{"id":"https://openalex.org/W2023534041","doi":"https://doi.org/10.1587/elex.12.20150252","title":"Sudden-voltage-drop protection technique for enhancing the reliability of mobile devices under low battery conditions","display_name":"Sudden-voltage-drop protection technique for enhancing the reliability of mobile devices under low battery conditions","publication_year":2015,"publication_date":"2015-01-01","ids":{"openalex":"https://openalex.org/W2023534041","doi":"https://doi.org/10.1587/elex.12.20150252","mag":"2023534041"},"language":"en","primary_location":{"id":"doi:10.1587/elex.12.20150252","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.12.20150252","pdf_url":"https://www.jstage.jst.go.jp/article/elex/12/10/12_12.20150252/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/12/10/12_12.20150252/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082437898","display_name":"Kyoung Min Lee","orcid":"https://orcid.org/0000-0002-2372-7339"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]},{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyoung Min Lee","raw_affiliation_strings":["Department of Semiconductor Systems Engineering, Sungkyunkwan University","System LSI Division, Samsung Electronics Co"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Semiconductor Systems Engineering, Sungkyunkwan University","institution_ids":["https://openalex.org/I848706"]},{"raw_affiliation_string":"System LSI Division, Samsung Electronics Co","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027907831","display_name":"Myung Kyoon Yim","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]},{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Myung Kyoon Yim","raw_affiliation_strings":["Department of Semiconductor Systems Engineering, Sungkyunkwan University","System LSI Division, Samsung Electronics Co"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Semiconductor Systems Engineering, Sungkyunkwan University","institution_ids":["https://openalex.org/I848706"]},{"raw_affiliation_string":"System LSI Division, Samsung Electronics Co","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084741187","display_name":"Tae Hee Han","orcid":"https://orcid.org/0000-0001-8508-7536"},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Tae Hee Han","raw_affiliation_strings":["Department of Semiconductor Systems Engineering, Sungkyunkwan University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Semiconductor Systems Engineering, Sungkyunkwan University","institution_ids":["https://openalex.org/I848706"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.06125476,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"12","issue":"10","first_page":"20150252","last_page":"20150252"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12238","display_name":"Green IT and Sustainability","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12238","display_name":"Green IT and Sustainability","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage-drop","display_name":"Voltage drop","score":0.6455603837966919},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5602127313613892},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5296143293380737},{"id":"https://openalex.org/keywords/reset","display_name":"Reset (finance)","score":0.5208173990249634},{"id":"https://openalex.org/keywords/drop","display_name":"Drop (telecommunication)","score":0.5136663317680359},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49966883659362793},{"id":"https://openalex.org/keywords/low-voltage","display_name":"Low voltage","score":0.46542972326278687},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.46056845784187317},{"id":"https://openalex.org/keywords/battery","display_name":"Battery (electricity)","score":0.454962819814682},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3646460771560669},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.35749414563179016},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3341791331768036},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27189576625823975}],"concepts":[{"id":"https://openalex.org/C82178898","wikidata":"https://www.wikidata.org/wiki/Q166839","display_name":"Voltage drop","level":3,"score":0.6455603837966919},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5602127313613892},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5296143293380737},{"id":"https://openalex.org/C2779795794","wikidata":"https://www.wikidata.org/wiki/Q7315343","display_name":"Reset (finance)","level":2,"score":0.5208173990249634},{"id":"https://openalex.org/C2781345722","wikidata":"https://www.wikidata.org/wiki/Q5308388","display_name":"Drop (telecommunication)","level":2,"score":0.5136663317680359},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49966883659362793},{"id":"https://openalex.org/C128624480","wikidata":"https://www.wikidata.org/wiki/Q1504817","display_name":"Low voltage","level":3,"score":0.46542972326278687},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.46056845784187317},{"id":"https://openalex.org/C555008776","wikidata":"https://www.wikidata.org/wiki/Q267298","display_name":"Battery (electricity)","level":3,"score":0.454962819814682},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3646460771560669},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.35749414563179016},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3341791331768036},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27189576625823975},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C106159729","wikidata":"https://www.wikidata.org/wiki/Q2294553","display_name":"Financial economics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.12.20150252","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.12.20150252","pdf_url":"https://www.jstage.jst.go.jp/article/elex/12/10/12_12.20150252/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.12.20150252","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.12.20150252","pdf_url":"https://www.jstage.jst.go.jp/article/elex/12/10/12_12.20150252/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8500000238418579,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G5631373561","display_name":null,"funder_award_id":"NIPA-2014-H0301-14-1018","funder_id":"https://openalex.org/F4320322065","funder_display_name":"National IT Industry Promotion Agency"}],"funders":[{"id":"https://openalex.org/F4320322030","display_name":"Ministry of Science, ICT and Future Planning","ror":"https://ror.org/032e49973"},{"id":"https://openalex.org/F4320322065","display_name":"National IT Industry Promotion Agency","ror":"https://ror.org/026v53e29"},{"id":"https://openalex.org/F4320324891","display_name":"Iran Telecommunication Research Center","ror":"https://ror.org/01a3g2z22"}],"has_content":{"grobid_xml":false,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2023534041.pdf"},"referenced_works_count":1,"referenced_works":["https://openalex.org/W2122170512"],"related_works":["https://openalex.org/W2363818268","https://openalex.org/W4255681223","https://openalex.org/W2541000087","https://openalex.org/W2018764485","https://openalex.org/W2103327909","https://openalex.org/W2742658476","https://openalex.org/W2011705252","https://openalex.org/W2319035808","https://openalex.org/W2122768076","https://openalex.org/W2940673307"],"abstract_inverted_index":{"When":[0],"there":[1],"is":[2,98],"an":[3],"impending":[4],"heavy":[5],"workload":[6],"under":[7,39,127],"low":[8,40,128],"battery":[9,41,129],"conditions,":[10],"mobile":[11],"device":[12],"such":[13],"as":[14],"smartphones":[15],"can":[16],"autonomously":[17],"reset":[18],"or":[19],"even":[20],"shut":[21],"down":[22],"to":[23,71,90,123],"prevent":[24],"damage":[25],"caused":[26],"by":[27],"sudden":[28,36,83,124],"voltage":[29,37,84,125],"drops.":[30],"Recently,":[31],"the":[32,46,56,114,119],"occurrence":[33],"probability":[34],"of":[35,48],"drop":[38,85],"conditions":[42],"has":[43],"increased":[44],"with":[45],"use":[47],"high-performance":[49],"64-bit":[50],"CPU":[51],"cores,":[52],"which":[53],"adversely":[54],"affects":[55],"user":[57],"experiences.":[58],"To":[59],"overcome":[60],"this":[61],"problem,":[62],"we":[63],"propose":[64],"a":[65],"cost-effective":[66],"sudden-voltage-drop":[67],"protection":[68],"(SVDP)":[69],"technique":[70,116],"minimize":[72],"unstable":[73],"states,":[74],"thus":[75],"enhancing":[76],"customer":[77],"satisfaction.":[78],"Programmable":[79],"low-battery-state-aware":[80],"logic":[81],"for":[82],"detection":[86],"and":[87,106],"performance":[88],"tuning":[89],"maintain":[91],"system":[92],"stability":[93],"via":[94],"clock":[95],"frequency":[96],"control":[97],"incorporated":[99],"in":[100],"power":[101],"management":[102],"integrated":[103],"circuit":[104],"(PMIC)":[105],"application":[107],"processor":[108],"(AP).":[109],"Experimental":[110],"results":[111],"show":[112],"that":[113],"proposed":[115],"significantly":[117],"reduces":[118],"failure":[120],"rate":[121],"due":[122],"drops":[126],"conditions.":[130]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}