{"id":"https://openalex.org/W2292818474","doi":"https://doi.org/10.1587/elex.12.20150916","title":"A reliability improved synchronous boost converter with spike suppression circuit","display_name":"A reliability improved synchronous boost converter with spike suppression circuit","publication_year":2015,"publication_date":"2015-01-01","ids":{"openalex":"https://openalex.org/W2292818474","doi":"https://doi.org/10.1587/elex.12.20150916","mag":"2292818474"},"language":"en","primary_location":{"id":"doi:10.1587/elex.12.20150916","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.12.20150916","pdf_url":"https://www.jstage.jst.go.jp/article/elex/12/24/12_12.20150916/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/12/24/12_12.20150916/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100914975","display_name":"He Jiangping","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiangping He","raw_affiliation_strings":["State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China","institution_ids":["https://openalex.org/I150229711","https://openalex.org/I4210124847"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100320398","display_name":"Bo Zhang","orcid":"https://orcid.org/0000-0003-1288-1549"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bo Zhang","raw_affiliation_strings":["State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China","institution_ids":["https://openalex.org/I150229711","https://openalex.org/I4210124847"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019243593","display_name":"Xi Qu","orcid":"https://orcid.org/0000-0001-9213-0248"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qu Xi","raw_affiliation_strings":["State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China","institution_ids":["https://openalex.org/I150229711","https://openalex.org/I4210124847"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045219211","display_name":"Shuyan Jiang","orcid":"https://orcid.org/0000-0001-8049-1951"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuyan Jiang","raw_affiliation_strings":["State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China","institution_ids":["https://openalex.org/I150229711","https://openalex.org/I4210124847"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104669310","display_name":"Qing Hua","orcid":"https://orcid.org/0009-0000-0175-5059"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qing Hua","raw_affiliation_strings":["State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China","institution_ids":["https://openalex.org/I150229711","https://openalex.org/I4210124847"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109450364","display_name":"Gao Pan","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Gao Pan","raw_affiliation_strings":["State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China","institution_ids":["https://openalex.org/I150229711","https://openalex.org/I4210124847"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.10066862,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"12","issue":"24","first_page":"20150916","last_page":"20150916"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spike","display_name":"Spike (software development)","score":0.7369422912597656},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.6701794266700745},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.611583411693573},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5307809114456177},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.5222074389457703},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5080609321594238},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.5076552629470825},{"id":"https://openalex.org/keywords/boost-converter","display_name":"Boost converter","score":0.49787282943725586},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.47285130620002747},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4421165883541107},{"id":"https://openalex.org/keywords/short-circuit","display_name":"Short circuit","score":0.4231998324394226},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2847529351711273},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27950185537338257},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09422948956489563}],"concepts":[{"id":"https://openalex.org/C2781390188","wikidata":"https://www.wikidata.org/wiki/Q25203449","display_name":"Spike (software development)","level":2,"score":0.7369422912597656},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.6701794266700745},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.611583411693573},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5307809114456177},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.5222074389457703},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5080609321594238},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.5076552629470825},{"id":"https://openalex.org/C78336795","wikidata":"https://www.wikidata.org/wiki/Q760134","display_name":"Boost converter","level":3,"score":0.49787282943725586},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.47285130620002747},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4421165883541107},{"id":"https://openalex.org/C68583231","wikidata":"https://www.wikidata.org/wiki/Q206907","display_name":"Short circuit","level":3,"score":0.4231998324394226},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2847529351711273},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27950185537338257},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09422948956489563},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.12.20150916","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.12.20150916","pdf_url":"https://www.jstage.jst.go.jp/article/elex/12/24/12_12.20150916/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.12.20150916","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.12.20150916","pdf_url":"https://www.jstage.jst.go.jp/article/elex/12/24/12_12.20150916/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.9100000262260437,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G8904480518","display_name":"\u57fa\u4e8e\u6545\u969c\u68c0\u6d4b\u4e0e\u6d41\u91cf\u5206\u6790\u7684\u4f4e\u529f\u8017\u7247\u4e0a\u7f51\u7edc\u53ef\u9760\u6027\u6700\u4f18\u8def\u5f84\u5bb9\u9519\u8def\u7531\u7b97\u6cd5\u7814\u7a76","funder_award_id":"61471407","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2292818474.pdf","grobid_xml":"https://content.openalex.org/works/W2292818474.grobid-xml"},"referenced_works_count":12,"referenced_works":["https://openalex.org/W1589194756","https://openalex.org/W1838584213","https://openalex.org/W1855854842","https://openalex.org/W2016742793","https://openalex.org/W2063255195","https://openalex.org/W2080990343","https://openalex.org/W2081436083","https://openalex.org/W2088460533","https://openalex.org/W2148781209","https://openalex.org/W2151169570","https://openalex.org/W2168180974","https://openalex.org/W4229976411"],"related_works":["https://openalex.org/W631083485","https://openalex.org/W4313452936","https://openalex.org/W2097026685","https://openalex.org/W2174331923","https://openalex.org/W2480068220","https://openalex.org/W2050175337","https://openalex.org/W2102542442","https://openalex.org/W1986220761","https://openalex.org/W2070883797","https://openalex.org/W2042495646"],"abstract_inverted_index":{"A":[0],"reliability":[1,61],"improved":[2,109],"synchronous":[3],"boost":[4,19],"converter":[5],"with":[6,16],"spike":[7,31,70,91],"suppression":[8,71],"circuit":[9,24,72],"is":[10,25,95,102,108],"proposed":[11],"in":[12,51,77],"this":[13],"paper.":[14],"Compared":[15],"the":[17,29,36,41,55,60,63,89,99,106],"traditional":[18],"converter,":[20],"a":[21,78],"novel":[22],"control":[23],"designed":[26,74],"to":[27,49],"suppress":[28],"voltage":[30,90],"at":[32,92,110],"node":[33,93],"SW":[34,94],"during":[35,54],"dead":[37],"time.":[38],"In":[39],"addition,":[40],"two":[42],"main":[43],"power":[44],"switches":[45],"could":[46],"be":[47],"avoided":[48],"operate":[50],"ON":[52],"state":[53],"transient":[56],"process.":[57],"Hence,":[58],"both":[59],"and":[62,75,105],"efficiency":[64,107],"are":[65,73],"improved.":[66],"The":[67,84],"converters":[68],"with/without":[69],"implemented":[76],"0.5":[79,103],"\u00b5m":[80],"standard":[81],"CMOS":[82],"processes.":[83],"experimental":[85],"results":[86],"show":[87],"that":[88],"reduced":[96],"43%":[97],"when":[98],"load":[100],"current":[101],"A,":[104],"light":[111],"load.":[112]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2026-08-08T01:25:22.217667","created_date":"2025-10-10T00:00:00"}