],"Then":[40],"accurate":[41],"testing":[43,67],"results":[44,78],"can":[45,63,84],"be":[46],"obtained":[47],"performing":[49],"normal":[50],"on":[52],"data.":[55],"Compared":[56],"with":[57],"windowing":[58],"techniques,":[59],"method":[62,83,95],"acquire":[64],"better":[65],"accuracy":[68,88],"without":[69,97],"any":[70],"prior":[71],"knowledge.":[72],"Theoretical":[73],"analysis,":[74],"simulation":[75],"experimental":[77],"demonstrate":[79],"that":[80,91],"developed":[82],"achieve":[85],"estimation":[87],"comparable":[89],"of":[92],"but":[96],"requiring":[98],"sampling.":[100]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}