{"id":"https://openalex.org/W2016714897","doi":"https://doi.org/10.1587/elex.11.20140710","title":"Mitigating the SERs of large combinational circuits by using half guard band technique in CMOS bulk technology","display_name":"Mitigating the SERs of large combinational circuits by using half guard band technique in CMOS bulk technology","publication_year":2014,"publication_date":"2014-01-01","ids":{"openalex":"https://openalex.org/W2016714897","doi":"https://doi.org/10.1587/elex.11.20140710","mag":"2016714897"},"language":"en","primary_location":{"id":"doi:10.1587/elex.11.20140710","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.11.20140710","pdf_url":"https://www.jstage.jst.go.jp/article/elex/11/19/11_11.20140710/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/11/19/11_11.20140710/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5032898373","display_name":"Bin Liang","orcid":"https://orcid.org/0000-0003-2655-9024"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]},{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Liang Bin","raw_affiliation_strings":["College of Computer, National University of Defense Technology, Hunan University"],"affiliations":[{"raw_affiliation_string":"College of Computer, National University of Defense Technology, Hunan University","institution_ids":["https://openalex.org/I170215575","https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100814507","display_name":"Yankang Du","orcid":null},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]},{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Du Yankang","raw_affiliation_strings":["College of Computer, National University of Defense Technology, Hunan University"],"affiliations":[{"raw_affiliation_string":"College of Computer, National University of Defense Technology, Hunan University","institution_ids":["https://openalex.org/I170215575","https://openalex.org/I16609230"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101725645","display_name":"Hui Xu","orcid":"https://orcid.org/0000-0003-3794-792X"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xu Hui","raw_affiliation_strings":["School of Physics and Electronics, Hunan University"],"affiliations":[{"raw_affiliation_string":"School of Physics and Electronics, Hunan University","institution_ids":["https://openalex.org/I16609230"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5032898373"],"corresponding_institution_ids":["https://openalex.org/I16609230","https://openalex.org/I170215575"],"apc_list":null,"apc_paid":null,"fwci":1.2771,"has_fulltext":true,"cited_by_count":6,"citation_normalized_percentile":{"value":0.82490616,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"11","issue":"19","first_page":"20140710","last_page":"20140710"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.7577223777770996},{"id":"https://openalex.org/keywords/guard","display_name":"Guard (computer science)","score":0.7383813858032227},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7185055017471313},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.5948123931884766},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5490076541900635},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5442973375320435},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5255200862884521},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3025985360145569},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.2910926342010498},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17269784212112427}],"concepts":[{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.7577223777770996},{"id":"https://openalex.org/C141141315","wikidata":"https://www.wikidata.org/wiki/Q2379942","display_name":"Guard (computer science)","level":2,"score":0.7383813858032227},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7185055017471313},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.5948123931884766},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5490076541900635},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5442973375320435},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5255200862884521},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3025985360145569},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.2910926342010498},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17269784212112427},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.11.20140710","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.11.20140710","pdf_url":"https://www.jstage.jst.go.jp/article/elex/11/19/11_11.20140710/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.11.20140710","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.11.20140710","pdf_url":"https://www.jstage.jst.go.jp/article/elex/11/19/11_11.20140710/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2087396116","display_name":null,"funder_award_id":"China","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3085993365","display_name":null,"funder_award_id":"(Grant No.","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3317480652","display_name":null,"funder_award_id":"Science","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5994120800","display_name":null,"funder_award_id":"Natural","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7726157001","display_name":null,"funder_award_id":"Grant No.","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7839473050","display_name":null,"funder_award_id":"61376109","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8737956882","display_name":null,"funder_award_id":"CX2012B028","funder_id":"https://openalex.org/F4320326217","funder_display_name":"Hunan Provincial Innovation Foundation for Postgraduate"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320326217","display_name":"Hunan Provincial Innovation Foundation for Postgraduate","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2016714897.pdf","grobid_xml":"https://content.openalex.org/works/W2016714897.grobid-xml"},"referenced_works_count":8,"referenced_works":["https://openalex.org/W1970839944","https://openalex.org/W1977649935","https://openalex.org/W1979452306","https://openalex.org/W1986706096","https://openalex.org/W2036412341","https://openalex.org/W2079492534","https://openalex.org/W2134157220","https://openalex.org/W2146917079"],"related_works":["https://openalex.org/W2531550288","https://openalex.org/W2149041233","https://openalex.org/W2171347834","https://openalex.org/W2066042903","https://openalex.org/W3040935927","https://openalex.org/W1993206924","https://openalex.org/W2036412341","https://openalex.org/W2154207847","https://openalex.org/W2389800961","https://openalex.org/W2168546702"],"abstract_inverted_index":{"A":[0],"novel":[1],"technique":[2],"is":[3],"proposed":[4],"to":[5,56],"mitigate":[6],"the":[7,14,19,24,31,58],"SERs":[8],"of":[9],"combinational":[10],"circuits":[11],"by":[12,22],"using":[13],"half":[15],"guard":[16,25],"band.":[17],"During":[18],"layout":[20],"placement,":[21],"sharing":[23],"band":[26],"between":[27],"physically":[28],"adjacent":[29],"cells,":[30],"soft":[32],"error":[33],"rates":[34],"(SERs)":[35],"can":[36],"be":[37],"effectively":[38],"reduced":[39],"with":[40],"less":[41],"performance":[42],"penalty.":[43],"Three-dimensional":[44],"technology":[45],"computer-aided":[46],"design":[47],"(TCAD)":[48],"numerical":[49],"simulation":[50,53],"and":[51],"circuit-level":[52],"are":[54],"adopted":[55],"demonstrate":[57],"hardening":[59],"performance.":[60]},"counts_by_year":[{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":4}],"updated_date":"2026-04-13T07:58:08.660418","created_date":"2025-10-10T00:00:00"}