{"id":"https://openalex.org/W1846200865","doi":"https://doi.org/10.1587/elex.12.20150504","title":"A novel SEU tolerant SRAM data cell design","display_name":"A novel SEU tolerant SRAM data cell design","publication_year":2015,"publication_date":"2015-01-01","ids":{"openalex":"https://openalex.org/W1846200865","doi":"https://doi.org/10.1587/elex.12.20150504","mag":"1846200865"},"language":"pt","primary_location":{"id":"doi:10.1587/elex.12.20150504","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.12.20150504","pdf_url":"https://www.jstage.jst.go.jp/article/elex/12/17/12_12.20150504/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/12/17/12_12.20150504/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088739970","display_name":"Guohe Zhang","orcid":"https://orcid.org/0000-0001-8092-8009"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Guohe Zhang","raw_affiliation_strings":["School of Electronics & Information, Xi\u2019an Jiaotong University","School of Electronics & Information, Xi'an Jiaotong University"],"affiliations":[{"raw_affiliation_string":"School of Electronics & Information, Xi\u2019an Jiaotong University","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"School of Electronics & Information, Xi'an Jiaotong University","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064634684","display_name":"Yunlin Zeng","orcid":null},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yunlin Zeng","raw_affiliation_strings":["School of Electronics & Information, Xi\u2019an Jiaotong University","School of Electronics & Information, Xi'an Jiaotong University"],"affiliations":[{"raw_affiliation_string":"School of Electronics & Information, Xi\u2019an Jiaotong University","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"School of Electronics & Information, Xi'an Jiaotong University","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067631851","display_name":"Feng Liang","orcid":"https://orcid.org/0000-0002-9393-6224"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feng Liang","raw_affiliation_strings":["School of Electronics & Information, Xi\u2019an Jiaotong University","School of Electronics & Information, Xi'an Jiaotong University"],"affiliations":[{"raw_affiliation_string":"School of Electronics & Information, Xi\u2019an Jiaotong University","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"School of Electronics & Information, Xi'an Jiaotong University","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062837574","display_name":"Kebin Chen","orcid":"https://orcid.org/0000-0002-4058-5061"},"institutions":[{"id":"https://openalex.org/I4210130954","display_name":"China Institute Of Communications","ror":"https://ror.org/0395ve714","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210130954"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kebin Chen","raw_affiliation_strings":["Information Services Department, Xi\u2019an Communications Institute","Information Services Department, Xi'an Communications Institute"],"affiliations":[{"raw_affiliation_string":"Information Services Department, Xi\u2019an Communications Institute","institution_ids":["https://openalex.org/I4210130954"]},{"raw_affiliation_string":"Information Services Department, Xi'an Communications Institute","institution_ids":["https://openalex.org/I4210130954"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5088739970"],"corresponding_institution_ids":["https://openalex.org/I87445476"],"apc_list":null,"apc_paid":null,"fwci":0.2007,"has_fulltext":true,"cited_by_count":8,"citation_normalized_percentile":{"value":0.57647558,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"12","issue":"17","first_page":"20150504","last_page":"20150504"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.7505895495414734},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7400683164596558},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.5733926296234131},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5600616335868835},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5484892725944519},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5316054821014404},{"id":"https://openalex.org/keywords/resilience","display_name":"Resilience (materials science)","score":0.4905502200126648},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.46004819869995117},{"id":"https://openalex.org/keywords/circuit-design","display_name":"Circuit design","score":0.44642919301986694},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4434862732887268},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3797801733016968},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3608701825141907},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.274047315120697},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2142876386642456},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07954657077789307},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.07904419302940369}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.7505895495414734},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7400683164596558},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.5733926296234131},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5600616335868835},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5484892725944519},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5316054821014404},{"id":"https://openalex.org/C2779585090","wikidata":"https://www.wikidata.org/wiki/Q3457762","display_name":"Resilience (materials science)","level":2,"score":0.4905502200126648},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.46004819869995117},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.44642919301986694},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4434862732887268},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3797801733016968},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3608701825141907},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.274047315120697},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2142876386642456},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07954657077789307},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.07904419302940369},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.12.20150504","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.12.20150504","pdf_url":"https://www.jstage.jst.go.jp/article/elex/12/17/12_12.20150504/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.12.20150504","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.12.20150504","pdf_url":"https://www.jstage.jst.go.jp/article/elex/12/17/12_12.20150504/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G235389117","display_name":null,"funder_award_id":"No. 6147409","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4718477989","display_name":null,"funder_award_id":"No. 61474093","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5249178904","display_name":null,"funder_award_id":"Grant No. 6","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5312522017","display_name":null,"funder_award_id":"6147409","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8818689214","display_name":null,"funder_award_id":"61474093","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G936389535","display_name":null,"funder_award_id":"614740","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W1846200865.pdf","grobid_xml":"https://content.openalex.org/works/W1846200865.grobid-xml"},"referenced_works_count":9,"referenced_works":["https://openalex.org/W1976845274","https://openalex.org/W1985713288","https://openalex.org/W2019966534","https://openalex.org/W2050431855","https://openalex.org/W2099569658","https://openalex.org/W2136193292","https://openalex.org/W2153751624","https://openalex.org/W2160802886","https://openalex.org/W3149410719"],"related_works":["https://openalex.org/W2071118425","https://openalex.org/W2153096481","https://openalex.org/W2148616436","https://openalex.org/W2102525122","https://openalex.org/W4306316843","https://openalex.org/W2036953450","https://openalex.org/W2130594209","https://openalex.org/W4245282135","https://openalex.org/W2170004886","https://openalex.org/W4300955944"],"abstract_inverted_index":{"An":[0],"improved":[1],"SEU":[2,17,41],"tolerant":[3],"SRAM":[4],"data":[5,24],"cell":[6,12,55],"design":[7,36,68],"is":[8,69],"presented":[9],"here.":[10],"The":[11,30],"enhances":[13],"the":[14],"capability":[15],"of":[16,23,27],"tolerance":[18],"by":[19],"creating":[20],"spatial":[21],"redundancy":[22],"and":[25,42,61,77],"virtue":[26],"latch":[28],"design.":[29,79],"results":[31],"show":[32],"that":[33,66],"our":[34,67],"proposed":[35],"achieves":[37],"high":[38],"resilience":[39],"to":[40,52],"provides":[43],"a":[44],"300":[45],"times":[46],"increase":[47],"in":[48,59,74],"critical":[49],"charge":[50],"compared":[51],"standard":[53],"6T":[54],"without":[56],"much":[57],"degradation":[58],"speed":[60],"Power":[62],"dissipation.":[63],"It":[64],"shows":[65],"very":[70],"suitable":[71],"for":[72],"applying":[73],"high-reliability":[75],"circuit":[76],"system":[78]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2017,"cited_by_count":1}],"updated_date":"2026-04-21T08:09:41.155169","created_date":"2025-10-10T00:00:00"}